Adams, R. D. (2003). High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test. Springer US. https://doi.org/10.1007/b101876
Chicago-Zitierstil (17. Ausg.)Adams, R. Dean. High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test. Boston, MA: Springer US, 2003. https://doi.org/10.1007/b101876.
MLA-Zitierstil (9. Ausg.)Adams, R. Dean. High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test. Springer US, 2003. https://doi.org/10.1007/b101876.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.