Point Defects in Semiconductors and Insulators: Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions
This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Berlin, Heidelberg
Springer Berlin Heidelberg
2003
|
| Schriftenreihe: | Springer Series in Materials Science
51 |
| Schlagworte: | |
| Online-Zugang: | FHI01 BTU01 URL des Erstveröffentlichers |
| Zusammenfassung: | This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic properties of solids and uncovering correlations between those properties. In addition to EPR such methods include electron nuclear double resonance (ENDOR), electronically and optically detected EPR (the latter is known as ODENDOR), and electronically and optically detected ENDOR. This book comprehensively discusses experimental, technological, and theoretical aspects of these techniques from a practical point of view with many illustrative examples taken from semiconductors and insulators. The non-specialist is informed about the potential of the different methods. A researcher finds practical help in the application of commercial apparatus as well as useful guidance from ab initio theory for the task of deriving structure models from experimental data |
| Beschreibung: | 1 Online-Ressource (XI, 492 p) |
| ISBN: | 9783642556159 |
| DOI: | 10.1007/978-3-642-55615-9 |
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Datensatz im Suchindex
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| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-642-55615-9 |
| format | Electronic eBook |
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| id | DE-604.BV045149298 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:03Z |
| institution | BVB |
| isbn | 9783642556159 |
| language | English |
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| spelling | Spaeth, Johann-Martin Verfasser aut Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions by Johann-Martin Spaeth, Harald Overhof Berlin, Heidelberg Springer Berlin Heidelberg 2003 1 Online-Ressource (XI, 492 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Materials Science 51 This book introduces the principles and techniques of modern electron paramagnetic resonance (EPR) spectroscopy that are essential for applications used to determine microscopic defect structures. Many different magnetic resonance methods are required for investigating the microscopic and electronic properties of solids and uncovering correlations between those properties. In addition to EPR such methods include electron nuclear double resonance (ENDOR), electronically and optically detected EPR (the latter is known as ODENDOR), and electronically and optically detected ENDOR. This book comprehensively discusses experimental, technological, and theoretical aspects of these techniques from a practical point of view with many illustrative examples taken from semiconductors and insulators. The non-specialist is informed about the potential of the different methods. A researcher finds practical help in the application of commercial apparatus as well as useful guidance from ab initio theory for the task of deriving structure models from experimental data Engineering Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Electronics Microelectronics Optical materials Electronic materials Overhof, Harald aut Erscheint auch als Druck-Ausgabe 9783642627224 https://doi.org/10.1007/978-3-642-55615-9 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Spaeth, Johann-Martin Overhof, Harald Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions Engineering Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Electronics Microelectronics Optical materials Electronic materials |
| title | Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions |
| title_auth | Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions |
| title_exact_search | Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions |
| title_full | Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions by Johann-Martin Spaeth, Harald Overhof |
| title_fullStr | Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions by Johann-Martin Spaeth, Harald Overhof |
| title_full_unstemmed | Point Defects in Semiconductors and Insulators Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions by Johann-Martin Spaeth, Harald Overhof |
| title_short | Point Defects in Semiconductors and Insulators |
| title_sort | point defects in semiconductors and insulators determination of atomic and electronic structure from paramagnetic hyperfine interactions |
| title_sub | Determination of Atomic and Electronic Structure from Paramagnetic Hyperfine Interactions |
| topic | Engineering Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Electronics Microelectronics Optical materials Electronic materials |
| topic_facet | Engineering Electronics and Microelectronics, Instrumentation Optical and Electronic Materials Electronics Microelectronics Optical materials Electronic materials |
| url | https://doi.org/10.1007/978-3-642-55615-9 |
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