High-Resolution Imaging and Spectrometry of Materials:
This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from rese...
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2003
|
| Schriftenreihe: | Springer Series in Materials Science
50 |
| Schlagworte: | |
| Online-Zugang: | UBT01 Volltext |
| Zusammenfassung: | This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students |
| Beschreibung: | 1 Online-Ressource (XIV, 442 p) |
| ISBN: | 9783662077665 |
| DOI: | 10.1007/978-3-662-07766-5 |
Internformat
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| 520 | |a This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students | ||
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| id | DE-604.BV045152149 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:07Z |
| institution | BVB |
| isbn | 9783662077665 |
| language | English |
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| physical | 1 Online-Ressource (XIV, 442 p) |
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| publishDate | 2003 |
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| publisher | Springer Berlin Heidelberg |
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| series2 | Springer Series in Materials Science |
| spelling | High-Resolution Imaging and Spectrometry of Materials edited by Frank Ernst, Manfred Rühle Berlin, Heidelberg Springer Berlin Heidelberg 2003 1 Online-Ressource (XIV, 442 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Materials Science 50 This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students Materials Science Surfaces and Interfaces, Thin Films Solid State Physics Spectroscopy and Microscopy Characterization and Evaluation of Materials Physical Chemistry Materials science Physical chemistry Solid state physics Spectroscopy Microscopy Materials / Surfaces Thin films Mikrostruktur (DE-588)4131028-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Mikrostruktur (DE-588)4131028-7 s Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s 1\p DE-604 Ernst, Frank edt Rühle, Manfred edt Erscheint auch als Druck-Ausgabe 9783642075254 https://doi.org/10.1007/978-3-662-07766-5 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | High-Resolution Imaging and Spectrometry of Materials Materials Science Surfaces and Interfaces, Thin Films Solid State Physics Spectroscopy and Microscopy Characterization and Evaluation of Materials Physical Chemistry Materials science Physical chemistry Solid state physics Spectroscopy Microscopy Materials / Surfaces Thin films Mikrostruktur (DE-588)4131028-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| subject_GND | (DE-588)4131028-7 (DE-588)4014327-2 (DE-588)4287503-1 |
| title | High-Resolution Imaging and Spectrometry of Materials |
| title_auth | High-Resolution Imaging and Spectrometry of Materials |
| title_exact_search | High-Resolution Imaging and Spectrometry of Materials |
| title_full | High-Resolution Imaging and Spectrometry of Materials edited by Frank Ernst, Manfred Rühle |
| title_fullStr | High-Resolution Imaging and Spectrometry of Materials edited by Frank Ernst, Manfred Rühle |
| title_full_unstemmed | High-Resolution Imaging and Spectrometry of Materials edited by Frank Ernst, Manfred Rühle |
| title_short | High-Resolution Imaging and Spectrometry of Materials |
| title_sort | high resolution imaging and spectrometry of materials |
| topic | Materials Science Surfaces and Interfaces, Thin Films Solid State Physics Spectroscopy and Microscopy Characterization and Evaluation of Materials Physical Chemistry Materials science Physical chemistry Solid state physics Spectroscopy Microscopy Materials / Surfaces Thin films Mikrostruktur (DE-588)4131028-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd |
| topic_facet | Materials Science Surfaces and Interfaces, Thin Films Solid State Physics Spectroscopy and Microscopy Characterization and Evaluation of Materials Physical Chemistry Materials science Physical chemistry Solid state physics Spectroscopy Microscopy Materials / Surfaces Thin films Mikrostruktur Elektronenmikroskopie Hochauflösendes Verfahren |
| url | https://doi.org/10.1007/978-3-662-07766-5 |
| work_keys_str_mv | AT ernstfrank highresolutionimagingandspectrometryofmaterials AT ruhlemanfred highresolutionimagingandspectrometryofmaterials |