Noncontact Atomic Force Microscopy:
Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resoluti...
Gespeichert in:
| Weitere Verfasser: | , , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2002
|
| Schriftenreihe: | NanoScience and Technology
|
| Schlagworte: | |
| Online-Zugang: | UBT01 Volltext |
| Zusammenfassung: | Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues |
| Beschreibung: | 1 Online-Ressource (XVIII, 440 p) |
| ISBN: | 9783642560194 |
| DOI: | 10.1007/978-3-642-56019-4 |
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| 520 | |a Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues | ||
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| id | DE-604.BV045152047 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:07Z |
| institution | BVB |
| isbn | 9783642560194 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030541715 |
| oclc_num | 1050939137 |
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| owner_facet | DE-703 |
| physical | 1 Online-Ressource (XVIII, 440 p) |
| psigel | ZDB-2-CMS ZDB-2-CMS_2000/2004 ZDB-2-CMS ZDB-2-CMS_2000/2004 |
| publishDate | 2002 |
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| publisher | Springer Berlin Heidelberg |
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| series2 | NanoScience and Technology |
| spelling | Noncontact Atomic Force Microscopy edited by S. Morita, R. Wiesendanger, E. Meyer Berlin, Heidelberg Springer Berlin Heidelberg 2002 1 Online-Ressource (XVIII, 440 p) txt rdacontent c rdamedia cr rdacarrier NanoScience and Technology Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues Materials Science Nanotechnology Surfaces and Interfaces, Thin Films Measurement Science and Instrumentation Characterization and Evaluation of Materials Materials science Physical measurements Measurement Materials / Surfaces Thin films Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 s 1\p DE-604 Morita, S. edt Wiesendanger, R. edt Meyer, E. edt Erscheint auch als Druck-Ausgabe 9783642627729 https://doi.org/10.1007/978-3-642-56019-4 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Noncontact Atomic Force Microscopy Materials Science Nanotechnology Surfaces and Interfaces, Thin Films Measurement Science and Instrumentation Characterization and Evaluation of Materials Materials science Physical measurements Measurement Materials / Surfaces Thin films Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4274473-8 |
| title | Noncontact Atomic Force Microscopy |
| title_auth | Noncontact Atomic Force Microscopy |
| title_exact_search | Noncontact Atomic Force Microscopy |
| title_full | Noncontact Atomic Force Microscopy edited by S. Morita, R. Wiesendanger, E. Meyer |
| title_fullStr | Noncontact Atomic Force Microscopy edited by S. Morita, R. Wiesendanger, E. Meyer |
| title_full_unstemmed | Noncontact Atomic Force Microscopy edited by S. Morita, R. Wiesendanger, E. Meyer |
| title_short | Noncontact Atomic Force Microscopy |
| title_sort | noncontact atomic force microscopy |
| topic | Materials Science Nanotechnology Surfaces and Interfaces, Thin Films Measurement Science and Instrumentation Characterization and Evaluation of Materials Materials science Physical measurements Measurement Materials / Surfaces Thin films Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Materials Science Nanotechnology Surfaces and Interfaces, Thin Films Measurement Science and Instrumentation Characterization and Evaluation of Materials Materials science Physical measurements Measurement Materials / Surfaces Thin films Rasterkraftmikroskopie |
| url | https://doi.org/10.1007/978-3-642-56019-4 |
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