Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits:
The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston, MA
Springer
2002
|
| Schriftenreihe: | Frontiers in electronic testing
17 |
| Schlagworte: | |
| Online-Zugang: | BTU01 FHI01 TUM01 Volltext |
| Zusammenfassung: | The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate "foundations" course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers |
| Beschreibung: | 1 Online-Ressource (XVIII, 690 p) |
| ISBN: | 9780306470400 |
| DOI: | 10.1007/b117406 |
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| 520 | |a The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate "foundations" course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers | ||
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Datensatz im Suchindex
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| author | Bushnell, Michael L. 1950- Agrawal, Vishwani D. 1943- |
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| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik Maschinenbau |
| doi_str_mv | 10.1007/b117406 |
| format | Electronic eBook |
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| indexdate | 2024-07-10T08:10:01Z |
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| isbn | 9780306470400 |
| language | English |
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| spelling | Bushnell, Michael L. 1950- Verfasser (DE-588)141881607 aut Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Michael L. Bushnell, Vishwani D. Agrawal Boston, MA Springer 2002 1 Online-Ressource (XVIII, 690 p) txt rdacontent c rdamedia cr rdacarrier Frontiers in electronic testing 17 The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate "foundations" course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers Engineering Electronics and Microelectronics, Instrumentation Theory of Computation Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computers Computer-aided engineering Electrical engineering Electronics Microelectronics Electronic circuits Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 s VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Agrawal, Vishwani D. 1943- Verfasser (DE-588)141881674 aut Erscheint auch als Druck-Ausgabe 978-0-7923-7991-1 Frontiers in electronic testing 17 (DE-604)BV045909765 17 https://doi.org/10.1007/b117406 Verlag URL des Erstveröffentlichers Volltext 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Bushnell, Michael L. 1950- Agrawal, Vishwani D. 1943- Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits Frontiers in electronic testing Engineering Electronics and Microelectronics, Instrumentation Theory of Computation Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computers Computer-aided engineering Electrical engineering Electronics Microelectronics Electronic circuits Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| subject_GND | (DE-588)4047610-8 (DE-588)4117388-0 (DE-588)4113419-9 |
| title | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| title_auth | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| title_exact_search | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| title_full | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Michael L. Bushnell, Vishwani D. Agrawal |
| title_fullStr | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Michael L. Bushnell, Vishwani D. Agrawal |
| title_full_unstemmed | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits by Michael L. Bushnell, Vishwani D. Agrawal |
| title_short | Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits |
| title_sort | essentials of electronic testing for digital memory and mixed signal vlsi circuits |
| topic | Engineering Electronics and Microelectronics, Instrumentation Theory of Computation Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computers Computer-aided engineering Electrical engineering Electronics Microelectronics Electronic circuits Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd Elektronische Schaltung (DE-588)4113419-9 gnd |
| topic_facet | Engineering Electronics and Microelectronics, Instrumentation Theory of Computation Circuits and Systems Electrical Engineering Computer-Aided Engineering (CAD, CAE) and Design Computers Computer-aided engineering Electrical engineering Electronics Microelectronics Electronic circuits Prüftechnik VLSI Elektronische Schaltung |
| url | https://doi.org/10.1007/b117406 |
| volume_link | (DE-604)BV045909765 |
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