High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test:
Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and te...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
2003
|
| Schriftenreihe: | Frontiers in Electronic Testing
22A |
| Schlagworte: | |
| Online-Zugang: | FHI01 BTU01 Volltext |
| Zusammenfassung: | Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested |
| Beschreibung: | 1 Online-Ressource (XIV, 250 p) |
| ISBN: | 9780306479724 |
| DOI: | 10.1007/b101876 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV045148526 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180827s2003 |||| o||u| ||||||eng d | ||
| 020 | |a 9780306479724 |9 978-0-306-47972-4 | ||
| 024 | 7 | |a 10.1007/b101876 |2 doi | |
| 035 | |a (ZDB-2-ENG)978-0-306-47972-4 | ||
| 035 | |a (OCoLC)1050934343 | ||
| 035 | |a (DE-599)BVBBV045148526 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-573 |a DE-634 | ||
| 082 | 0 | |a 621.3815 |2 23 | |
| 084 | |a ST 175 |0 (DE-625)143603: |2 rvk | ||
| 100 | 1 | |a Adams, R. Dean |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test |c by R. Dean Adams |
| 264 | 1 | |a Boston, MA |b Springer US |c 2003 | |
| 300 | |a 1 Online-Ressource (XIV, 250 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in Electronic Testing |v 22A | |
| 520 | |a Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested | ||
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Circuits and Systems | |
| 650 | 4 | |a Electrical Engineering | |
| 650 | 4 | |a Computer-Aided Engineering (CAD, CAE) and Design | |
| 650 | 4 | |a Engineering | |
| 650 | 4 | |a Computer-aided engineering | |
| 650 | 4 | |a Electrical engineering | |
| 650 | 4 | |a Electronic circuits | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 9781402072550 |
| 856 | 4 | 0 | |u https://doi.org/10.1007/b101876 |x Verlag |z URL des Erstveröffentlichers |3 Volltext |
| 912 | |a ZDB-2-ENG | ||
| 940 | 1 | |q ZDB-2-ENG_2000/2004 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030538225 | ||
| 966 | e | |u https://doi.org/10.1007/b101876 |l FHI01 |p ZDB-2-ENG |q ZDB-2-ENG_2000/2004 |x Verlag |3 Volltext | |
| 966 | e | |u https://doi.org/10.1007/b101876 |l BTU01 |p ZDB-2-ENG |q ZDB-2-ENG_Archiv |x Verlag |3 Volltext | |
Datensatz im Suchindex
| _version_ | 1804178818603155456 |
|---|---|
| any_adam_object | |
| author | Adams, R. Dean |
| author_facet | Adams, R. Dean |
| author_role | aut |
| author_sort | Adams, R. Dean |
| author_variant | r d a rd rda |
| building | Verbundindex |
| bvnumber | BV045148526 |
| classification_rvk | ST 175 |
| collection | ZDB-2-ENG |
| ctrlnum | (ZDB-2-ENG)978-0-306-47972-4 (OCoLC)1050934343 (DE-599)BVBBV045148526 |
| dewey-full | 621.3815 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815 |
| dewey-search | 621.3815 |
| dewey-sort | 3621.3815 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Informatik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/b101876 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02497nmm a2200493zcb4500</leader><controlfield tag="001">BV045148526</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180827s2003 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780306479724</subfield><subfield code="9">978-0-306-47972-4</subfield></datafield><datafield tag="024" ind1="7" ind2=" "><subfield code="a">10.1007/b101876</subfield><subfield code="2">doi</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-2-ENG)978-0-306-47972-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)1050934343</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV045148526</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-573</subfield><subfield code="a">DE-634</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.3815</subfield><subfield code="2">23</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">ST 175</subfield><subfield code="0">(DE-625)143603:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Adams, R. Dean</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test</subfield><subfield code="c">by R. Dean Adams</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston, MA</subfield><subfield code="b">Springer US</subfield><subfield code="c">2003</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">1 Online-Ressource (XIV, 250 p)</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Frontiers in Electronic Testing</subfield><subfield code="v">22A</subfield></datafield><datafield tag="520" ind1=" " ind2=" "><subfield code="a">Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Circuits and Systems</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-Aided Engineering (CAD, CAE) and Design</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Computer-aided engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electrical engineering</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic circuits</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe</subfield><subfield code="z">9781402072550</subfield></datafield><datafield tag="856" ind1="4" ind2="0"><subfield code="u">https://doi.org/10.1007/b101876</subfield><subfield code="x">Verlag</subfield><subfield code="z">URL des Erstveröffentlichers</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-2-ENG</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">ZDB-2-ENG_2000/2004</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030538225</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/b101876</subfield><subfield code="l">FHI01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_2000/2004</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield><datafield tag="966" ind1="e" ind2=" "><subfield code="u">https://doi.org/10.1007/b101876</subfield><subfield code="l">BTU01</subfield><subfield code="p">ZDB-2-ENG</subfield><subfield code="q">ZDB-2-ENG_Archiv</subfield><subfield code="x">Verlag</subfield><subfield code="3">Volltext</subfield></datafield></record></collection> |
| id | DE-604.BV045148526 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:01Z |
| institution | BVB |
| isbn | 9780306479724 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030538225 |
| oclc_num | 1050934343 |
| open_access_boolean | |
| owner | DE-573 DE-634 |
| owner_facet | DE-573 DE-634 |
| physical | 1 Online-Ressource (XIV, 250 p) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_Archiv |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Springer US |
| record_format | marc |
| series2 | Frontiers in Electronic Testing |
| spelling | Adams, R. Dean Verfasser aut High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test by R. Dean Adams Boston, MA Springer US 2003 1 Online-Ressource (XIV, 250 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 22A Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits Erscheint auch als Druck-Ausgabe 9781402072550 https://doi.org/10.1007/b101876 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Adams, R. Dean High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits |
| title | High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test |
| title_auth | High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test |
| title_exact_search | High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test |
| title_full | High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test by R. Dean Adams |
| title_fullStr | High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test by R. Dean Adams |
| title_full_unstemmed | High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test by R. Dean Adams |
| title_short | High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test |
| title_sort | high performance memory testing design principles fault modeling and self test |
| topic | Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits |
| topic_facet | Engineering Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computer-aided engineering Electrical engineering Electronic circuits |
| url | https://doi.org/10.1007/b101876 |
| work_keys_str_mv | AT adamsrdean highperformancememorytestingdesignprinciplesfaultmodelingandselftest |