Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
2004
|
| Schriftenreihe: | Frontiers in Electronic Testing
26 |
| Schlagworte: | |
| Online-Zugang: | FHI01 BTU01 Volltext |
| Zusammenfassung: | Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing |
| Beschreibung: | 1 Online-Ressource (XX, 221 p) |
| ISBN: | 9781475767063 |
| DOI: | 10.1007/978-1-4757-6706-3 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV045149076 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180827s2004 |||| o||u| ||||||eng d | ||
| 020 | |a 9781475767063 |9 978-1-4757-6706-3 | ||
| 024 | 7 | |a 10.1007/978-1-4757-6706-3 |2 doi | |
| 035 | |a (ZDB-2-ENG)978-1-4757-6706-3 | ||
| 035 | |a (OCoLC)1050951677 | ||
| 035 | |a (DE-599)BVBBV045149076 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-573 |a DE-634 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 100 | 1 | |a Hamdioui, Said |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Testing Static Random Access Memories |b Defects, Fault Models and Test Patterns |c by Said Hamdioui |
| 264 | 1 | |a Boston, MA |b Springer US |c 2004 | |
| 300 | |a 1 Online-Ressource (XX, 221 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in Electronic Testing |v 26 | |
| 520 | |a Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing | ||
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Circuits and Systems | |
| 650 | 4 | |a Electrical Engineering | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Optical and Electronic Materials | |
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Electrical engineering | |
| 650 | 4 | |a Electronic circuits | |
| 650 | 4 | |a Optical materials | |
| 650 | 4 | |a Electronic materials | |
| 650 | 4 | |a Materials science | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781441954305 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4757-6706-3 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 940 | 1 | |q ZDB-2-ENG_2000/2004 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030538775 | ||
| 966 | e | |u https://doi.org/10.1007/978-1-4757-6706-3 |l FHI01 |p ZDB-2-ENG |q ZDB-2-ENG_2000/2004 |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-1-4757-6706-3 |l BTU01 |p ZDB-2-ENG |q ZDB-2-ENG_Archiv |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804178820164485120 |
|---|---|
| any_adam_object | |
| author | Hamdioui, Said |
| author_facet | Hamdioui, Said |
| author_role | aut |
| author_sort | Hamdioui, Said |
| author_variant | s h sh |
| building | Verbundindex |
| bvnumber | BV045149076 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)978-1-4757-6706-3 (OCoLC)1050951677 (DE-599)BVBBV045149076 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-1-4757-6706-3 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>03045nmm a2200517zcb4500</leader><controlfield tag="001">BV045149076</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180827s2004 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781475767063</subfield><subfield code="9">978-1-4757-6706-3</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4757-6706-3</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)978-1-4757-6706-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1050951677</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045149076</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-573</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Hamdioui, Said</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Testing Static Random Access Memories</subfield><subfield code="b">Defects, Fault Models and Test Patterns</subfield><subfield code="c">by Said Hamdioui</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">2004</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XX, 221 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">26</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Characterization and Evaluation of Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical and Electronic Materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Optical materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic materials</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Materials science</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781441954305</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4757-6706-3</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2000/2004</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030538775</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4757-6706-3</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_2000/2004</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4757-6706-3</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_Archiv</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV045149076 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:02Z |
| institution | BVB |
| isbn | 9781475767063 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030538775 |
| oclc_num | 1050951677 |
| open_access_boolean | |
| owner | DE-573 DE-634 |
| owner_facet | DE-573 DE-634 |
| physical | 1 Online-Ressource (XX, 221 p) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_Archiv |
| publishDate | 2004 |
| publishDateSearch | 2004 |
| publishDateSort | 2004 |
| publisher | Springer US |
| record_format | marc |
| series2 | Frontiers in Electronic Testing |
| spelling | Hamdioui, Said Verfasser aut Testing Static Random Access Memories Defects, Fault Models and Test Patterns by Said Hamdioui Boston, MA Springer US 2004 1 Online-Ressource (XX, 221 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 26 Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing Engineering Circuits and Systems Electrical Engineering Characterization and Evaluation of Materials Optical and Electronic Materials Electrical engineering Electronic circuits Optical materials Electronic materials Materials science Erscheint auch als Druck-Ausgabe 9781441954305 https://doi.org/10.1007/978-1-4757-6706-3 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Hamdioui, Said Testing Static Random Access Memories Defects, Fault Models and Test Patterns Engineering Circuits and Systems Electrical Engineering Characterization and Evaluation of Materials Optical and Electronic Materials Electrical engineering Electronic circuits Optical materials Electronic materials Materials science |
| title | Testing Static Random Access Memories Defects, Fault Models and Test Patterns |
| title_auth | Testing Static Random Access Memories Defects, Fault Models and Test Patterns |
| title_exact_search | Testing Static Random Access Memories Defects, Fault Models and Test Patterns |
| title_full | Testing Static Random Access Memories Defects, Fault Models and Test Patterns by Said Hamdioui |
| title_fullStr | Testing Static Random Access Memories Defects, Fault Models and Test Patterns by Said Hamdioui |
| title_full_unstemmed | Testing Static Random Access Memories Defects, Fault Models and Test Patterns by Said Hamdioui |
| title_short | Testing Static Random Access Memories |
| title_sort | testing static random access memories defects fault models and test patterns |
| title_sub | Defects, Fault Models and Test Patterns |
| topic | Engineering Circuits and Systems Electrical Engineering Characterization and Evaluation of Materials Optical and Electronic Materials Electrical engineering Electronic circuits Optical materials Electronic materials Materials science |
| topic_facet | Engineering Circuits and Systems Electrical Engineering Characterization and Evaluation of Materials Optical and Electronic Materials Electrical engineering Electronic circuits Optical materials Electronic materials Materials science |
| url | https://doi.org/10.1007/978-1-4757-6706-3 |
| work_keys_str_mv | AT hamdiouisaid testingstaticrandomaccessmemoriesdefectsfaultmodelsandtestpatterns |