Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation:
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will...
Gespeichert in:
Weitere Verfasser: | , |
---|---|
Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
Boston, MA
Springer US
2003
|
Schriftenreihe: | Frontiers in Electronic Testing
23 |
Schlagworte: | |
Online-Zugang: | BTU01 FHI01 Volltext |
Zusammenfassung: | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance |
Beschreibung: | 1 Online-Ressource (XIV, 241 p) |
ISBN: | 9780306487118 |
DOI: | 10.1007/b105828 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV045148577 | ||
003 | DE-604 | ||
005 | 20200414 | ||
007 | cr|uuu---uuuuu | ||
008 | 180827s2003 |||| o||u| ||||||eng d | ||
020 | |a 9780306487118 |9 978-0-306-48711-8 | ||
024 | 7 | |a 10.1007/b105828 |2 doi | |
035 | |a (ZDB-2-ENG)978-0-306-48711-8 | ||
035 | |a (OCoLC)1050948633 | ||
035 | |a (DE-599)BVBBV045148577 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
049 | |a DE-573 |a DE-634 | ||
082 | 0 | |a 621.381 |2 23 | |
084 | |a ST 153 |0 (DE-625)143597: |2 rvk | ||
245 | 1 | 0 | |a Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation |c edited by Alfredo Benso, Paolo Prinetto |
264 | 1 | |a Boston, MA |b Springer US |c 2003 | |
300 | |a 1 Online-Ressource (XIV, 241 p) | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Frontiers in Electronic Testing |v 23 | |
520 | |a Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance | ||
650 | 4 | |a Engineering | |
650 | 4 | |a Electronics and Microelectronics, Instrumentation | |
650 | 4 | |a Engineering, general | |
650 | 4 | |a Circuits and Systems | |
650 | 4 | |a Electrical Engineering | |
650 | 4 | |a Computer-Aided Engineering (CAD, CAE) and Design | |
650 | 4 | |a Systems Theory, Control | |
650 | 4 | |a Engineering | |
650 | 4 | |a Computer-aided engineering | |
650 | 4 | |a System theory | |
650 | 4 | |a Electrical engineering | |
650 | 4 | |a Electronics | |
650 | 4 | |a Microelectronics | |
650 | 4 | |a Electronic circuits | |
650 | 0 | 7 | |a Eingebettetes System |0 (DE-588)4396978-1 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Reliabilität |0 (DE-588)4213628-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Fehlersuche |0 (DE-588)4016615-6 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Eingebettetes System |0 (DE-588)4396978-1 |D s |
689 | 0 | 1 | |a Fehlersuche |0 (DE-588)4016615-6 |D s |
689 | 0 | 2 | |a Reliabilität |0 (DE-588)4213628-3 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
700 | 1 | |a Benso, Alfredo |4 edt | |
700 | 1 | |a Prinetto, Paolo |4 edt | |
776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781402075896 |
856 | 4 | 0 | |u https://doi.org/10.1007/b105828 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
912 | |a ZDB-2-ENG | ||
940 | 1 | |q ZDB-2-ENG_2000/2004 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-030538276 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
966 | e | |u https://doi.org/10.1007/b105828 |l BTU01 |p ZDB-2-ENG |q ZDB-2-ENG_Archiv |x Verlag |3 Volltext | |
966 | e | |u https://doi.org/10.1007/b105828 |l FHI01 |p ZDB-2-ENG |q ZDB-2-ENG_2000/2004 |x Verlag |3 Volltext |
Datensatz im Suchindex
_version_ | 1804178818746810368 |
---|---|
any_adam_object | |
author2 | Benso, Alfredo Prinetto, Paolo |
author2_role | edt edt |
author2_variant | a b ab p p pp |
author_facet | Benso, Alfredo Prinetto, Paolo |
building | Verbundindex |
bvnumber | BV045148577 |
classification_rvk | ST 153 |
collection | ZDB-2-ENG |
ctrlnum | (ZDB-2-ENG)978-0-306-48711-8 (OCoLC)1050948633 (DE-599)BVBBV045148577 |
dewey-full | 621.381 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381 |
dewey-search | 621.381 |
dewey-sort | 3621.381 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
doi_str_mv | 10.1007/b105828 |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02896nmm a2200673zcb4500</leader><controlfield tag="001">BV045148577</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20200414 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180827s2003 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780306487118</subfield><subfield code="9">978-0-306-48711-8</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/b105828</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)978-0-306-48711-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1050948633</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045148577</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-573</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 153</subfield><subfield code="0">(DE-625)143597:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation</subfield><subfield code="c">edited by Alfredo Benso, Paolo Prinetto</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIV, 241 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">23</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics and Microelectronics, Instrumentation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering, general</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-Aided Engineering (CAD, CAE) and Design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Systems Theory, Control</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-aided engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">System theory</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Eingebettetes System</subfield><subfield code="0">(DE-588)4396978-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Reliabilität</subfield><subfield code="0">(DE-588)4213628-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlersuche</subfield><subfield code="0">(DE-588)4016615-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Eingebettetes System</subfield><subfield code="0">(DE-588)4396978-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Fehlersuche</subfield><subfield code="0">(DE-588)4016615-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Reliabilität</subfield><subfield code="0">(DE-588)4213628-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Benso, Alfredo</subfield><subfield code="4">edt</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Prinetto, Paolo</subfield><subfield code="4">edt</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781402075896</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/b105828</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2000/2004</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030538276</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/b105828</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_Archiv</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/b105828</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_2000/2004</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
id | DE-604.BV045148577 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:10:01Z |
institution | BVB |
isbn | 9780306487118 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030538276 |
oclc_num | 1050948633 |
open_access_boolean | |
owner | DE-573 DE-634 |
owner_facet | DE-573 DE-634 |
physical | 1 Online-Ressource (XIV, 241 p) |
psigel | ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_Archiv ZDB-2-ENG ZDB-2-ENG_2000/2004 |
publishDate | 2003 |
publishDateSearch | 2003 |
publishDateSort | 2003 |
publisher | Springer US |
record_format | marc |
series2 | Frontiers in Electronic Testing |
spelling | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation edited by Alfredo Benso, Paolo Prinetto Boston, MA Springer US 2003 1 Online-Ressource (XIV, 241 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 23 Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance Engineering Electronics and Microelectronics, Instrumentation Engineering, general Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Systems Theory, Control Computer-aided engineering System theory Electrical engineering Electronics Microelectronics Electronic circuits Eingebettetes System (DE-588)4396978-1 gnd rswk-swf Reliabilität (DE-588)4213628-3 gnd rswk-swf Fehlersuche (DE-588)4016615-6 gnd rswk-swf Eingebettetes System (DE-588)4396978-1 s Fehlersuche (DE-588)4016615-6 s Reliabilität (DE-588)4213628-3 s 1\p DE-604 Benso, Alfredo edt Prinetto, Paolo edt Erscheint auch als Druck-Ausgabe 9781402075896 https://doi.org/10.1007/b105828 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation Engineering Electronics and Microelectronics, Instrumentation Engineering, general Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Systems Theory, Control Computer-aided engineering System theory Electrical engineering Electronics Microelectronics Electronic circuits Eingebettetes System (DE-588)4396978-1 gnd Reliabilität (DE-588)4213628-3 gnd Fehlersuche (DE-588)4016615-6 gnd |
subject_GND | (DE-588)4396978-1 (DE-588)4213628-3 (DE-588)4016615-6 |
title | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation |
title_auth | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation |
title_exact_search | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation |
title_full | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation edited by Alfredo Benso, Paolo Prinetto |
title_fullStr | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation edited by Alfredo Benso, Paolo Prinetto |
title_full_unstemmed | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation edited by Alfredo Benso, Paolo Prinetto |
title_short | Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation |
title_sort | fault injection techniques and tools for embedded systems reliability evaluation |
topic | Engineering Electronics and Microelectronics, Instrumentation Engineering, general Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Systems Theory, Control Computer-aided engineering System theory Electrical engineering Electronics Microelectronics Electronic circuits Eingebettetes System (DE-588)4396978-1 gnd Reliabilität (DE-588)4213628-3 gnd Fehlersuche (DE-588)4016615-6 gnd |
topic_facet | Engineering Electronics and Microelectronics, Instrumentation Engineering, general Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Systems Theory, Control Computer-aided engineering System theory Electrical engineering Electronics Microelectronics Electronic circuits Eingebettetes System Reliabilität Fehlersuche |
url | https://doi.org/10.1007/b105828 |
work_keys_str_mv | AT bensoalfredo faultinjectiontechniquesandtoolsforembeddedsystemsreliabilityevaluation AT prinettopaolo faultinjectiontechniquesandtoolsforembeddedsystemsreliabilityevaluation |