Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017: Volume 2
Saved in:
| Corporate Author: | |
|---|---|
| Other Authors: | |
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Singapore
Springer
[2018]
|
| Series: | Springer Proceedings in Physics
volume 213 |
| Subjects: | |
| Online Access: | TUM01 UBM01 UBT01 UER01 Volltext |
| Physical Description: | 1 Online-Ressource (XIV, 438 p. 302 illus) |
| ISBN: | 9789811313165 |
| DOI: | 10.1007/978-981-13-1316-5 |
Staff View
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| id | DE-604.BV045164865 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:29Z |
| institution | BVB |
| institution_GND | (DE-588)1165610019 |
| isbn | 9789811313165 |
| language | English |
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| physical | 1 Online-Ressource (XIV, 438 p. 302 illus) |
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| publishDate | 2018 |
| publishDateSearch | 2018 |
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| publisher | Springer |
| record_format | marc |
| series | Springer Proceedings in Physics |
| series2 | Springer Proceedings in Physics |
| spelling | International Conference on Technology and Instrumentation in Particle Physics 2017 Peking Verfasser (DE-588)1165610019 aut Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 edited by Zhen-An Liu Singapore Springer [2018] 1 Online-Ressource (XIV, 438 p. 302 illus) txt rdacontent c rdamedia cr rdacarrier Springer Proceedings in Physics volume 213 Measurement Science and Instrumentation Particle Acceleration and Detection, Beam Physics Electronics and Microelectronics, Instrumentation Particle acceleration Electronics Liu, Zhen-An (DE-588)116566562X edt Erscheint auch als Druck-Ausgabe 978-981-131-315-8 Erscheint auch als Druck-Ausgabe 978-981-131-317-2 Springer Proceedings in Physics volume 213 (DE-604)BV041207043 213 https://doi.org/10.1007/978-981-13-1316-5 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 Springer Proceedings in Physics Measurement Science and Instrumentation Particle Acceleration and Detection, Beam Physics Electronics and Microelectronics, Instrumentation Particle acceleration Electronics |
| title | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 |
| title_auth | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 |
| title_exact_search | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 |
| title_full | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 edited by Zhen-An Liu |
| title_fullStr | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 edited by Zhen-An Liu |
| title_full_unstemmed | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 edited by Zhen-An Liu |
| title_short | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 |
| title_sort | proceedings of international conference on technology and instrumentation in particle physics 2017 volume 2 |
| title_sub | Volume 2 |
| topic | Measurement Science and Instrumentation Particle Acceleration and Detection, Beam Physics Electronics and Microelectronics, Instrumentation Particle acceleration Electronics |
| topic_facet | Measurement Science and Instrumentation Particle Acceleration and Detection, Beam Physics Electronics and Microelectronics, Instrumentation Particle acceleration Electronics |
| url | https://doi.org/10.1007/978-981-13-1316-5 |
| volume_link | (DE-604)BV041207043 |
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