Quantitative Electron Microprobe Analysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
1965
|
| Schlagworte: | |
| Online-Zugang: | BTU01 Volltext |
| Beschreibung: | 1 Online-Ressource (IV, 170 p. 11 illus) |
| ISBN: | 9783662251065 |
| DOI: | 10.1007/978-3-662-25106-5 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV045185535 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180912s1965 |||| o||u| ||||||eng d | ||
| 020 | |a 9783662251065 |9 978-3-662-25106-5 | ||
| 024 | 7 | |a 10.1007/978-3-662-25106-5 |2 doi | |
| 035 | |a (ZDB-2-ENG)978-3-662-25106-5 | ||
| 035 | |a (OCoLC)1184499845 | ||
| 035 | |a (DE-599)BVBBV045185535 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-634 | ||
| 082 | 0 | |a 621.381 |2 23 | |
| 100 | 1 | |a Theisen, Roger |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Quantitative Electron Microprobe Analysis |c by Roger Theisen |
| 264 | 1 | |a Berlin, Heidelberg |b Springer Berlin Heidelberg |c 1965 | |
| 300 | |a 1 Online-Ressource (IV, 170 p. 11 illus) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
| 650 | 4 | |a Analytical Chemistry | |
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Analytical chemistry | |
| 650 | 4 | |a Electronics | |
| 650 | 4 | |a Microelectronics | |
| 650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9783662231302 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-662-25106-5 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 940 | 1 | |q ZDB-2-ENG_Archiv | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030574713 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 966 | e | |u https://doi.org/10.1007/978-3-662-25106-5 |l BTU01 |p ZDB-2-ENG |q ZDB-2-ENG_Archiv |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804178875548172288 |
|---|---|
| any_adam_object | |
| author | Theisen, Roger |
| author_facet | Theisen, Roger |
| author_role | aut |
| author_sort | Theisen, Roger |
| author_variant | r t rt |
| building | Verbundindex |
| bvnumber | BV045185535 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)978-3-662-25106-5 (OCoLC)1184499845 (DE-599)BVBBV045185535 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-662-25106-5 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01750nmm a2200481zc 4500</leader><controlfield tag="001">BV045185535</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180912s1965 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783662251065</subfield><subfield code="9">978-3-662-25106-5</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-3-662-25106-5</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)978-3-662-25106-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1184499845</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045185535</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Theisen, Roger</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Quantitative Electron Microprobe Analysis</subfield><subfield code="c">by Roger Theisen</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin, Heidelberg</subfield><subfield code="b">Springer Berlin Heidelberg</subfield><subfield code="c">1965</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (IV, 170 p. 11 illus)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analytical Chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Analytical chemistry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9783662231302</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-3-662-25106-5</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_Archiv</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030574713</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-3-662-25106-5</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_Archiv</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV045185535 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:55Z |
| institution | BVB |
| isbn | 9783662251065 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030574713 |
| oclc_num | 1184499845 |
| open_access_boolean | |
| owner | DE-634 |
| owner_facet | DE-634 |
| physical | 1 Online-Ressource (IV, 170 p. 11 illus) |
| psigel | ZDB-2-ENG ZDB-2-ENG_Archiv ZDB-2-ENG ZDB-2-ENG_Archiv |
| publishDate | 1965 |
| publishDateSearch | 1965 |
| publishDateSort | 1965 |
| publisher | Springer Berlin Heidelberg |
| record_format | marc |
| spelling | Theisen, Roger Verfasser aut Quantitative Electron Microprobe Analysis by Roger Theisen Berlin, Heidelberg Springer Berlin Heidelberg 1965 1 Online-Ressource (IV, 170 p. 11 illus) txt rdacontent c rdamedia cr rdacarrier Engineering Electronics and Microelectronics, Instrumentation Analytical Chemistry Analytical chemistry Electronics Microelectronics Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 s 1\p DE-604 Erscheint auch als Druck-Ausgabe 9783662231302 https://doi.org/10.1007/978-3-662-25106-5 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Theisen, Roger Quantitative Electron Microprobe Analysis Engineering Electronics and Microelectronics, Instrumentation Analytical Chemistry Analytical chemistry Electronics Microelectronics Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| subject_GND | (DE-588)4151898-6 |
| title | Quantitative Electron Microprobe Analysis |
| title_auth | Quantitative Electron Microprobe Analysis |
| title_exact_search | Quantitative Electron Microprobe Analysis |
| title_full | Quantitative Electron Microprobe Analysis by Roger Theisen |
| title_fullStr | Quantitative Electron Microprobe Analysis by Roger Theisen |
| title_full_unstemmed | Quantitative Electron Microprobe Analysis by Roger Theisen |
| title_short | Quantitative Electron Microprobe Analysis |
| title_sort | quantitative electron microprobe analysis |
| topic | Engineering Electronics and Microelectronics, Instrumentation Analytical Chemistry Analytical chemistry Electronics Microelectronics Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
| topic_facet | Engineering Electronics and Microelectronics, Instrumentation Analytical Chemistry Analytical chemistry Electronics Microelectronics Elektronenstrahlmikroanalyse |
| url | https://doi.org/10.1007/978-3-662-25106-5 |
| work_keys_str_mv | AT theisenroger quantitativeelectronmicroprobeanalysis |