Design for AT-Speed Test, Diagnosis and Measurement:
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how...
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer US
2000
|
| Schriftenreihe: | Frontiers in Electronic Testing
15 |
| Schlagworte: | |
| Online-Zugang: | FHI01 BTU01 Volltext |
| Zusammenfassung: | Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a 'must read' before any DFT is attempted |
| Beschreibung: | 1 Online-Ressource (XVII, 239 p) |
| ISBN: | 9780306475443 |
| DOI: | 10.1007/b117472 |
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| id | DE-604.BV045148487 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:10:01Z |
| institution | BVB |
| isbn | 9780306475443 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030538186 |
| oclc_num | 1050943205 |
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| owner | DE-573 DE-634 |
| owner_facet | DE-573 DE-634 |
| physical | 1 Online-Ressource (XVII, 239 p) |
| psigel | ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_2000/2004 ZDB-2-ENG ZDB-2-ENG_Archiv |
| publishDate | 2000 |
| publishDateSearch | 2000 |
| publishDateSort | 2000 |
| publisher | Springer US |
| record_format | marc |
| series2 | Frontiers in Electronic Testing |
| spelling | Design for AT-Speed Test, Diagnosis and Measurement edited by Benoit Nadeau-Dostie Boston, MA Springer US 2000 1 Online-Ressource (XVII, 239 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in Electronic Testing 15 Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a 'must read' before any DFT is attempted Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits Nadeau-Dostie, Benoit edt Erscheint auch als Druck-Ausgabe 9780792386698 https://doi.org/10.1007/b117472 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Design for AT-Speed Test, Diagnosis and Measurement Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
| title | Design for AT-Speed Test, Diagnosis and Measurement |
| title_auth | Design for AT-Speed Test, Diagnosis and Measurement |
| title_exact_search | Design for AT-Speed Test, Diagnosis and Measurement |
| title_full | Design for AT-Speed Test, Diagnosis and Measurement edited by Benoit Nadeau-Dostie |
| title_fullStr | Design for AT-Speed Test, Diagnosis and Measurement edited by Benoit Nadeau-Dostie |
| title_full_unstemmed | Design for AT-Speed Test, Diagnosis and Measurement edited by Benoit Nadeau-Dostie |
| title_short | Design for AT-Speed Test, Diagnosis and Measurement |
| title_sort | design for at speed test diagnosis and measurement |
| topic | Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
| topic_facet | Engineering Circuits and Systems Electrical Engineering Electrical engineering Electronic circuits |
| url | https://doi.org/10.1007/b117472 |
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