Simultaneous Switching Noise of CMOS Devices and Systems:
This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
1994
|
| Schriftenreihe: | The Springer International Series in Engineering and Computer Science, Electronic Packaging and Interconnects
249 |
| Schlagworte: | |
| Online-Zugang: | BTU01 Volltext |
| Zusammenfassung: | This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This present work covers in-depth analysis on estimating SSN and its impact for CMOS based devices and systems. At present semiconductor industries are moving towards scaled CMOS devices and reduced supply voltage. SSN together with coupled noise may limit the packing density, and thereby the frequency of operation of packaged systems. Our goal is to provide efficient and yet reliable methodologies and algorithms to estimate the overall noise containment in single chip and multi-chip package assemblies. We hope that the techniques and results described in this book will be useful as guides for design, package, and system engineers and academia working in this area. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Work reported in this monograph was partially supported by the grant from Semiconductor Research Corporation (SRC Contract No. 92-MP-086) |
| Beschreibung: | 1 Online-Ressource (XXI, 205 p) |
| ISBN: | 9781461532040 |
| DOI: | 10.1007/978-1-4615-3204-0 |
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| isbn | 9781461532040 |
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| spelling | Senthinathan, Ramesh Verfasser aut Simultaneous Switching Noise of CMOS Devices and Systems by Ramesh Senthinathan, John L. Prince Boston, MA Springer US 1994 1 Online-Ressource (XXI, 205 p) txt rdacontent c rdamedia cr rdacarrier The Springer International Series in Engineering and Computer Science, Electronic Packaging and Interconnects 249 This monograph presents our recent research on Simultaneous Switching Noise (SSN) and related issues for CMOS based systems. Although some SSN related work was previously reported in the literature, it were mainly for Emitter Coupled Logic (ECL) gates using Bipolar Junction Transistors (BJTs). This present work covers in-depth analysis on estimating SSN and its impact for CMOS based devices and systems. At present semiconductor industries are moving towards scaled CMOS devices and reduced supply voltage. SSN together with coupled noise may limit the packing density, and thereby the frequency of operation of packaged systems. Our goal is to provide efficient and yet reliable methodologies and algorithms to estimate the overall noise containment in single chip and multi-chip package assemblies. We hope that the techniques and results described in this book will be useful as guides for design, package, and system engineers and academia working in this area. Through this monograph, we hope that we have shown the necessity of interactions that are essential between chip design, system design and package design engineers to design and manufacture optimal packaged systems. Work reported in this monograph was partially supported by the grant from Semiconductor Research Corporation (SRC Contract No. 92-MP-086) Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits Rauschen (DE-588)4048606-0 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 gnd rswk-swf CMOS-Schaltung (DE-588)4148111-2 s Rauschen (DE-588)4048606-0 s 1\p DE-604 Prince, John L. aut Erscheint auch als Druck-Ausgabe 9780792394006 https://doi.org/10.1007/978-1-4615-3204-0 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Senthinathan, Ramesh Prince, John L. Simultaneous Switching Noise of CMOS Devices and Systems Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits Rauschen (DE-588)4048606-0 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| subject_GND | (DE-588)4048606-0 (DE-588)4148111-2 |
| title | Simultaneous Switching Noise of CMOS Devices and Systems |
| title_auth | Simultaneous Switching Noise of CMOS Devices and Systems |
| title_exact_search | Simultaneous Switching Noise of CMOS Devices and Systems |
| title_full | Simultaneous Switching Noise of CMOS Devices and Systems by Ramesh Senthinathan, John L. Prince |
| title_fullStr | Simultaneous Switching Noise of CMOS Devices and Systems by Ramesh Senthinathan, John L. Prince |
| title_full_unstemmed | Simultaneous Switching Noise of CMOS Devices and Systems by Ramesh Senthinathan, John L. Prince |
| title_short | Simultaneous Switching Noise of CMOS Devices and Systems |
| title_sort | simultaneous switching noise of cmos devices and systems |
| topic | Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits Rauschen (DE-588)4048606-0 gnd CMOS-Schaltung (DE-588)4148111-2 gnd |
| topic_facet | Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits Rauschen CMOS-Schaltung |
| url | https://doi.org/10.1007/978-1-4615-3204-0 |
| work_keys_str_mv | AT senthinathanramesh simultaneousswitchingnoiseofcmosdevicesandsystems AT princejohnl simultaneousswitchingnoiseofcmosdevicesandsystems |