Verfügbarkeit: Microscopy of Materials

Microscopy of Materials: Modern Imaging Methods Using Electron, X-ray and Ion Beams

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Bibliographische Detailangaben
Hauptverfasser:	Bowen, D. K. (VerfasserIn), Hall, C. R. (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	London Macmillan Education UK 1975
Schlagworte:	Characterization and Evaluation of Materials Spectroscopy and Microscopy Surfaces (Physics) Elektronenmikroskopie Werkstoffprüfung Elektronenoptik Mikroskopie
Online-Zugang:	BTU01 Volltext
Beschreibung:	1 Online-Ressource (IX, 304 p)
ISBN:	9781349156016
DOI:	10.1007/978-1-349-15601-6

Internformat

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Datensatz im Suchindex

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author	Bowen, D. K. Hall, C. R.
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doi_str_mv	10.1007/978-1-349-15601-6
format	Electronic eBook
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indexdate	2024-07-10T08:10:55Z
institution	BVB
isbn	9781349156016
language	English
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spelling	Bowen, D. K. Verfasser aut Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams by D. K. Bowen, C. R. Hall London Macmillan Education UK 1975 1 Online-Ressource (IX, 304 p) txt rdacontent c rdamedia cr rdacarrier Characterization and Evaluation of Materials Spectroscopy and Microscopy Surfaces (Physics) Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Elektronenoptik (DE-588)4151879-2 gnd rswk-swf Mikroskopie (DE-588)4039238-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Werkstoffprüfung (DE-588)4037934-6 s 1\p DE-604 Mikroskopie (DE-588)4039238-7 s 2\p DE-604 Elektronenoptik (DE-588)4151879-2 s 3\p DE-604 Hall, C. R. aut Erscheint auch als Druck-Ausgabe 9780333154953 Erscheint auch als Druck-Ausgabe 9780333187036 Erscheint auch als Druck-Ausgabe 9781349156023 https://doi.org/10.1007/978-1-349-15601-6 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Bowen, D. K. Hall, C. R. Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams Characterization and Evaluation of Materials Spectroscopy and Microscopy Surfaces (Physics) Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Elektronenoptik (DE-588)4151879-2 gnd Mikroskopie (DE-588)4039238-7 gnd
subject_GND	(DE-588)4014327-2 (DE-588)4037934-6 (DE-588)4151879-2 (DE-588)4039238-7
title	Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams
title_auth	Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams
title_exact_search	Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams
title_full	Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams by D. K. Bowen, C. R. Hall
title_fullStr	Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams by D. K. Bowen, C. R. Hall
title_full_unstemmed	Microscopy of Materials Modern Imaging Methods Using Electron, X-ray and Ion Beams by D. K. Bowen, C. R. Hall
title_short	Microscopy of Materials
title_sort	microscopy of materials modern imaging methods using electron x ray and ion beams
title_sub	Modern Imaging Methods Using Electron, X-ray and Ion Beams
topic	Characterization and Evaluation of Materials Spectroscopy and Microscopy Surfaces (Physics) Elektronenmikroskopie (DE-588)4014327-2 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Elektronenoptik (DE-588)4151879-2 gnd Mikroskopie (DE-588)4039238-7 gnd
topic_facet	Characterization and Evaluation of Materials Spectroscopy and Microscopy Surfaces (Physics) Elektronenmikroskopie Werkstoffprüfung Elektronenoptik Mikroskopie
url	https://doi.org/10.1007/978-1-349-15601-6
work_keys_str_mv	AT bowendk microscopyofmaterialsmodernimagingmethodsusingelectronxrayandionbeams AT hallcr microscopyofmaterialsmodernimagingmethodsusingelectronxrayandionbeams

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