Atom Probe Tomography: Analysis at the Atomic Level
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution thre...
Gespeichert in:
| 1. Verfasser: | |
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| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
2000
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| Ausgabe: | 1 |
| Schlagworte: | |
| Online-Zugang: | UBT01 Volltext |
| Zusammenfassung: | The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included |
| Beschreibung: | 1 Online-Ressource (XV, 239 p) |
| ISBN: | 9781461542810 |
| DOI: | 10.1007/978-1-4615-4281-0 |
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| 520 | |a The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included | ||
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Miller</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">1</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">2000</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XV, 239 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. 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| isbn | 9781461542810 |
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| spelling | Miller, M. K. Verfasser aut Atom Probe Tomography Analysis at the Atomic Level by M. K. Miller 1 Boston, MA Springer US 2000 1 Online-Ressource (XV, 239 p) txt rdacontent c rdamedia cr rdacarrier The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution. Therefore, atom probe tomography provides a technique for acquiring atomic resolution three dimensional images of the solute distribution within the microstructures of materials. This monograph is designed to provide researchers and students the necessary information to plan and experimentally conduct an atom probe tomography experiment. The techniques required to visualize and to analyze the resulting three-dimensional data are also described. The monograph is organized into chapters each covering a specific aspect of the technique. The development of this powerful microanalytical technique from the origins offield ion microscopy in 1951, through the first three-dimensional atom probe prototype built in 1986 to today's commercial state-of-the-art three dimensional atom probe is documented in chapter 1. A general introduction to atom probe tomography is also presented in chapter 1. The various methods to fabricate suitable needle-shaped specimens are presented in chapter 2. The procedure to form field ion images of the needle-shaped specimen is described in chapter 3. In addition, the appearance of microstructural features and the information that may be estimated from field ion microscopy are summarized. A brief account of the theoretical basis for processes of field ionization and field evaporation is also included Materials Science Characterization and Evaluation of Materials Metallic Materials Materials science Metals Erscheint auch als Druck-Ausgabe 9781461369219 https://doi.org/10.1007/978-1-4615-4281-0 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Miller, M. K. Atom Probe Tomography Analysis at the Atomic Level Materials Science Characterization and Evaluation of Materials Metallic Materials Materials science Metals |
| title | Atom Probe Tomography Analysis at the Atomic Level |
| title_auth | Atom Probe Tomography Analysis at the Atomic Level |
| title_exact_search | Atom Probe Tomography Analysis at the Atomic Level |
| title_full | Atom Probe Tomography Analysis at the Atomic Level by M. K. Miller |
| title_fullStr | Atom Probe Tomography Analysis at the Atomic Level by M. K. Miller |
| title_full_unstemmed | Atom Probe Tomography Analysis at the Atomic Level by M. K. Miller |
| title_short | Atom Probe Tomography |
| title_sort | atom probe tomography analysis at the atomic level |
| title_sub | Analysis at the Atomic Level |
| topic | Materials Science Characterization and Evaluation of Materials Metallic Materials Materials science Metals |
| topic_facet | Materials Science Characterization and Evaluation of Materials Metallic Materials Materials science Metals |
| url | https://doi.org/10.1007/978-1-4615-4281-0 |
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