Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Saved in:
| Other Authors: | , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham
Springer
[2018]
|
| Series: | Springer Series in Surface Sciences
volume 65 |
| Subjects: | |
| Online Access: | TUM01 UBM01 UBT01 UER01 Volltext |
| Physical Description: | 1 Online-Ressource (XXIV, 521 p. 234 illus., 194 illus. in color) |
| ISBN: | 9783319756875 |
| DOI: | 10.1007/978-3-319-75687-5 |
Staff View
MARC
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| 650 | 4 | |a Thin films | |
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| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
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| id | DE-604.BV044888308 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:03:53Z |
| institution | BVB |
| isbn | 9783319756875 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030282365 |
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| physical | 1 Online-Ressource (XXIV, 521 p. 234 illus., 194 illus. in color) |
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| publishDate | 2018 |
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| publisher | Springer |
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| series | Springer Series in Surface Sciences |
| series2 | Springer Series in Surface Sciences |
| spelling | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Sascha Sadewasser, Thilo Glatzel (editors) Cham Springer [2018] 1 Online-Ressource (XXIV, 521 p. 234 illus., 194 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Series in Surface Sciences volume 65 Physics Physical measurements Measurement Spectroscopy Microscopy Nanotechnology Materials science Materials / Surfaces Thin films Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Characterization and Evaluation of Materials Measurement Science and Instrumentation Sadewasser, Sascha (DE-588)138305994 edt Glatzel, Thilo 1972- (DE-588)128801050 edt Erscheint auch als Druck-Ausgabe 978-3-319-75686-8 Springer Series in Surface Sciences volume 65 (DE-604)BV041443927 65 https://doi.org/10.1007/978-3-319-75687-5 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Springer Series in Surface Sciences Physics Physical measurements Measurement Spectroscopy Microscopy Nanotechnology Materials science Materials / Surfaces Thin films Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Characterization and Evaluation of Materials Measurement Science and Instrumentation |
| title | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization |
| title_auth | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization |
| title_exact_search | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization |
| title_full | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Sascha Sadewasser, Thilo Glatzel (editors) |
| title_fullStr | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Sascha Sadewasser, Thilo Glatzel (editors) |
| title_full_unstemmed | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Sascha Sadewasser, Thilo Glatzel (editors) |
| title_short | Kelvin Probe Force Microscopy |
| title_sort | kelvin probe force microscopy from single charge detection to device characterization |
| title_sub | From Single Charge Detection to Device Characterization |
| topic | Physics Physical measurements Measurement Spectroscopy Microscopy Nanotechnology Materials science Materials / Surfaces Thin films Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Characterization and Evaluation of Materials Measurement Science and Instrumentation |
| topic_facet | Physics Physical measurements Measurement Spectroscopy Microscopy Nanotechnology Materials science Materials / Surfaces Thin films Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Characterization and Evaluation of Materials Measurement Science and Instrumentation |
| url | https://doi.org/10.1007/978-3-319-75687-5 |
| volume_link | (DE-604)BV041443927 |
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