SOC (System-on-a-Chip) Testing for Plug and Play Test Automation:
System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially...
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
2002
|
| Schriftenreihe: | Frontiers in Electronic Testing
21 |
| Schlagworte: | |
| Online-Zugang: | FHI01 BTU01 URL des Erstveröffentlichers |
| Zusammenfassung: | System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing |
| Beschreibung: | 1 Online-Ressource (VIII, 200 p) |
| ISBN: | 9781475765274 |
| DOI: | 10.1007/978-1-4757-6527-4 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV045149072 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180827s2002 |||| o||u| ||||||eng d | ||
| 020 | |a 9781475765274 |9 978-1-4757-6527-4 | ||
| 024 | 7 | |a 10.1007/978-1-4757-6527-4 |2 doi | |
| 035 | |a (ZDB-2-ENG)978-1-4757-6527-4 | ||
| 035 | |a (OCoLC)1050951752 | ||
| 035 | |a (DE-599)BVBBV045149072 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-573 |a DE-634 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 245 | 1 | 0 | |a SOC (System-on-a-Chip) Testing for Plug and Play Test Automation |c edited by Krishnendu Chakrabarty |
| 264 | 1 | |a Boston, MA |b Springer US |c 2002 | |
| 300 | |a 1 Online-Ressource (VIII, 200 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in Electronic Testing |v 21 | |
| 520 | |a System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing | ||
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Circuits and Systems | |
| 650 | 4 | |a Electrical Engineering | |
| 650 | 4 | |a Computer-Aided Engineering (CAD, CAE) and Design | |
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Computer-aided engineering | |
| 650 | 4 | |a Electrical engineering | |
| 650 | 4 | |a Electronic circuits | |
| 700 | 1 | |a Chakrabarty, Krishnendu |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781441953070 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/978-1-4757-6527-4 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 940 | 1 | |q ZDB-2-ENG_2000/2004 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030538771 | ||
| 966 | e | |u https://doi.org/10.1007/978-1-4757-6527-4 |l FHI01 |p ZDB-2-ENG |q ZDB-2-ENG_2000/2004 |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/978-1-4757-6527-4 |l BTU01 |p ZDB-2-ENG |q ZDB-2-ENG_Archiv |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804178820160290816 |
|---|---|
| any_adam_object | |
| author2 | Chakrabarty, Krishnendu |
| author2_role | edt |
| author2_variant | k c kc |
| author_facet | Chakrabarty, Krishnendu |
| building | Verbundindex |
| bvnumber | BV045149072 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)978-1-4757-6527-4 (OCoLC)1050951752 (DE-599)BVBBV045149072 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-1-4757-6527-4 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02617nmm a2200481zcb4500</leader><controlfield tag="001">BV045149072</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180827s2002 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781475765274</subfield><subfield code="9">978-1-4757-6527-4</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/978-1-4757-6527-4</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)978-1-4757-6527-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1050951752</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045149072</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-573</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">SOC (System-on-a-Chip) Testing for Plug and Play Test Automation</subfield><subfield code="c">edited by Krishnendu Chakrabarty</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">2002</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (VIII, 200 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">21</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-Aided Engineering (CAD, CAE) and Design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-aided engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chakrabarty, Krishnendu</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781441953070</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/978-1-4757-6527-4</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2000/2004</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030538771</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4757-6527-4</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_2000/2004</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/978-1-4757-6527-4</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_Archiv</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV045149072 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:02Z |
| institution | BVB |
| isbn | 9781475765274 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030538771 |
| oclc_num | 1050951752 |
| open_access_boolean | |
| owner | DE-573 DE-634 |
| owner_facet | DE-573 DE-634 |
| physical | 1 Online-Ressource (VIII, 200 p) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_Archiv |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | Springer US |
| record_format | marc |
| series2 | Frontiers in Electronic Testing |
| spelling | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation edited by Krishnendu Chakrabarty Boston, MA Springer US 2002 1 Online-Ressource (VIII, 200 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 21 System-on-a-Chip (SOC) integrated circuits composed of embedded cores are now commonplace. Nevertheless, there remain several roadblocks to rapid and efficient system integration. Test development is seen as a major bottleneck in SOC design and manufacturing capabilities. Testing SOCs is especially challenging in the absence of standardized test structures, test automation tools, and test protocols. In addition, long interconnects, high density, and high-speed designs lead to new types of faults involving crosstalk and signal integrity. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is an edited work containing thirteen contributions that address various aspects of SOC testing. SOC (System-on-a-Chip) Testing for Plug and Play Test Automation is a valuable reference for researchers and students interested in various aspects of SOC testing Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits Chakrabarty, Krishnendu edt Erscheint auch als Druck-Ausgabe 9781441953070 https://doi.org/10.1007/978-1-4757-6527-4 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits |
| title | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation |
| title_auth | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation |
| title_exact_search | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation |
| title_full | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation edited by Krishnendu Chakrabarty |
| title_fullStr | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation edited by Krishnendu Chakrabarty |
| title_full_unstemmed | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation edited by Krishnendu Chakrabarty |
| title_short | SOC (System-on-a-Chip) Testing for Plug and Play Test Automation |
| title_sort | soc system on a chip testing for plug and play test automation |
| topic | Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits |
| topic_facet | Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits |
| url | https://doi.org/10.1007/978-1-4757-6527-4 |
| work_keys_str_mv | AT chakrabartykrishnendu socsystemonachiptestingforplugandplaytestautomation |