Transmission Electron Microscopy and Diffractometry of Materials:
This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of d...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2002
|
| Ausgabe: | Second Edition |
| Schlagworte: | |
| Online-Zugang: | UBT01 Volltext |
| Zusammenfassung: | This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD. |
| Beschreibung: | 1 Online-Ressource (XXI, 748 p) |
| ISBN: | 9783662049013 |
| DOI: | 10.1007/978-3-662-04901-3 |
Internformat
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| 520 | |a This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD. | ||
| 650 | 4 | |a Materials Science | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
| 650 | 4 | |a Solid State Physics | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Crystallography | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Solid state physics | |
| 650 | 4 | |a Crystallography | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Materials / Surfaces | |
| 650 | 4 | |a Thin films | |
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| 700 | 1 | |a Howe, James M. |d 1955- |0 (DE-588)122354818 |4 aut | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9783662049037 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-3-662-04901-3 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
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Datensatz im Suchindex
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| author | Fultz, Brent 1955- Howe, James M. 1955- |
| author_GND | (DE-588)122354796 (DE-588)122354818 |
| author_facet | Fultz, Brent 1955- Howe, James M. 1955- |
| author_role | aut aut |
| author_sort | Fultz, Brent 1955- |
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| building | Verbundindex |
| bvnumber | BV045152117 |
| collection | ZDB-2-CMS |
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| dewey-full | 620.44 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.44 |
| dewey-search | 620.44 |
| dewey-sort | 3620.44 |
| dewey-tens | 620 - Engineering and allied operations |
| doi_str_mv | 10.1007/978-3-662-04901-3 |
| edition | Second Edition |
| format | Electronic eBook |
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| id | DE-604.BV045152117 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:07Z |
| institution | BVB |
| isbn | 9783662049013 |
| language | English |
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| physical | 1 Online-Ressource (XXI, 748 p) |
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| publisher | Springer Berlin Heidelberg |
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| spelling | Fultz, Brent 1955- Verfasser (DE-588)122354796 aut Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe Second Edition Berlin, Heidelberg Springer Berlin Heidelberg 2002 1 Online-Ressource (XXI, 748 p) txt rdacontent c rdamedia cr rdacarrier This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of diffraction patterns. It explains the uniqueness of each technique, especially imaging and spectroscopy in the TEM. Simple citations of rules are avoided as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sections/chapters are sorted according to difficulty and grouped for use in quarter and semester courses on TEM and XRD. Numerous problems are provided at the end of each chapter to reinforce key concepts, and solutions are available to instructors. Appendices provide procedures for introductory laboratory exercises, and up-to-date tabulations of physical data useful for TEM and XRD. Materials Science Surfaces and Interfaces, Thin Films Solid State Physics Spectroscopy and Microscopy Crystallography Characterization and Evaluation of Materials Materials science Solid state physics Spectroscopy Microscopy Materials / Surfaces Thin films Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Röntgendiffraktometrie (DE-588)4336833-5 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Röntgendiffraktometrie (DE-588)4336833-5 s 1\p DE-604 Howe, James M. 1955- (DE-588)122354818 aut Erscheint auch als Druck-Ausgabe 9783662049037 https://doi.org/10.1007/978-3-662-04901-3 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Fultz, Brent 1955- Howe, James M. 1955- Transmission Electron Microscopy and Diffractometry of Materials Materials Science Surfaces and Interfaces, Thin Films Solid State Physics Spectroscopy and Microscopy Crystallography Characterization and Evaluation of Materials Materials science Solid state physics Spectroscopy Microscopy Materials / Surfaces Thin films Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4336833-5 |
| title | Transmission Electron Microscopy and Diffractometry of Materials |
| title_auth | Transmission Electron Microscopy and Diffractometry of Materials |
| title_exact_search | Transmission Electron Microscopy and Diffractometry of Materials |
| title_full | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe |
| title_fullStr | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe |
| title_full_unstemmed | Transmission Electron Microscopy and Diffractometry of Materials by Brent Fultz, James M. Howe |
| title_short | Transmission Electron Microscopy and Diffractometry of Materials |
| title_sort | transmission electron microscopy and diffractometry of materials |
| topic | Materials Science Surfaces and Interfaces, Thin Films Solid State Physics Spectroscopy and Microscopy Crystallography Characterization and Evaluation of Materials Materials science Solid state physics Spectroscopy Microscopy Materials / Surfaces Thin films Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Röntgendiffraktometrie (DE-588)4336833-5 gnd |
| topic_facet | Materials Science Surfaces and Interfaces, Thin Films Solid State Physics Spectroscopy and Microscopy Crystallography Characterization and Evaluation of Materials Materials science Solid state physics Spectroscopy Microscopy Materials / Surfaces Thin films Durchstrahlungselektronenmikroskopie Röntgendiffraktometrie |
| url | https://doi.org/10.1007/978-3-662-04901-3 |
| work_keys_str_mv | AT fultzbrent transmissionelectronmicroscopyanddiffractometryofmaterials AT howejamesm transmissionelectronmicroscopyanddiffractometryofmaterials |