APA (7th ed.) Citation

Hamdioui, S. (2004). Testing Static Random Access Memories: Defects, Fault Models and Test Patterns. Springer US. https://doi.org/10.1007/978-1-4757-6706-3

Chicago Style (17th ed.) Citation

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns. Boston, MA: Springer US, 2004. https://doi.org/10.1007/978-1-4757-6706-3.

MLA (9th ed.) Citation

Hamdioui, Said. Testing Static Random Access Memories: Defects, Fault Models and Test Patterns. Springer US, 2004. https://doi.org/10.1007/978-1-4757-6706-3.