Verfügbarkeit: Large-angle convergent-beam electron diffraction (LACBED)

$Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects$

Large-angle convergent-beam electron diffraction (LACBED): applications to crystal defects

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	Morniroli, Jean Paul (VerfasserIn)
Format:	Buch
Sprache:	English
Veröffentlicht:	Paris SFµ [2002] [Boca Raton] CRC Press
Schriftenreihe:	Monograph of the French Society of Microscopies
Schlagworte:	Elektronenbeugung Kristallstrukturanalyse
Online-Zugang:	Inhaltsverzeichnis Klappentext
Beschreibung:	xii, 431 Seiten Illustrationen, Diagramme
ISBN:	9781138414181 2901483054

Internformat

MARC


LEADER	00000nam a2200000 c 4500
001	BV045152530
003	DE-604
005	20190508
007	t
008	180828s2002 a\|\|\| \|\|\|\| 00\|\|\| eng d
020			\|a 9781138414181 \|9 978-1-138-41418-1
020			\|a 2901483054 \|9 2-901483-05-4
035			\|a (OCoLC)249418472
035			\|a (DE-599)BVBBV045152530
040			\|a DE-604 \|b ger \|e rda
041	0		\|a eng
049			\|a DE-703
084			\|a UQ 5500 \|0 (DE-625)146526: \|2 rvk
100	1		\|a Morniroli, Jean Paul \|e Verfasser \|4 aut
245	1	0	\|a Large-angle convergent-beam electron diffraction (LACBED) \|b applications to crystal defects \|c Jean Paul Morniroli
264		1	\|a Paris \|b SFµ \|c [2002]
264		1	\|a [Boca Raton] \|b CRC Press
300			\|a xii, 431 Seiten \|b Illustrationen, Diagramme
336			\|b txt \|2 rdacontent
337			\|b n \|2 rdamedia
338			\|b nc \|2 rdacarrier
490	0		\|a Monograph of the French Society of Microscopies
650	0	7	\|a Elektronenbeugung \|0 (DE-588)4151862-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Kristallstrukturanalyse \|0 (DE-588)4137204-9 \|2 gnd \|9 rswk-swf
689	0	0	\|a Elektronenbeugung \|0 (DE-588)4151862-7 \|D s
689	0	1	\|a Kristallstrukturanalyse \|0 (DE-588)4137204-9 \|D s
689	0		\|5 DE-604
856	4	2	\|m Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment \|q application/pdf \|u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030542198&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA \|3 Inhaltsverzeichnis
856	4	2	\|m Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment \|q application/pdf \|u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030542198&sequence=000002&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA \|3 Klappentext
999			\|a oai:aleph.bib-bvb.de:BVB01-030542198

Datensatz im Suchindex

_version_	1804178825977790464
adam_text	CONTENT CONTENT introduction 1 î - Bragg’s law 5 1.1 - Analogy with the reflection of visible light 5 1.2 - Three-dimensional description of Bragg’s law 6 1.3 - The particular case of electron diffraction 8 II - Formation of the diffraction pattern in the electron microscope 11 11.1 - Electron ray-paths in the objective lens o 11 III - Electron diffraction patterns produced by a parallel incident beam 15 111.1 - Diffraction pattern in the two-beam conditions 16 111.1.1 - A set of (hkl) lattice planes is exactly at the Bragg orientation: 16 exact two-beam conditions 111.1.1.1 - Formation of the diffraction pattern 16 I II. 1.1. 2 - Ewald sphere construction 20 111.1.1.2.1 - Relationship between the Ewald sphere construction 21 and the diffraction pattern 111.1.1.2.2 - Peculiarities of the electron diffraction phenomenon 22 IIM .2 - A set of (hkl) lattice planes is close to the Bragg orientation: near 23 two-beam conditions. IIM .2.1 - Formation of the pattern 23 IIM .2.2 - Ewald sphere construction 26 111.1.2.3 - Characterization of the deviation parameter s 26 111.1.3 - Special cases 28 111.1.3.1 - The set parallel incident beam is not directed along the 28 optic axis of the microscope 111.1.3.2 - The set of (hkl) lattice planes is parallel to the electron 30 beam 33 IIM.4 - Application: setting (hkl) lattice planes at the exact Bragg orientation 33 111.2 - Diffraction pattern in multi-beam conditions 33 111.2.1 - General Case 35 111.2.2 - Special case: [uvw] zone axis pattern (ZAP) 41 IV- Diffraction pattern produced by a convergent incident beam: CBED pattern 41 IV. 1 - Diffraction pattern under two-beam conditions 41 IV. 1.1 - A single set of (hkl) lattice planes is at the exact Bragg 41 orientation: exact two-beam conditions IV. 1.1.1 - Formation of the diffraction pattern 41 IV. 1.1.2 - Ewald sphere construction 45 IV.1.2 - A set of (hkl) lattice planes is near the Bragg orientation: near 53 vii CONTENT two-beam conditions IV. 1.2.1 - Formation of the diffraction pattern 53 IV. 1.2.2 - Ewald sphere construction 53 IV. 1.3 - Particular case: the set of (hkf) lattice planes is parallel to the 53 optic axis IV. 1.4 - The incident beam is tilted with respect to the optic axis 56 IV. 1.5 - Application: setting (hkl) lattice planes at the exact Bragg 56 orientation IV.2 - Diffraction pattern under many-beam conditions 58 IV. 2.1 - General case 58 IV. 2.1.1 - Influence of the convergence semi-angle on the number of 60 diffracted reflections V. 2.2 - Particular case: [uvw] zone-axis pattern 61 IV. 3 - Influence of the convergence semi-angle on the CBED pattern 65 V - Diffraction pattern produced by a large-angle convergent incident beam: 67 Kossel pattern V. 1 - Advantage of a large convergence angle 67 V.2 - Kossel patterns 68 V. 2.1 - General case 68 V.2.2 - [uvw] zone-axis Kossel pattern 71 V.2.3 - Main characteristics of the Kossel patterns 71 V. 2.3.1 - Particular case of a [uvw] zone axis Kossel pattern 78 V. 2.4 - Detail of the superimposition of the deficiency and excess lines 78 V. 3 - Limiting value of the convergence semi-angle 81 VI - Diffraction pattern produced by a large-angle convergent beam: LACBED 83 patterns VI. 1 - Formation of bright- and dark-field LACBED patterns 83 VI. 1.1 - Two-beam conditions 83 VI. 1.1.1 - Bright-field pattern 86 VI. 1.1.2 - Dark-field pattern 90 VL1.2 - [uvw] zone-axis pattern 90 VI.2 - Effect of the specimen height 93 VI.3 - Minimum specimen height 97 VI.4 - Variation of the deviation parameter s 100 VI.5 - Effect of the probe size S 100 VI.6 - Formation of the shadow image 104 VI.6.1 - Size of the illuminated area 106 VI.6.2 - Minimum size of the illuminated area 106 VI.6.3 - Magnification of the shadow image 107 VI.6.4 - Shift of the shadow image in bright- and dark-field LACBED 109 patterns VI.6.5 - Rotation of the shadow image 112 Vl.6.6 - Resolution of the shadow image 114 VI.6.7 - Focus of the shadow image and of the line pattern 115 VI.7 - Angular filtering of LACBED patterns 118 VI.8 - Effect of the temperature on LACBED patterns 123 VI.9 - Effect of a specimen tilt 126 VI. 10 - Effect of a specimen deformation 126 VI. 11 - Effect of a variation of the lattice parameters 131 VI. 12 - Effect of the accelerating voltage 133 VI.13 - Effect of the specimen thickness 134 VI. 14 - Analogy with bend-contour patterns 136 VI. 15 - Analogy with Kikuchi patterns 140 viii CONTENT VI. 15,1 - Indices of the Kikuchi lines 144 VI. 15.2 - Properties of Kikuchi lines 144 VI. 15.3 - Interest of Kikuchi lines 148 VII - Diffracted and transmitted intensities 149 VII. 1 - Generalities 149 VH.2 - Kinematical theory under two-beam conditions 150 Vll.2.1 - Effect of the deviation parameter s on the diffracted 151 intensity lg VI1.2.2 - Effect of the thickness t on the diffracted intensity lg 153 VI1.3 - Dynamical theory under two-beam conditions 155 VII.3.1 - Effect of the deviation parameter s on the diffracted 156 intensity lg VII.3.2 - Effect of the thickness t on the diffracted intensities lg 158 Vli.3.3 - Complementarity of the transmitted and diffracted 158 intensities VII.3.4 - Effect of absorption on the transmitted and diffracted 159 intensities. VI1.4 - Comparison of the kinematical and dynamical theories 159 VII.5 - Appearance of the excess and deficiency lines 163 VII.5.1 - Effect of the extinction distance on the excess and 165 deficiency lines VII.5.2 - Effect of the specimen thickness on the excess and 165 deficiency lines VI1.5.2.1 - CBED and Koss el patterns 165 Vll.5.2.2 - LACBED patterns 170 VI1.5.3 - Angular width of the excess and deficiency lines 170 VII.5.4 - Dynamical and quasi-kinematical lines 171 VII. 6 - Dynamical Interactions 173 VII.6.1 - Interactions under two-beam conditions 173 VII.6.1.1 - Parallel incident beam 173 VII.6.1.2 - Convergent Incident beam 173 VII.6.1.3 - Large-angle convergent beam: Kossel 174 patterns VII. 6.2 - Many-beam interactions 176 Vll.6.2.1 - Three-beam patterns 176 Vll.6.2.2 - Multi-beam patterns 177 Vll.6.2.3 - LACBED patterns 181 VIII - Experimental methods 185 VI11.1 - Operating principle of magnetic lenses 185 VIII. 1.1 - Focused, under-focused and over-focused lenses 187 VIII.1.2 - Condenser-objective lens 187 VIII. 1.3 - Description of the nanoprobe and microprobe0 modes 188 VI11.2 - General description of the microscope 189 VIII.2.1 - Description of the condenser 192 VIII.2.1.2 - Effect of the first condenser 192 VIII.2.1.2- Effect of the second condenser 193 VIII. 2.1.2.1 - Effect of the aperture of the second condenser 196 Effect of the size of the aperture 196 Effect of the centring of the aperture 198 VIII.2.2 - Angular scanning 198 Vlll.2.3 - Complete description of the formation of the image and 201 diffraction pattern ix CONTENT VIII.2.4 - Aberrations 201 VIII.2.4.1 - Spherical aberration 201 Vlll.2.4.1.1 - Effect of the spherical aberration on Kossel and 208 LACBED patterns - Effect on Kossel patterns 208 - Effect of the spherical aberration on the superimposition of 208 the excess and deficiency lines - Effect of spherical aberration on the size of the diffracted 210 area - Effect on LACBED patterns 211 VIII. 3 - Obtaining large-angle electron diffraction patterns 211 VIII. 3.1 - Obtaining Kossel patterns 213 VIII.3.1.1 - Adjustment of the illumination conditions 213 VIII.3.1.1.1 - Beam adjustments 216 VIH.3.2 - Obtaining LACBED patterns 221 VHI.3.2.1 - Operating conditions in the image mode 221 Vlll.3.2.2 - Operating conditions in the diffraction mode 221 VIII. 3.2.2.1 - Dark-field LACBED pattern 224 VIII. 3.2.3 - Quality improvements of LACBED patterns 224 IX - LACBED variants 231 IX. 1 - Parallel techniques 232 IX. 1.1 - The eucentric LACBED technique 232 IX. 1.1.1 - Obtaining an eucentric LACBED pattern 235 IX. 1.1.1.1 - In the image mode 235 IX. 1.1.1.2 - In the diffraction mode 235 IX. 1.1.2. - Improvement of the quality of eucentric LACBED patterns 237 IX.1.2 - The CBIM technique 237 IX. 1.2.1 - Comparison of the LACBED and CBIM techniques 239 IX. 1.2.2 - Obtaining CBIM patterns 239 IX. 1.2.3 - Effects of the experimental parameters on CBIM patterns 242 IX. 1.2.3.1 - Effect of the focus of the C2 condenser 242 IX. 1.2.3.2 - Effect of the probe size S 246 IX. 1.2.3.3 - Effect of the objective aperture 246 IX.1.2.4 - Advantages and disadvantages of the CBIM technique 246 IX.1.3 - The defocus CBED technique 249 IX.1.3.1 - Obtaining a defocus CBED pattern. 249 IX.1.3.2 - Main experimental parameters 249 IX.1.4 - The bright + dark field LACBED method 252 IX.2 - Serial techniques 255 IX.2.1 - The beam-rocking method (SACP) 255 IX.2.2 - The specimen-rocking technique 258 IX.2.3 - Montage of CBED patterns 258 IX. 3 - Filtering LACBED patterns 259 IX. 3.1 - Filtering electrons 260 IX.3.1.1- Angular filtering 260 IX.3.1.2 - Energy filtering 260 IX.3.1.2.1 - Effect of energy filtering on LACBED patterns 264 IX.3.1.2.2 - Effect of energy filtering on CBIM patterns 264 X - Indexing LACBED patterns 265 X. 1 - Generalities 265 X.2 - Simulation of LACBED patterns 265 X. 2.1 - Dynamical simulations 265 X.2.2 - Kinematical simulations 268 x CONTENT X.3 - Conventions 268 X.4 - Indexing LACBED patterns 269 X.4.1 - Indexing [uvw] zone-axis LACBED patterns 269 X.4.1.1 - Identification of the [uvw] zone axis 274 X. 4.1.1.1 - Identification of the [uvw] zone axis from spot patterns 274 X.4.1.1.2 - Identification of the [uvw] zone axis from Kikuchi patterns. 274 X.4.2 - indexing non-zone-axis LACBED patterns 276 X.4.2.1 - Identification of the crystal orientation 278 X.5 - Trace analyses from LACBED patterns 280 X.5.1 - Identification of lines from LACBED patterns 282 X.5.1.1 - First method (method Li) 285 X.5.1.2 - Second method (method L2) 285 X.5.1.3- Derivation of the indices uU( vy and wy of the n line 285 X.5.1.4 - Application of the method L-i 290 X.5.1.5- Application of the method L2. 290 X.5.2 - Identification of planes from LACBED patterns 291 X.5.2.1 - First method P1 293 X. 5.2.2 - Second method P2 293 X. 5.3 - Advantages and disadvantages of trace analyses from LACBED 296 patterns X. 6 - Identification of the deviation parameter s 297 XI - Characterization of crystal defects from LACBED patterns 299 XI. 1 - Characterization of point defects 299 XI. 1.1 - Crystallography of point defects 299 XI.1.2 - Effect of point defects on LACBED Patterns 300 XI.2 - Characterization of linear defects: dislocations 302 XI.2.1 - Crystallography of dislocations 302 XI. 2.1.1 - Burgers circuit 302 XI.2.2 - Identification of the Burgers vector from LACBED patterns 305 XI.2.2.1 - Experimental identification of the Burgers vector b 307 XI. 2.2,1.1 - First example of Burgers vector identification 310 XI.2.2.1.2 - Second example of Burgers vector identification 311 XI.2.2.1.3 - Third example of Burgers vector identification 311 Xl.2.2.2 - Operating conditions for the Burgers vector identification 314 XI.2.2.2.1 - Selection of the Ah value 314 XI.2.2.2.2 - Choice of the Bragg lines 316 XI.2.2.2.3 - Choice of the probe size 316 XI.2.2.2.4 - Choice of the technique 316 XI.2.2.2.5 - Choice of the bright- or dark-field patterns 317 Xl.2.2.2.6 - A few difficulties 317 XI.2.2.3 - Applications of the LACBED technique to the 319 characterization of various types of dislocations XL2.2.3.1 - Applications to electron-beam-sensitive crystals 319 XI.2.2.3.2 - Other applications 320 XI.2.2.4 - Advantages of the LACBED technique 320 Xl.2.3 - Identification of the dislocation line u 321 XI.3 - Characterization of planar (2D) defects 323 XI.3 1 - Characterization of stacking faults 323 XI.3.1.1 - Crystallography of stacking faults 323 XI.3.1.1.1 - Description of the stacking sequences 326 - Intrinsic stacking faults 327 - Extrinsic stacking faults 329 xi CONTENT Xt.3.1.2 - Identification of the fault plane 329 XI.3.1.3 - Identification of the fault vector R 329 XI.3.1.3.1 - Effect of a stacking fault on diffraction patterns 329 - Effect of absorption 333 XI.3.1.3.2 - Effect of a stacking fault on CBED patterns 334 - Identification of the fault vector R from CBED patterns 335 XI.3.1.3 3 - Effect of a stacking fault on LACBED patterns 338 XI. 1.1.3.4 - Operating conditions 340 XI.3.1.3.5 - Quantitative analysis 344 Xl.3.1.4 - Advantages of the CBED and LACBED methods with 345 respect to the conventional techniques XI.3.2 - Characterization of partial dislocations 345 XI.3.2.1 - Crystallography of partial dislocations 345 XI.3.2.1.1 - Burgers circuit of partial dislocations 350 XI.3.2.2 - Identification of partial dislocations from LACBED patterns 350 XI.3.2.3 - Characterization of dislocation loops 355 XI.3.2.3.1 - Crystallography of dislocation loops 355 Xl.3.2.3.2 - Identification of dislocation loops from LACBED patterns 357 XI.3.3 - Characterization of antiphase boundaries (APB) 357 XI.3.3 1 - Crystallography of antiphase boundary 357 XL3.3.2 - Effect of APB on diffraction patterns 359 XI.3.3.2.1 - Effect of an APB on CBED patterns 362 XI.3.3.2.2 - Effect of an APB on LACBED patterns 362 Xl.3.4 - Characterization of grain boundaries 366 XI.3.4.1 - Crystallography of grain boundaries 366 Xl.3.4.1.1 - Particular cases 367 - Subgrain boundaries 367 - Coincidence grain boundaries 367 - Twin boundaries 368 XI.3.4.2 - Characterization of the grain boundary misorientation from 370 LACBED patterns Xl.3.4.2.1 - Application to the measurement of the misorientation 372 of a S3 - Characterization of the grain boundary plane 376 XI.3.4.2.2 - Subgrain boundaries 376 Xl.3.4.2.2 - Near-coincidence grain boundaries 378 XI.3.5- Twins 380 Xl.3.5.1. - Dauphiné twins 380 XI.3.5.2 - Characterization of twin boundaries in ceramic 381 superconductors Xl.3.6 - Characterization of grain boundary dislocations 385 XI .4 - Characterization of crystal defects from bend contour patterns 388 Conclusion 389 References 393 Bibliography 401 Index 426 xii This first volume of the SF\|j monographs is devoted to an important aspect of electron diffraction. Convergent-beam diffraction is capable of furnishing remarkably accurate crystallographic information. In this book, written as a teaching manual, the author goes well beyond a simple presentation of the method. The description of convergent- beam electron diffraction and especially of LACBED, is preceded by several preparatory chapters, in which the principles of diffraction and the nature of electron-matter interactions are clearly set out. An entire chapter is concerned with instrumentation. Another on the interpreta- tion of diffraction patterns enables the reader to master all stages in the process. The monograph ends with a long chapter in which nume- rous applications concerned with the characterization of crystal defects are examined and analysed. The author: Jean Paul Morniroli is a Professor in the Ecole Nationale Supérieure de Chimie of Lille: his research is performed in the Laboratoire de Métallurgie et Génie des Matériaux, UMR CNRS 8517 of the Université des Sciences et Technologies de Lille. He is a specialist in electron diffraction. The translator: Etienne Brès is a Professor in the Université des Sciences et Technologies de Lille; his research is performed in the Laboratoire de Structure et Propriétés de l Etat Solide, UPRESA CNRS 8008 of the same University. He is a specialist in the nanoscale characterization of biological and synthetic nanomaterials. CRC Press Taylor Francis Group an informa business www.crcpress.com ISBN 978-1-138-41418-1 9 781138 414181
any_adam_object	1
author	Morniroli, Jean Paul
author_facet	Morniroli, Jean Paul
author_role	aut
author_sort	Morniroli, Jean Paul
author_variant	j p m jp jpm
building	Verbundindex
bvnumber	BV045152530
classification_rvk	UQ 5500
ctrlnum	(OCoLC)249418472 (DE-599)BVBBV045152530
discipline	Physik
format	Book
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01814nam a2200385 c 4500</leader><controlfield tag="001">BV045152530</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20190508 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">180828s2002 a\|\|\| \|\|\|\| 00\|\|\| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781138414181</subfield><subfield code="9">978-1-138-41418-1</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">2901483054</subfield><subfield code="9">2-901483-05-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)249418472</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045152530</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rda</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 5500</subfield><subfield code="0">(DE-625)146526:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Morniroli, Jean Paul</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Large-angle convergent-beam electron diffraction (LACBED)</subfield><subfield code="b">applications to crystal defects</subfield><subfield code="c">Jean Paul Morniroli</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Paris</subfield><subfield code="b">SFµ</subfield><subfield code="c">[2002]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">[Boca Raton]</subfield><subfield code="b">CRC Press</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xii, 431 Seiten</subfield><subfield code="b">Illustrationen, Diagramme</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Monograph of the French Society of Microscopies</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenbeugung</subfield><subfield code="0">(DE-588)4151862-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Kristallstrukturanalyse</subfield><subfield code="0">(DE-588)4137204-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenbeugung</subfield><subfield code="0">(DE-588)4151862-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Kristallstrukturanalyse</subfield><subfield code="0">(DE-588)4137204-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030542198&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030542198&sequence=000002&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Klappentext</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030542198</subfield></datafield></record></collection>
id	DE-604.BV045152530
illustrated	Illustrated
indexdate	2024-07-10T08:10:08Z
institution	BVB
isbn	9781138414181 2901483054
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-030542198
oclc_num	249418472
open_access_boolean
owner	DE-703
owner_facet	DE-703
physical	xii, 431 Seiten Illustrationen, Diagramme
publishDate	2002
publishDateSearch	2002
publishDateSort	2002
publisher	SFµ CRC Press
record_format	marc
series2	Monograph of the French Society of Microscopies
spelling	Morniroli, Jean Paul Verfasser aut Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects Jean Paul Morniroli Paris SFµ [2002] [Boca Raton] CRC Press xii, 431 Seiten Illustrationen, Diagramme txt rdacontent n rdamedia nc rdacarrier Monograph of the French Society of Microscopies Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Kristallstrukturanalyse (DE-588)4137204-9 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 s Kristallstrukturanalyse (DE-588)4137204-9 s DE-604 Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030542198&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis Digitalisierung UB Bayreuth - ADAM Catalogue Enrichment application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030542198&sequence=000002&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA Klappentext
spellingShingle	Morniroli, Jean Paul Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects Elektronenbeugung (DE-588)4151862-7 gnd Kristallstrukturanalyse (DE-588)4137204-9 gnd
subject_GND	(DE-588)4151862-7 (DE-588)4137204-9
title	Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects
title_auth	Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects
title_exact_search	Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects
title_full	Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects Jean Paul Morniroli
title_fullStr	Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects Jean Paul Morniroli
title_full_unstemmed	Large-angle convergent-beam electron diffraction (LACBED) applications to crystal defects Jean Paul Morniroli
title_short	Large-angle convergent-beam electron diffraction (LACBED)
title_sort	large angle convergent beam electron diffraction lacbed applications to crystal defects
title_sub	applications to crystal defects
topic	Elektronenbeugung (DE-588)4151862-7 gnd Kristallstrukturanalyse (DE-588)4137204-9 gnd
topic_facet	Elektronenbeugung Kristallstrukturanalyse
url	http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030542198&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030542198&sequence=000002&line_number=0002&func_code=DB_RECORDS&service_type=MEDIA
work_keys_str_mv	AT mornirolijeanpaul largeangleconvergentbeamelectrondiffractionlacbedapplicationstocrystaldefects

Verfügbarkeit

Es ist kein Print-Exemplar vorhanden.

Fernleihe Bestellen Achtung: Nicht im THWS-Bestand! Inhaltsverzeichnis

MARC

Datensatz im Suchindex

Es ist kein Print-Exemplar vorhanden.

Ähnliche Einträge