Device and Circuit Cryogenic Operation for Low Temperature Electronics:
Device and Circuit Cryogenic Operation for Low Temperature Electronics is a first in reviewing the performance and physical mechanisms of advanced devices and circuits at cryogenic temperatures that can be used for many applications. The first two chapters cover bulk silicon and SOI MOSFETs. The ele...
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Weitere Verfasser: | , |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Boston, MA
Springer US
2001
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Schlagworte: | |
Online-Zugang: | FHI01 BTU01 Volltext |
Zusammenfassung: | Device and Circuit Cryogenic Operation for Low Temperature Electronics is a first in reviewing the performance and physical mechanisms of advanced devices and circuits at cryogenic temperatures that can be used for many applications. The first two chapters cover bulk silicon and SOI MOSFETs. The electronic transport in the inversion layer, the influence of impurity freeze-out, the special electrical properties of SOI structures, the device reliability and the interest of a low temperature operation for the ultimate integration of silicon down to nanometer dimensions are described. The next two chapters deal with Silicon-Germanium and III-V Heterojunction Bipolar Transistors, as well as III-V High Electron Mobility Transistors (HEMT). The basic physics of the SiGe HBT and its unique cryogenic capabilities, the optimization of such bipolar devices, and the performance of SiGe HBT BiCMOS technology at liquid nitrogen temperature are examined. The physical effects in III-V semiconductors at low temperature, the HEMT and HBT static, high frequency and noise properties, and the comparison of various cooled III-V devices are also addressed. The next chapter treats quantum effect devices made of silicon materials. The major quantum effects at low temperature, quantum wires, quantum dots as well as single electron devices and applications are investigated. The last chapter overviews the performances of cryogenic circuits and their applications. The low temperature properties and performance of inverters, multipliers, adders, operational amplifiers, memories, microprocessors, imaging devices, circuits and systems, sensors and read-out circuits are analyzed. Device and Circuit Cryogenic Operation for Low Temperature Electronics is useful for researchers, engineers, Ph.D. and M.S. students working in the field of advanced electron devices and circuits, new semiconductor materials, and low temperature electronics and physics |
Beschreibung: | 1 Online-Ressource (VIII, 262 p) |
ISBN: | 9781475733181 |
DOI: | 10.1007/978-1-4757-3318-1 |
Internformat
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520 | |a Device and Circuit Cryogenic Operation for Low Temperature Electronics is a first in reviewing the performance and physical mechanisms of advanced devices and circuits at cryogenic temperatures that can be used for many applications. The first two chapters cover bulk silicon and SOI MOSFETs. The electronic transport in the inversion layer, the influence of impurity freeze-out, the special electrical properties of SOI structures, the device reliability and the interest of a low temperature operation for the ultimate integration of silicon down to nanometer dimensions are described. The next two chapters deal with Silicon-Germanium and III-V Heterojunction Bipolar Transistors, as well as III-V High Electron Mobility Transistors (HEMT). The basic physics of the SiGe HBT and its unique cryogenic capabilities, the optimization of such bipolar devices, and the performance of SiGe HBT BiCMOS technology at liquid nitrogen temperature are examined. The physical effects in III-V semiconductors at low temperature, the HEMT and HBT static, high frequency and noise properties, and the comparison of various cooled III-V devices are also addressed. The next chapter treats quantum effect devices made of silicon materials. The major quantum effects at low temperature, quantum wires, quantum dots as well as single electron devices and applications are investigated. The last chapter overviews the performances of cryogenic circuits and their applications. The low temperature properties and performance of inverters, multipliers, adders, operational amplifiers, memories, microprocessors, imaging devices, circuits and systems, sensors and read-out circuits are analyzed. Device and Circuit Cryogenic Operation for Low Temperature Electronics is useful for researchers, engineers, Ph.D. and M.S. students working in the field of advanced electron devices and circuits, new semiconductor materials, and low temperature electronics and physics | ||
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Datensatz im Suchindex
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any_adam_object | |
author2 | Balestra, Francis Ghibaudo, Gérard |
author2_role | edt edt |
author2_variant | f b fb g g gg |
author_facet | Balestra, Francis Ghibaudo, Gérard |
building | Verbundindex |
bvnumber | BV045149005 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)978-1-4757-3318-1 (OCoLC)1184481725 (DE-599)BVBBV045149005 |
dewey-full | 621.381 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381 |
dewey-search | 621.381 |
dewey-sort | 3621.381 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/978-1-4757-3318-1 |
format | Electronic eBook |
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id | DE-604.BV045149005 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:10:02Z |
institution | BVB |
isbn | 9781475733181 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030538704 |
oclc_num | 1184481725 |
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owner | DE-573 DE-634 |
owner_facet | DE-573 DE-634 |
physical | 1 Online-Ressource (VIII, 262 p) |
psigel | ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_Archiv |
publishDate | 2001 |
publishDateSearch | 2001 |
publishDateSort | 2001 |
publisher | Springer US |
record_format | marc |
spelling | Device and Circuit Cryogenic Operation for Low Temperature Electronics edited by Francis Balestra, Gérard Ghibaudo Boston, MA Springer US 2001 1 Online-Ressource (VIII, 262 p) txt rdacontent c rdamedia cr rdacarrier Device and Circuit Cryogenic Operation for Low Temperature Electronics is a first in reviewing the performance and physical mechanisms of advanced devices and circuits at cryogenic temperatures that can be used for many applications. The first two chapters cover bulk silicon and SOI MOSFETs. The electronic transport in the inversion layer, the influence of impurity freeze-out, the special electrical properties of SOI structures, the device reliability and the interest of a low temperature operation for the ultimate integration of silicon down to nanometer dimensions are described. The next two chapters deal with Silicon-Germanium and III-V Heterojunction Bipolar Transistors, as well as III-V High Electron Mobility Transistors (HEMT). The basic physics of the SiGe HBT and its unique cryogenic capabilities, the optimization of such bipolar devices, and the performance of SiGe HBT BiCMOS technology at liquid nitrogen temperature are examined. The physical effects in III-V semiconductors at low temperature, the HEMT and HBT static, high frequency and noise properties, and the comparison of various cooled III-V devices are also addressed. The next chapter treats quantum effect devices made of silicon materials. The major quantum effects at low temperature, quantum wires, quantum dots as well as single electron devices and applications are investigated. The last chapter overviews the performances of cryogenic circuits and their applications. The low temperature properties and performance of inverters, multipliers, adders, operational amplifiers, memories, microprocessors, imaging devices, circuits and systems, sensors and read-out circuits are analyzed. Device and Circuit Cryogenic Operation for Low Temperature Electronics is useful for researchers, engineers, Ph.D. and M.S. students working in the field of advanced electron devices and circuits, new semiconductor materials, and low temperature electronics and physics Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Characterization and Evaluation of Materials Optical and Electronic Materials Electrical engineering Electronics Microelectronics Electronic circuits Optical materials Electronic materials Materials science Elektronisches Bauelement (DE-588)4014360-0 gnd rswk-swf Tieftemperaturverhalten (DE-588)4232597-3 gnd rswk-swf Elektronisches Bauelement (DE-588)4014360-0 s Tieftemperaturverhalten (DE-588)4232597-3 s 1\p DE-604 Balestra, Francis edt Ghibaudo, Gérard edt Erscheint auch als Druck-Ausgabe 9781441948984 https://doi.org/10.1007/978-1-4757-3318-1 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Device and Circuit Cryogenic Operation for Low Temperature Electronics Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Characterization and Evaluation of Materials Optical and Electronic Materials Electrical engineering Electronics Microelectronics Electronic circuits Optical materials Electronic materials Materials science Elektronisches Bauelement (DE-588)4014360-0 gnd Tieftemperaturverhalten (DE-588)4232597-3 gnd |
subject_GND | (DE-588)4014360-0 (DE-588)4232597-3 |
title | Device and Circuit Cryogenic Operation for Low Temperature Electronics |
title_auth | Device and Circuit Cryogenic Operation for Low Temperature Electronics |
title_exact_search | Device and Circuit Cryogenic Operation for Low Temperature Electronics |
title_full | Device and Circuit Cryogenic Operation for Low Temperature Electronics edited by Francis Balestra, Gérard Ghibaudo |
title_fullStr | Device and Circuit Cryogenic Operation for Low Temperature Electronics edited by Francis Balestra, Gérard Ghibaudo |
title_full_unstemmed | Device and Circuit Cryogenic Operation for Low Temperature Electronics edited by Francis Balestra, Gérard Ghibaudo |
title_short | Device and Circuit Cryogenic Operation for Low Temperature Electronics |
title_sort | device and circuit cryogenic operation for low temperature electronics |
topic | Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Characterization and Evaluation of Materials Optical and Electronic Materials Electrical engineering Electronics Microelectronics Electronic circuits Optical materials Electronic materials Materials science Elektronisches Bauelement (DE-588)4014360-0 gnd Tieftemperaturverhalten (DE-588)4232597-3 gnd |
topic_facet | Engineering Electronics and Microelectronics, Instrumentation Circuits and Systems Electrical Engineering Characterization and Evaluation of Materials Optical and Electronic Materials Electrical engineering Electronics Microelectronics Electronic circuits Optical materials Electronic materials Materials science Elektronisches Bauelement Tieftemperaturverhalten |
url | https://doi.org/10.1007/978-1-4757-3318-1 |
work_keys_str_mv | AT balestrafrancis deviceandcircuitcryogenicoperationforlowtemperatureelectronics AT ghibaudogerard deviceandcircuitcryogenicoperationforlowtemperatureelectronics |