Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017: Volume 2
Gespeichert in:
Körperschaft: | |
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Weitere Verfasser: | |
Format: | Elektronisch Tagungsbericht E-Book |
Sprache: | English |
Veröffentlicht: |
Singapore
Springer
[2018]
|
Schriftenreihe: | Springer Proceedings in Physics
volume 213 |
Schlagworte: | |
Online-Zugang: | TUM01 UBM01 UBT01 UER01 Volltext |
Beschreibung: | 1 Online-Ressource (XIV, 438 p. 302 illus) |
ISBN: | 9789811313165 |
DOI: | 10.1007/978-981-13-1316-5 |
Internformat
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Datensatz im Suchindex
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any_adam_object | |
author2 | Liu, Zhen-An |
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author_corporate | International Conference on Technology and Instrumentation in Particle Physics Peking |
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discipline | Physik |
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format | Electronic Conference Proceeding eBook |
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illustrated | Not Illustrated |
indexdate | 2024-07-10T08:10:29Z |
institution | BVB |
institution_GND | (DE-588)1165610019 |
isbn | 9789811313165 |
language | English |
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physical | 1 Online-Ressource (XIV, 438 p. 302 illus) |
psigel | ZDB-2-PHA ZDB-2-PHA_2018 |
publishDate | 2018 |
publishDateSearch | 2018 |
publishDateSort | 2018 |
publisher | Springer |
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series | Springer Proceedings in Physics |
series2 | Springer Proceedings in Physics |
spelling | International Conference on Technology and Instrumentation in Particle Physics 2017 Peking Verfasser (DE-588)1165610019 aut Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 edited by Zhen-An Liu Singapore Springer [2018] 1 Online-Ressource (XIV, 438 p. 302 illus) txt rdacontent c rdamedia cr rdacarrier Springer Proceedings in Physics volume 213 Measurement Science and Instrumentation Particle Acceleration and Detection, Beam Physics Electronics and Microelectronics, Instrumentation Particle acceleration Electronics Liu, Zhen-An (DE-588)116566562X edt Erscheint auch als Druck-Ausgabe 978-981-131-315-8 Erscheint auch als Druck-Ausgabe 978-981-131-317-2 Springer Proceedings in Physics volume 213 (DE-604)BV041207043 213 https://doi.org/10.1007/978-981-13-1316-5 Verlag URL des Erstveröffentlichers Volltext |
spellingShingle | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 Springer Proceedings in Physics Measurement Science and Instrumentation Particle Acceleration and Detection, Beam Physics Electronics and Microelectronics, Instrumentation Particle acceleration Electronics |
title | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 |
title_auth | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 |
title_exact_search | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 |
title_full | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 edited by Zhen-An Liu |
title_fullStr | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 edited by Zhen-An Liu |
title_full_unstemmed | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 Volume 2 edited by Zhen-An Liu |
title_short | Proceedings of International Conference on Technology and Instrumentation in Particle Physics 2017 |
title_sort | proceedings of international conference on technology and instrumentation in particle physics 2017 volume 2 |
title_sub | Volume 2 |
topic | Measurement Science and Instrumentation Particle Acceleration and Detection, Beam Physics Electronics and Microelectronics, Instrumentation Particle acceleration Electronics |
topic_facet | Measurement Science and Instrumentation Particle Acceleration and Detection, Beam Physics Electronics and Microelectronics, Instrumentation Particle acceleration Electronics |
url | https://doi.org/10.1007/978-981-13-1316-5 |
volume_link | (DE-604)BV041207043 |
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