Elemental analysis: an introduction to modern spectrometric techniques
Gespeichert in:
Hauptverfasser: | , , , |
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Format: | Buch |
Sprache: | English |
Veröffentlicht: |
Berlin ; Boston
De Gruyter
[2019]
|
Schriftenreihe: | De Gruyter Graduate
|
Schlagworte: | |
Online-Zugang: | http://www.degruyter.com/search?f_0=isbnissn&q_0=9783110501070&searchTitles=true Inhaltsverzeichnis |
Beschreibung: | XII, 402 Seiten Illustrationen, Diagramme (überwiegend farbig) 24 cm x 17 cm |
ISBN: | 9783110501070 |
Internformat
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016 | 7 | |a 1151897647 |2 DE-101 | |
020 | |a 9783110501070 |c pbk. |9 978-3-11-050107-0 | ||
035 | |a (OCoLC)1119083386 | ||
035 | |a (DE-599)DNB1151897647 | ||
040 | |a DE-604 |b ger |e rda | ||
041 | 0 | |a eng | |
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084 | |a 540 |2 sdnb | ||
084 | |a CHE 201f |2 stub | ||
100 | 1 | |a Schlemmer, Gerhard |e Verfasser |4 aut | |
245 | 1 | 0 | |a Elemental analysis |b an introduction to modern spectrometric techniques |c Gerhard Schlemmer, Lieve Balcaen, José Luis Todolí, Michael W. Hinds |
264 | 1 | |a Berlin ; Boston |b De Gruyter |c [2019] | |
264 | 4 | |c © 2019 | |
300 | |a XII, 402 Seiten |b Illustrationen, Diagramme (überwiegend farbig) |c 24 cm x 17 cm | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a De Gruyter Graduate | |
650 | 0 | 7 | |a ICP-Massenspektrometrie |0 (DE-588)4280345-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Atomabsorptionsspektroskopie |0 (DE-588)4068917-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elementaranalyse |0 (DE-588)4151986-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Spektroskopie |0 (DE-588)4056138-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Röntgenfluoreszenzspektroskopie |0 (DE-588)4135992-6 |2 gnd |9 rswk-swf |
653 | |a Fachhochschul-/Hochschulausbildung | ||
653 | |a Fachhochschul-/Hochschulausbildung | ||
653 | |a Analytische Chemie | ||
653 | |a Elementanalytik | ||
653 | |a Instrumentelle Analytik | ||
689 | 0 | 0 | |a Atomabsorptionsspektroskopie |0 (DE-588)4068917-7 |D s |
689 | 0 | 1 | |a ICP-Massenspektrometrie |0 (DE-588)4280345-7 |D s |
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689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Elementaranalyse |0 (DE-588)4151986-3 |D s |
689 | 1 | 1 | |a Spektroskopie |0 (DE-588)4056138-0 |D s |
689 | 1 | |5 DE-604 | |
700 | 1 | |a Balcaen, Lieve |e Verfasser |0 (DE-588)1194023983 |4 aut | |
700 | 1 | |a Todolí, José Luis |e Verfasser |0 (DE-588)1194024076 |4 aut | |
700 | 1 | |a Hinds, Michael W. |e Verfasser |0 (DE-588)1194027636 |4 aut | |
710 | 2 | |a Walter de Gruyter GmbH & Co. KG |0 (DE-588)10095502-2 |4 pbl | |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, PDF |z 978-3-11-050108-7 |
776 | 0 | 8 | |i Erscheint auch als |n Online-Ausgabe, EPUB |z 978-3-11-049832-5 |
856 | 4 | 2 | |m X:MVB |u http://www.degruyter.com/search?f_0=isbnissn&q_0=9783110501070&searchTitles=true |
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999 | |a oai:aleph.bib-bvb.de:BVB01-030298629 |
Datensatz im Suchindex
_version_ | 1804178462786715648 |
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adam_text | CONTENTS
PREFACE
*
V
1
INTRODUCTION
*
1
1.1
ANALYTICAL
PARAMETERS
*
1
1.1.1
DEFINE
WHAT
IS
TO
BE
MEASURED?
*
1
1.1.2
HOW
IMPORTANT
IS
THIS
ANALYSIS?
*
2
1.1.3
WHAT
IS
THE
SAMPLE,
HOW
IS
IT
SAMPLED
AND
HOW
DOES
IT
GET
TO
THE
LAB?
*
2
1.1.4
ACCURACY
*
2
1.1.5
PRECISION
*
3
1.1.6
SENSITIVITY
*
3
1.1.7
LIMIT
OF
DETECTION
*
4
1.1.8
TIME
OF
ANALYSIS
*
4
1.1.9
IMPORTANCE
OF
THE
RESULTS
*
5
1.1.10
WHAT
SPECTROMETRIC
TECHNIQUE
IS
TO
BE
USED?
*
5
1.1.11
WHAT
SAMPLE
PREPARATION
IS
REQUIRED?
*
7
1.1.12
AVAILABLE
RESOURCES
*
9
1.1.13
REPORTING
AND
POST-ANALYSIS
ACTIONS
*
9
1.2
REFERENCE
MATERIALS
*
10
1.3
VALIDATION
*
12
GERHARD
SCHLEMMER
2
ATOMIC
ABSORPTION
SPECTROMETRY
AND
ATOMIC
FLUORESCENCE
SPECTROMETRY
*
14
2.1
BASIC
PRINCIPLES
OF
ATOMIC
ABSORPTION
SPECTROMETRY
AND
ATOMIC
FLUORESCENCE
SPECTROMETRY
*
14
2.1.1
INTERACTION
OF
PHOTONS
WITH
ELECTRONS
*
14
2.1.2
LINE
WIDTH
OF
ABSORBING
ATOMS
*
15
2.1.3
LINE
WIDTH
OF
EMITTING
ATOMS
IN
THE
SOURCE
*
17
2.1.4
ABSORPTION
PROCESS
*
17
2.1.5
FLAME
OPTICAL
EMISSION
SPECTROSCOPY
*
19
2.1.6
ATOMIC
FLUORESCENCE
*
20
2.2
TECHNICAL
MEANS
TO
FACILITATE
AAS
AND
AFS
*
22
2.2.1
GENERAL
LAYOUT
-----
22
2.2.2
RADIATION
SOURCE
*
23
2.2.3
PHOTOMETER
AND
SPECTROMETER
*
30
2.2.4
COUNTING
PHOTONS
AND
TRANSFER
TO
ELECTRICAL
INFORMATION:
PRINCIPLE
WAY
OF
OPERATION
AND
CRITERIA
FOR
OPTIMAL
USE
*
35
2.2.5
ZERO
ABSORPTION:
TECHNICAL
MEANS
TO
DEFINE
THE
BASELINE
*
38
2.2.6
SEPARATION
OF
SPECIFIC
AND
NONSPECIFIC
ABSORPTION
*
41
VIII
*
CONTENTS
2.2.7
SAMPLE
INTRODUCTION
AND
PRINCIPLES
OF
ATOM
GENERATION
IN
AAS
-----
51
2.3
PHYSICOCHEMISTRY
OUTSIDE
AND
INSIDE
THE
ATOMIZER
*
64
2.3.1
FLAMES
*
64
2.3.2
GRAPHITE
FURNACE
*
69
2.3.3
CHEMICAL
VAPOR
GENERATION
*
71
2.3.4
ATOMIC
FLUORESCENCE
*
73
2.4
MASTERING
THE
SPECTROMETER
AND
ITS
ACCESSORIES
*
74
2.4.1
FIGURES
OF
MERIT
*
74
2.5
MASTERING
THE
APPLICATION;
INSTRUMENT
SUITABILITY;
METHOD
DEVELOPMENT;
ESTIMATION
ON
EXPECTED
WORKING
RANGE,
BASICS
OF
METHOD
OPTIMIZATION
FOR
FLAME,
FURNACE,
CVG,
COLD
VAPOR,
COLD
VAPOR
FLUORESCENCE.
SPECIAL
APPLICATIONS:
COUPLING
OF
METHODS.
ANALYTICAL
QUALITY
VERSUS
SAMPLE
AND
ELEMENT
THROUGHPUT
*
90
2.5.1
INSTRUMENT
PERFORMANCE
VERIFICATION
*
90
2.5.2
ESTIMATE
OF
THE
EXPECTED
WORKING
RANGE
*
93
2.5.3
IS
THE
INSTRUMENT
SUITABLE
FOR
THE
APPLICATION?
*
94
2.6
TYPICAL
APPLICATIONS
IN
AAS
AND
AFS
*
104
2.6.1
CONTAMINATED
SOILS:
AN
EASY
STANDARD
FLAME
AAS
APPLICATION
*
104
2.6.2
GEOCHEMISTRY:
THE
DETERMINATION
OF
REFRACTORY
ELEMENTS
IN
REFRACTORY
MATRIX
*
106
2.6.3
DETERMINATIONS
IN
ULTRAPURE
MATERIALS:
AN
UNUSUAL
CHALLENGE
*
107
2.6.4
BETWEEN
LIQUID
AND
SOLID:
THE
DIRECT
ANALYSIS
OF
CLINICAL
SAMPLES
IN
GF-AAS
----
114
2.6.5
PLANTS
AND
OTHER
BIOLOGICAL
TISSUE:
THE
WAY
TO
FAST
GF-AAS
DETERMINATIONS
*
119
2.6.6
ELEMENT-MATRIX
SEPARATION:
THE
DETERMINATION
OF
AS
AND
SB
IN
WATER
SAMPLES
*
122
2.6.7
CVG
WITH
ANALYTE
TRAPPING
FOR
ULTRA,
ULTRA-TRACES
*
124
2.6.8
THE
DETERMINATION
OF
MERCURY
WITH
THE
COLD
VAPOR
TECHNIQUE
AND
AFS
*
126
REFERENCES
*
130
JOSE
LUIS
TODOLF
3
INDUCTIVELY
COUPLED
PLASMA
AND
MICROWAVE-INDUCED
PLASMA
OPTICAL
EMISSION
SPECTROSCOPY
*
134
3.1
INTRODUCTION
TO
INDUCTIVELY
COUPLED
PLASMA
OPTICAL
EMISSION
SPECTROSCOPY
*
134
3.2
PLASMA
GENERATION
AND
FUNDAMENTAL
PARAMETERS
*
137
3.2.1
CHARACTERISTICS
OF
THE
ICP
*
137
3.2.2
MIXED
GAS
PLASMAS
*
144
3.2.3
GENERATORS
*
145
CONTENTS
*
IX
3.3
3.3.1
3.3.2
3.3.3
3.3.4
3.3.5
3.3.6
3.3.7
3.3.8
3.3.9
3.4
3.4.1
3.4.2
3.4.3
3.5
3.5.1
3.5.2
3.6
3.7
3.7.1
3.7.2
3.7.3
3.8
3.9
3.9.1
3.9.2
3.10
3.11
3.12
3.12.1
3.12.2
3.12.3
3.13
3.14
SAMPLE
INTRODUCTION
SYSTEMS
*
146
CONVENTIONAL
LIQUID
SAMPLE
INTRODUCTION
SYSTEM
*
147
DRAWBACKS
OF
CONVENTIONAL
LIQUID
SAMPLE
INTRODUCTION
SYSTEM
*
151
EFFICIENT
NEBULIZERS
OR
SPRAY
CHAMBERS
*
151
HIGH
SOLID
NEBULIZERS
*
156
COOLED
SPRAY
CHAMBERS
*
158
DESOLVATION
SYSTEMS
*
159
LOW
SAMPLE
CONSUMPTION
SYSTEMS
*
162
CHEMICAL
VAPOR
GENERATION
*
164
ELECTROTHERMAL
VAPORIZATION
*
166
TORCH
CONFIGURATION
*
169
GENERAL
CHARACTERISTICS
*
169
LOW
ARGON
CONSUMPTION
TORCHES
*
171
PLASMA
VIEWING
MODE
*
172
OPTICAL
SYSTEM
*
174
DISPERSIVE
SYSTEM
*
176
DETECTORS
*
178
GENERAL
CONFIGURATIONS
*
181
INTERFERENCES
IN
ICP-OES
*
185
SPECTROSCOPIC
INTERFERENCES
IN
ICP-OES
*
186
HON-SPECTROSCOPIC
INTERFERENCES
(MATRIX
EFFECTS)
IN
ICP-OES
*
189
COMPARING
SPECTROSCOPIC
AND
NON-SPECTROSCOPIC
INTERFERENCES
*
202
EFFECT
OF
THE
ANALYTE
CHEMICAL
FORM
*
202
OPTIMIZING
AN
ICP-OES
SYSTEM
*
205
OPTIMIZATION
FROM
THE
POINT
OF
VIEW
OF
ANALYTICAL
FIGURES
OF
MERIT
-----
207
OPTIMIZATION
FROM
THE
POINT
OF
VIEW
OF
ACCURACY
*
210
METHODS
FOR
ANALYTE
QUANTIFICATION
THROUGH
ICP-OES
*
215
TROUBLESHOOTING
AND
MAINTENANCE
IN
ICP-OES
*
216
MICROWAVE
PLASMA
OPTICAL
EMISSION
SPECTROSCOPY
*
219
INSTRUMENTATION
IN
MWP-OES
*
220
MATRIX
EFFECTS
IN
MWP-OES
*
224
OPTIMIZATION
IN
MWP-OES
*
225
COMPARISON
OF
ICP-OES,
MIP-OES
WITH
OTHER
SPECTROCHEMICAL
TECHNIQUES
*
226
SELECTED
APPLICATIONS
*
228
BIBLIOGRAPHY
*
231
X
CONTENTS
LIEVE
BALCAEN
4
INDUCTIVELY
COUPLED
PLASMA-MASS
SPECTROMETRY
*
247
4.1
INTRODUCTION
AND
BRIEF
HISTORY
*
247
4.2
INSTRUMENTATION
AND
PRINCIPLE
OF
OPERATION
*
248
4.2.1 SAMPLE
INTRODUCTION
SYSTEM
*
249
4.2.2
INDUCTIVELY
COUPLED
PLASMA
ION
SOURCE
*
249
4.2.3
EXTRACTION
SYSTEM
-----
250
4.2.4
MASS
SPECTROMETER
*
252
4.2.5
DETECTORS
-----
262
4.2.6
ALTERNATIVE
SAMPLE
INTRODUCTION
SYSTEMS
*
264
4.3
SPECTRAL
INTERFERENCES
*
266
4.3.1
TYPES
OF
INTERFERENCES
*
267
4.3.2
METHODS
TO
TACKLE
THE
PROBLEM
OF
SPECTRAL
INTERFERENCES
*
268
4.4
NONSPECTRAL
INTERFERENCES
*
275
4.4.1
DESCRIPTION
OF
NONSPECTRAL
INTERFERENCES
*
275
4.4.2
METHODS
TO
TACKLE
THE
PROBLEM
OF
NONSPECTRAL
INTERFERENCES
*
277
4.5
ANALYTICAL
PERFORMANCE
*
279
4.6
HYPHENATED
ICP-MS
*
282
4.7
EXAMPLES
OF
TYPICAL
APPLICATIONS
*
283
4.7.1
(ULTRA-)TRACE
ELEMENT
DETERMINATION
*
284
4.7.2
ISOTOPIC
ANALYSIS
*
284
4.7.3
SPECIATION
ANALYSIS
BY
MEANS
OF
LC-ICP-MS
*
298
4.7.4
SPATIALLY
RESOLVED
ANALYSIS
BY
MEANS
OF
LA-ICP-MS
*
300
REFERENCES
*
302
MICHAEL
W.
HINDS
5
X-RAY
FLUORESCENCE
SPECTROMETRY
*
306
5.1
OVERVIEW
*
306
5.1.1
WHAT
IS
X-RAY
FLUORESCENCE
(XRF)
SPECTROMETRY?
*
306
5.1.2
WHAT
DISTINGUISHES
XRF
FROM
OTHER
ATOMIC
SPECTROMETRIC
TECHNIQUES?
*
306
5.1.3
TYPES:
WAVELENGTH
DISPERSIVE
XRF
AND
ENERGY
DISPERSIVE
XRF
*
307
5.2
PHYSICS
OF
X-RAYS
------
308
5.2.1
INTRODUCTION
-----
308
5.2.2
CHARACTERISTIC
FLUORESCENCE
LINES
*
310
5.2.3
ABSORPTION
AND
FLUORESCENCE
*
314
5.2.4
GENERATION
OF
X-RAYS
WITHIN
THE
X-RAY
TUBE
*
317
5.2.5
PRODUCTION
OF
FLUORESCENCE
X-RAYS
WITHIN
THE
SAMPLE
*
318
5.2.6
INFINITE
THICKNESS
AND
ANALYSIS
DEPTH
*
319
5.2.7
FLUORESCENCE
YIELD
*
320
5.3
WDXRF
SPECTROMETER
AND
COMPONENTS
*
320
5.3.1
X-RAY
TUBE
*
322
CONTENTS
*
XI
5.3.2
5.3.3
5.3.4
5.3.5
5.3.6
5.3.7
5.3.8
5.3.9
5.3.10
5.3.11
5.3.12
5.4
5.4.1
5.4.2
5.4.3
5.4.4
5.4.5
5.4.6
5.4.7
5.4.8
5.4.9
5.4.10
5.5
5.5.1
5.5.2
5.5.3
5.5.4
5.6
5.6.1
5.6.2
5.6.3
5.6.4
5.6.5
5.7
5.7.1
5.7.2
5.7.3
5.7.4
5.7.5
5.8
5.8.1
5.8.2
PRIMARY
BEAM
FILTERS
*
325
ATMOSPHERE
-----
326
SAMPLE
CUPS
AND
APERTURE
*
326
MASK
-----
328
COLLIMATORS
-----
328
CRYSTALS
OR
ANALYZER
CRYSTALS
*
329
GONIOMETER
*
331
DETECTORS
-----
331
PULSE
HEIGHT
SELECTION
*
333
AUXILIARY
SERVICES
*
336
OPTIMIZATION
OF
PARAMETERS
*
336
EDXRF
SPECTROMETER
AND
COMPONENTS
*
337
X-RAY
SOURCES
*
338
ATMOSPHERE
*
339
PRIMARY
BEAM
FILTERS
*
339
SAMPLE
CUPS
AND
APERTURE
*
340
DETECTORS
*
340
MULTICHANNEL
ANALYZER
*
344
AUXILIARY
SERVICES
*
344
HANDHELD
EDXRF
SPECTROMETER
*
345
TOTAL
REFLECTION
XRF
-----
346
COMPARISON
BETWEEN
EDXRF
AND
WDXRF
-----
346
OBTAINING
OPTIMIZED
NET
INTENSITIES
AND
COUNTING
TIMES
*
347
BACKGROUND
CORRECTED
PEAKS
WDXRF
*
347
BACKGROUND
CORRECTION
EDXRF
-----
350
PEAK
OVERLAP
CORRECTIONS
*
352
MEASUREMENT
TIME
*
354
MATRIX
EFFECTS
SPECIFIC
TO
XRF
*
356
ABSORPTION
-----
357
ENHANCEMENT
*
358
PARTICLE
SIZE
EFFECTS
*
359
MINERALOGICAL
EFFECTS
*
360
CHEMICAL
STATE
EFFECTS
*
361
CALIBRATION
AND
MATHEMATICAL
CORRECTION
MODELS
*
362
REFERENCE
MATERIALS
*
362
MATRIX
CORRECTION
ALGORITHMS
*
362
CALIBRATION
-----
366
VALIDATION
*
367
DRIFT
CORRECTION
-----367
UNIVERSAL
CALIBRATION
XRF
ANALYSIS
*
368
HOW
IT
WORKS
-----
369
APPLICATIONS
-----
369
XII
CONTENTS
5.8.3
5.9
5.9.1
5.9.2
5.9.3
5.10
5.10.1
5.10.2
5.11
5.11.1
5.11.2
5.11.3
5.11.4
5.11.5
5.12
5.13
5.13.1
5.13.2
5.13.3
ADVANTAGES
AND
DISADVANTAGES
*
369
SAMPLE
PREPARATION
*
370
AIR
SAMPLE
PREPARATION
*
370
LIQUID
SAMPLE
PREPARATION
*
370
SOLID
SAMPLE
PREPARATION
*
372
EXAMPLES
APPLICATIONS
*
378
EDXRF
-
DETERMINATION
OF
AG,
AS
AND
ZN
IN
LEAD
CONCENTRATE
*
378
WDXRF
-
DETERMINATION
OF
AG,
CU,
AND
P
IN
STERLING
SILVER
*
381
DIFFERENT
APPLICATIONS
AND
CURRENT
TRENDS
IN
XRF
*
385
COMBINATION
WDXRF
AND
EDXRF
IN
ONE
INSTRUMENT
*
385
MICROFOCUSING
OPTICS
AND
ELEMENT
CONCENTRATION
MAPPING
*
385
LAYER
THICKNESS
*
385
VENDOR
METHOD
PACKAGES
*
386
ADVANCES
IN
EDXRF
*
386
CONCLUDING
REMARKS
*
386
APPENDIX
*
387
APPENDIX
1:
TABLE
OF
PHOTON
ENERGIES
OF
THE
PRINCIPLE
K
AND
L
X-RAY
SPECTRAL
LINES
*
387
APPENDIX
2:
TABLE
OF
K,
L,
AND
M
X-RAY
EXCITATION
POTENTIALS
OF
THE
ELEMENTS
*
390
APPENDIX
3:
TABLE
OF
MASS
ATTENUATION
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any_adam_object | 1 |
author | Schlemmer, Gerhard Balcaen, Lieve Todolí, José Luis Hinds, Michael W. |
author_GND | (DE-588)1194023983 (DE-588)1194024076 (DE-588)1194027636 |
author_facet | Schlemmer, Gerhard Balcaen, Lieve Todolí, José Luis Hinds, Michael W. |
author_role | aut aut aut aut |
author_sort | Schlemmer, Gerhard |
author_variant | g s gs l b lb j l t jl jlt m w h mw mwh |
building | Verbundindex |
bvnumber | BV044904929 |
classification_rvk | VG 6500 VG 6700 |
classification_tum | CHE 201f |
ctrlnum | (OCoLC)1119083386 (DE-599)DNB1151897647 |
discipline | Chemie / Pharmazie Chemie |
format | Book |
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id | DE-604.BV044904929 |
illustrated | Illustrated |
indexdate | 2024-07-10T08:04:22Z |
institution | BVB |
institution_GND | (DE-588)10095502-2 |
isbn | 9783110501070 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030298629 |
oclc_num | 1119083386 |
open_access_boolean | |
owner | DE-20 DE-91G DE-BY-TUM DE-83 DE-11 DE-634 DE-19 DE-BY-UBM DE-29 |
owner_facet | DE-20 DE-91G DE-BY-TUM DE-83 DE-11 DE-634 DE-19 DE-BY-UBM DE-29 |
physical | XII, 402 Seiten Illustrationen, Diagramme (überwiegend farbig) 24 cm x 17 cm |
publishDate | 2019 |
publishDateSearch | 2019 |
publishDateSort | 2019 |
publisher | De Gruyter |
record_format | marc |
series2 | De Gruyter Graduate |
spelling | Schlemmer, Gerhard Verfasser aut Elemental analysis an introduction to modern spectrometric techniques Gerhard Schlemmer, Lieve Balcaen, José Luis Todolí, Michael W. Hinds Berlin ; Boston De Gruyter [2019] © 2019 XII, 402 Seiten Illustrationen, Diagramme (überwiegend farbig) 24 cm x 17 cm txt rdacontent n rdamedia nc rdacarrier De Gruyter Graduate ICP-Massenspektrometrie (DE-588)4280345-7 gnd rswk-swf Atomabsorptionsspektroskopie (DE-588)4068917-7 gnd rswk-swf Elementaranalyse (DE-588)4151986-3 gnd rswk-swf Spektroskopie (DE-588)4056138-0 gnd rswk-swf Röntgenfluoreszenzspektroskopie (DE-588)4135992-6 gnd rswk-swf Fachhochschul-/Hochschulausbildung Analytische Chemie Elementanalytik Instrumentelle Analytik Atomabsorptionsspektroskopie (DE-588)4068917-7 s ICP-Massenspektrometrie (DE-588)4280345-7 s Röntgenfluoreszenzspektroskopie (DE-588)4135992-6 s DE-604 Elementaranalyse (DE-588)4151986-3 s Spektroskopie (DE-588)4056138-0 s Balcaen, Lieve Verfasser (DE-588)1194023983 aut Todolí, José Luis Verfasser (DE-588)1194024076 aut Hinds, Michael W. Verfasser (DE-588)1194027636 aut Walter de Gruyter GmbH & Co. KG (DE-588)10095502-2 pbl Erscheint auch als Online-Ausgabe, PDF 978-3-11-050108-7 Erscheint auch als Online-Ausgabe, EPUB 978-3-11-049832-5 X:MVB http://www.degruyter.com/search?f_0=isbnissn&q_0=9783110501070&searchTitles=true DNB Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030298629&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Schlemmer, Gerhard Balcaen, Lieve Todolí, José Luis Hinds, Michael W. Elemental analysis an introduction to modern spectrometric techniques ICP-Massenspektrometrie (DE-588)4280345-7 gnd Atomabsorptionsspektroskopie (DE-588)4068917-7 gnd Elementaranalyse (DE-588)4151986-3 gnd Spektroskopie (DE-588)4056138-0 gnd Röntgenfluoreszenzspektroskopie (DE-588)4135992-6 gnd |
subject_GND | (DE-588)4280345-7 (DE-588)4068917-7 (DE-588)4151986-3 (DE-588)4056138-0 (DE-588)4135992-6 |
title | Elemental analysis an introduction to modern spectrometric techniques |
title_auth | Elemental analysis an introduction to modern spectrometric techniques |
title_exact_search | Elemental analysis an introduction to modern spectrometric techniques |
title_full | Elemental analysis an introduction to modern spectrometric techniques Gerhard Schlemmer, Lieve Balcaen, José Luis Todolí, Michael W. Hinds |
title_fullStr | Elemental analysis an introduction to modern spectrometric techniques Gerhard Schlemmer, Lieve Balcaen, José Luis Todolí, Michael W. Hinds |
title_full_unstemmed | Elemental analysis an introduction to modern spectrometric techniques Gerhard Schlemmer, Lieve Balcaen, José Luis Todolí, Michael W. Hinds |
title_short | Elemental analysis |
title_sort | elemental analysis an introduction to modern spectrometric techniques |
title_sub | an introduction to modern spectrometric techniques |
topic | ICP-Massenspektrometrie (DE-588)4280345-7 gnd Atomabsorptionsspektroskopie (DE-588)4068917-7 gnd Elementaranalyse (DE-588)4151986-3 gnd Spektroskopie (DE-588)4056138-0 gnd Röntgenfluoreszenzspektroskopie (DE-588)4135992-6 gnd |
topic_facet | ICP-Massenspektrometrie Atomabsorptionsspektroskopie Elementaranalyse Spektroskopie Röntgenfluoreszenzspektroskopie |
url | http://www.degruyter.com/search?f_0=isbnissn&q_0=9783110501070&searchTitles=true http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=030298629&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
work_keys_str_mv | AT schlemmergerhard elementalanalysisanintroductiontomodernspectrometrictechniques AT balcaenlieve elementalanalysisanintroductiontomodernspectrometrictechniques AT todolijoseluis elementalanalysisanintroductiontomodernspectrometrictechniques AT hindsmichaelw elementalanalysisanintroductiontomodernspectrometrictechniques AT walterdegruytergmbhcokg elementalanalysisanintroductiontomodernspectrometrictechniques |