Verfügbarkeit: Handbook of materials characterization

Handbook of materials characterization:

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Bibliographische Detailangaben
Weitere Verfasser:	Sharma, Surender Kumar (HerausgeberIn)
Format:	Buch
Sprache:	English
Veröffentlicht:	Cham Springer [2018]
Schlagworte:	Mikroskopie Elektronenmikroskopie Spektroskopie Strukturanalyse Werkstoffprüfung Neutronendiffraktometrie Materialcharakterisierung
Online-Zugang:	Inhaltstext Inhaltsverzeichnis
Beschreibung:	viii, 613 Seiten Illustrationen, Diagramme (überwiegend farbig)
ISBN:	9783319929545 3319929542

Internformat

MARC


LEADER	00000nam a2200000 c 4500
001	BV045162743
003	DE-604
005	20230403
007	t
008	180903s2018 sz a\|\|\| \|\|\|\| 00\|\|\| eng d
016	7		\|a 1156862019 \|2 DE-101
020			\|a 9783319929545 \|c Festeinband : circa EUR 246.09 (DE) (freier Preis), circa EUR 252.99 (AT) (freier Preis), circa CHF 253.00 (freier Preis) \|9 978-3-319-92954-5
020			\|a 3319929542 \|9 3-319-92954-2
024	3		\|a 9783319929545
035			\|a (OCoLC)1060613478
035			\|a (DE-599)DNB1156862019
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
044			\|a sz \|c XA-CH
049			\|a DE-83 \|a DE-703 \|a DE-11
084			\|a UQ 8010 \|0 (DE-625)146585: \|2 rvk
084			\|a ZM 3500 \|0 (DE-625)159836: \|2 rvk
084			\|a ZM 3100 \|0 (DE-625)159835: \|2 rvk
245	1	0	\|a Handbook of materials characterization \|c Surender Kumar Sharma, editor
264		1	\|a Cham \|b Springer \|c [2018]
300			\|a viii, 613 Seiten \|b Illustrationen, Diagramme (überwiegend farbig)
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
650	0	7	\|a Mikroskopie \|0 (DE-588)4039238-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Elektronenmikroskopie \|0 (DE-588)4014327-2 \|2 gnd \|9 rswk-swf
650	0	7	\|a Spektroskopie \|0 (DE-588)4056138-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Strukturanalyse \|0 (DE-588)4183787-3 \|2 gnd \|9 rswk-swf
650	0	7	\|a Werkstoffprüfung \|0 (DE-588)4037934-6 \|2 gnd \|9 rswk-swf
650	0	7	\|a Neutronendiffraktometrie \|0 (DE-588)4340336-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Materialcharakterisierung \|0 (DE-588)4720368-7 \|2 gnd \|9 rswk-swf
689	0	0	\|a Werkstoffprüfung \|0 (DE-588)4037934-6 \|D s
689	0	1	\|a Materialcharakterisierung \|0 (DE-588)4720368-7 \|D s
689	0	2	\|a Spektroskopie \|0 (DE-588)4056138-0 \|D s
689	0	3	\|a Elektronenmikroskopie \|0 (DE-588)4014327-2 \|D s
689	0	4	\|a Neutronendiffraktometrie \|0 (DE-588)4340336-0 \|D s
689	0	5	\|a Mikroskopie \|0 (DE-588)4039238-7 \|D s
689	0	6	\|a Strukturanalyse \|0 (DE-588)4183787-3 \|D s
689	0		\|5 DE-604
700	1		\|a Sharma, Surender Kumar \|0 (DE-588)1132356318 \|4 edt
710	2		\|a Springer International Publishing \|0 (DE-588)1064344704 \|4 pbl
776	0	8	\|i Erscheint auch als \|n Online-Ausgabe \|z 978-3-319-92955-2
856	4	2	\|m X:MVB \|q text/html \|u http://deposit.dnb.de/cgi-bin/dokserv?id=ddb4fa9d12174aa58c9ec9ba4615d6b5&prov=M&dok_var=1&dok_ext=htm \|3 Inhaltstext
856	4	2	\|m HEBIS Datenaustausch \|q application/pdf \|u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030552193&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA \|3 Inhaltsverzeichnis
999			\|a oai:aleph.bib-bvb.de:BVB01-030552193

Datensatz im Suchindex

_version_	1804178843774222336
adam_text	f Contents 1 Neutron Diffraction: A tool for the Magnetic Properties 1 Pablo Leite Bernardo and Helio Salim de Amorim 2 Small-Angle X-Ray Scattering to Analyze the Morphological Properties of Nanoparticulated Systems 37 Oscar Moscoso Londono, Pablo Tancredi, Patricia Rivas, Diego Muraca, Leandro M Socolovsky, and Marcelo Knobel 3 Dynamic Light Scattering: Effective Sizing Technique for Characterization of Magnetic Nanoparticles 77 Sim Siong Leong, Wei Ming Ng, JitKang Lim, and Swee Pin Yeap 4 Scanning Electron Microscopy: Principle and Applications in Nanomaterials Characterization 113 Kalsoom Akhtar, Shahid Ali Khan, Sher Bahadar Khan, and Abdullah M Asiri 5 TEM for Atomic-Scale Study: Fundamental, Instrumentation, and Applications in Nanotechnology 147 Yasir Javed, Khuram Ali, Kanwal Akhtar, Jawaria, M Irfan Hussain, Gulzar Ahmad, and Taskeen Arif 6 Materials Characterization Using Scanning Tunneling Microscopy: From Fundamentals to Advanced Applications 217 Suryakanti Debata, Trupti R Das, Rashmi Madhuri, and Prashant K Sharma 7 Atomic and Magnetic Force Studies of Co Thin Films and Nanoparticles: Understanding the Surface Correlation Using Fractal Studies 263 Indra Sulania, R P Yadav, and Ranjeet Kumar Karn VIX 8 Optical Spectroscopy and Its Applications in Inorganic Materials 293 Marcio Aurelio Pinheiro Almeida and Adeilton Pereira Maciel 9 Fourier Transform Infrared Spectroscopy: Fundamentals and Application in Functional Groups and Nanomaterials Characterization 317 Shahid Ali Khan, Sher Bahadar Khan, Latif Ullah Khan, Aliya Farooq, Kalsoom Akhtar, and Abdullah M Asiri 10 Rare Earth Luminescence: Electronic Spectroscopy and Applications 345 Latif Ullah Khan and Zahid U Khan 11 Raman Spectroscopy: A Potential Characterization Tool for Carbon Materials 405 Padmnabh Rai and Satish Kumar Dubey 12 Photoelectron Spectroscopy: Fundamental Principles and Applications 435 Jagdish Kumar 13 Introduction to X-Ray Absorption Spectroscopy and Its Applications in Material Science 497 Aditya Sharma, Jitendra Pal Singh, Sung Ok Won, Keun Hwa Chae, Surender Kumar Sharma, and Shalendra Kumar 14 31P Solid-State NMR Spectroscopy of Adsorbed Phosphorous Probe Molecules: Acidity Characterization of Solid Acid Carbonaceous Materials for Catalytic Applications 549 Bhaskar Garg Index
any_adam_object	1
author2	Sharma, Surender Kumar
author2_role	edt
author2_variant	s k s sk sks
author_GND	(DE-588)1132356318
author_facet	Sharma, Surender Kumar
building	Verbundindex
bvnumber	BV045162743
classification_rvk	UQ 8010 ZM 3500 ZM 3100
ctrlnum	(OCoLC)1060613478 (DE-599)DNB1156862019
discipline	Physik Werkstoffwissenschaften / Fertigungstechnik
format	Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02632nam a2200565 c 4500</leader><controlfield tag="001">BV045162743</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20230403 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">180903s2018 sz a\|\|\| \|\|\|\| 00\|\|\| eng d</controlfield><datafield tag="016" ind1="7" ind2=" "><subfield code="a">1156862019</subfield><subfield code="2">DE-101</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9783319929545</subfield><subfield code="c">Festeinband : circa EUR 246.09 (DE) (freier Preis), circa EUR 252.99 (AT) (freier Preis), circa CHF 253.00 (freier Preis)</subfield><subfield code="9">978-3-319-92954-5</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3319929542</subfield><subfield code="9">3-319-92954-2</subfield></datafield><datafield tag="024" ind1="3" ind2=" "><subfield code="a">9783319929545</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1060613478</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)DNB1156862019</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">sz</subfield><subfield code="c">XA-CH</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 8010</subfield><subfield code="0">(DE-625)146585:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3500</subfield><subfield code="0">(DE-625)159836:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ZM 3100</subfield><subfield code="0">(DE-625)159835:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Handbook of materials characterization</subfield><subfield code="c">Surender Kumar Sharma, editor</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Cham</subfield><subfield code="b">Springer</subfield><subfield code="c">[2018]</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">viii, 613 Seiten</subfield><subfield code="b">Illustrationen, Diagramme (überwiegend farbig)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Strukturanalyse</subfield><subfield code="0">(DE-588)4183787-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Neutronendiffraktometrie</subfield><subfield code="0">(DE-588)4340336-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Materialcharakterisierung</subfield><subfield code="0">(DE-588)4720368-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Materialcharakterisierung</subfield><subfield code="0">(DE-588)4720368-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Spektroskopie</subfield><subfield code="0">(DE-588)4056138-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="4"><subfield code="a">Neutronendiffraktometrie</subfield><subfield code="0">(DE-588)4340336-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="5"><subfield code="a">Mikroskopie</subfield><subfield code="0">(DE-588)4039238-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="6"><subfield code="a">Strukturanalyse</subfield><subfield code="0">(DE-588)4183787-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Sharma, Surender Kumar</subfield><subfield code="0">(DE-588)1132356318</subfield><subfield code="4">edt</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Springer International Publishing</subfield><subfield code="0">(DE-588)1064344704</subfield><subfield code="4">pbl</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Online-Ausgabe</subfield><subfield code="z">978-3-319-92955-2</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">X:MVB</subfield><subfield code="q">text/html</subfield><subfield code="u">http://deposit.dnb.de/cgi-bin/dokserv?id=ddb4fa9d12174aa58c9ec9ba4615d6b5&prov=M&dok_var=1&dok_ext=htm</subfield><subfield code="3">Inhaltstext</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">HEBIS Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030552193&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030552193</subfield></datafield></record></collection>
id	DE-604.BV045162743
illustrated	Illustrated
indexdate	2024-07-10T08:10:25Z
institution	BVB
institution_GND	(DE-588)1064344704
isbn	9783319929545 3319929542
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-030552193
oclc_num	1060613478
open_access_boolean
owner	DE-83 DE-703 DE-11
owner_facet	DE-83 DE-703 DE-11
physical	viii, 613 Seiten Illustrationen, Diagramme (überwiegend farbig)
publishDate	2018
publishDateSearch	2018
publishDateSort	2018
publisher	Springer
record_format	marc
spelling	Handbook of materials characterization Surender Kumar Sharma, editor Cham Springer [2018] viii, 613 Seiten Illustrationen, Diagramme (überwiegend farbig) txt rdacontent n rdamedia nc rdacarrier Mikroskopie (DE-588)4039238-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Strukturanalyse (DE-588)4183787-3 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Neutronendiffraktometrie (DE-588)4340336-0 gnd rswk-swf Materialcharakterisierung (DE-588)4720368-7 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 s Materialcharakterisierung (DE-588)4720368-7 s Spektroskopie (DE-588)4056138-0 s Elektronenmikroskopie (DE-588)4014327-2 s Neutronendiffraktometrie (DE-588)4340336-0 s Mikroskopie (DE-588)4039238-7 s Strukturanalyse (DE-588)4183787-3 s DE-604 Sharma, Surender Kumar (DE-588)1132356318 edt Springer International Publishing (DE-588)1064344704 pbl Erscheint auch als Online-Ausgabe 978-3-319-92955-2 X:MVB text/html http://deposit.dnb.de/cgi-bin/dokserv?id=ddb4fa9d12174aa58c9ec9ba4615d6b5&prov=M&dok_var=1&dok_ext=htm Inhaltstext HEBIS Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030552193&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis
spellingShingle	Handbook of materials characterization Mikroskopie (DE-588)4039238-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Spektroskopie (DE-588)4056138-0 gnd Strukturanalyse (DE-588)4183787-3 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Neutronendiffraktometrie (DE-588)4340336-0 gnd Materialcharakterisierung (DE-588)4720368-7 gnd
subject_GND	(DE-588)4039238-7 (DE-588)4014327-2 (DE-588)4056138-0 (DE-588)4183787-3 (DE-588)4037934-6 (DE-588)4340336-0 (DE-588)4720368-7
title	Handbook of materials characterization
title_auth	Handbook of materials characterization
title_exact_search	Handbook of materials characterization
title_full	Handbook of materials characterization Surender Kumar Sharma, editor
title_fullStr	Handbook of materials characterization Surender Kumar Sharma, editor
title_full_unstemmed	Handbook of materials characterization Surender Kumar Sharma, editor
title_short	Handbook of materials characterization
title_sort	handbook of materials characterization
topic	Mikroskopie (DE-588)4039238-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Spektroskopie (DE-588)4056138-0 gnd Strukturanalyse (DE-588)4183787-3 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Neutronendiffraktometrie (DE-588)4340336-0 gnd Materialcharakterisierung (DE-588)4720368-7 gnd
topic_facet	Mikroskopie Elektronenmikroskopie Spektroskopie Strukturanalyse Werkstoffprüfung Neutronendiffraktometrie Materialcharakterisierung
url	http://deposit.dnb.de/cgi-bin/dokserv?id=ddb4fa9d12174aa58c9ec9ba4615d6b5&prov=M&dok_var=1&dok_ext=htm http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030552193&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA
work_keys_str_mv	AT sharmasurenderkumar handbookofmaterialscharacterization AT springerinternationalpublishing handbookofmaterialscharacterization

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