Quantum metrology with photoelectrons, Volume 1, Foundations:

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelect...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
1. Verfasser: Hockett, Paul (VerfasserIn)
Format: Elektronisch E-Book
Sprache:English
Veröffentlicht: San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) Morgan & Claypool Publishers [2018]
Schriftenreihe:IOP (Series)
IOP concise physics
Schlagworte:
Online-Zugang:UBW01
Volltext
Zusammenfassung:Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications
Beschreibung:1 online resource (various pagings) illustrations (chiefly color)
ISBN:9781681746845
9781681746869
DOI:10.1088/978-1-6817-4684-5

Es ist kein Print-Exemplar vorhanden.

Fernleihe Bestellen Achtung: Nicht im THWS-Bestand! Volltext öffnen