Orloff, J., Utlaut, M., & Swanson, L. (2003). High Resolution Focused Ion Beams: FIB and its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology. Springer US. https://doi.org/10.1007/978-1-4615-0765-9
Chicago-Zitierstil (17. Ausg.)Orloff, Jon, Mark Utlaut, und Lynwood Swanson. High Resolution Focused Ion Beams: FIB and Its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology. Boston, MA: Springer US, 2003. https://doi.org/10.1007/978-1-4615-0765-9.
MLA-Zitierstil (9. Ausg.)Orloff, Jon, et al. High Resolution Focused Ion Beams: FIB and Its Applications: The Physics of Liquid Metal Ion Sources and Ion Optics and Their Application to Focused Ion Beam Technology. Springer US, 2003. https://doi.org/10.1007/978-1-4615-0765-9.