Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2018]
|
| Schriftenreihe: | Springer Series in Surface Sciences
volume 65 |
| Schlagworte: | |
| Online-Zugang: | TUM01 UBM01 UBT01 UER01 Volltext |
| Beschreibung: | 1 Online-Ressource (XXIV, 521 p. 234 illus., 194 illus. in color) |
| ISBN: | 9783319756875 |
| DOI: | 10.1007/978-3-319-75687-5 |
Internformat
MARC
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| 245 | 1 | 0 | |a Kelvin Probe Force Microscopy |b From Single Charge Detection to Device Characterization |c Sascha Sadewasser, Thilo Glatzel (editors) |
| 264 | 1 | |a Cham |b Springer |c [2018] | |
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| 490 | 1 | |a Springer Series in Surface Sciences |v volume 65 | |
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Physical measurements | |
| 650 | 4 | |a Measurement | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Nanotechnology | |
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Materials / Surfaces | |
| 650 | 4 | |a Thin films | |
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
| 650 | 4 | |a Nanotechnology and Microengineering | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Measurement Science and Instrumentation | |
| 700 | 1 | |a Sadewasser, Sascha |0 (DE-588)138305994 |4 edt | |
| 700 | 1 | |a Glatzel, Thilo |d 1972- |0 (DE-588)128801050 |4 edt | |
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Datensatz im Suchindex
| _version_ | 1804178432815267840 |
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| any_adam_object | |
| author2 | Sadewasser, Sascha Glatzel, Thilo 1972- |
| author2_role | edt edt |
| author2_variant | s s ss t g tg |
| author_GND | (DE-588)138305994 (DE-588)128801050 |
| author_facet | Sadewasser, Sascha Glatzel, Thilo 1972- |
| building | Verbundindex |
| bvnumber | BV044888308 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA |
| ctrlnum | (ZDB-2-PHA)9783319756875 (OCoLC)1031056452 (DE-599)BVBBV044888308 |
| dewey-full | 621.36 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.36 |
| dewey-search | 621.36 |
| dewey-sort | 3621.36 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Elektrotechnik / Elektronik / Nachrichtentechnik |
| doi_str_mv | 10.1007/978-3-319-75687-5 |
| format | Electronic eBook |
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| id | DE-604.BV044888308 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:03:53Z |
| institution | BVB |
| isbn | 9783319756875 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030282365 |
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| physical | 1 Online-Ressource (XXIV, 521 p. 234 illus., 194 illus. in color) |
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| publishDate | 2018 |
| publishDateSearch | 2018 |
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| publisher | Springer |
| record_format | marc |
| series | Springer Series in Surface Sciences |
| series2 | Springer Series in Surface Sciences |
| spelling | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Sascha Sadewasser, Thilo Glatzel (editors) Cham Springer [2018] 1 Online-Ressource (XXIV, 521 p. 234 illus., 194 illus. in color) txt rdacontent c rdamedia cr rdacarrier Springer Series in Surface Sciences volume 65 Physics Physical measurements Measurement Spectroscopy Microscopy Nanotechnology Materials science Materials / Surfaces Thin films Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Characterization and Evaluation of Materials Measurement Science and Instrumentation Sadewasser, Sascha (DE-588)138305994 edt Glatzel, Thilo 1972- (DE-588)128801050 edt Erscheint auch als Druck-Ausgabe 978-3-319-75686-8 Springer Series in Surface Sciences volume 65 (DE-604)BV041443927 65 https://doi.org/10.1007/978-3-319-75687-5 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Springer Series in Surface Sciences Physics Physical measurements Measurement Spectroscopy Microscopy Nanotechnology Materials science Materials / Surfaces Thin films Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Characterization and Evaluation of Materials Measurement Science and Instrumentation |
| title | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization |
| title_auth | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization |
| title_exact_search | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization |
| title_full | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Sascha Sadewasser, Thilo Glatzel (editors) |
| title_fullStr | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Sascha Sadewasser, Thilo Glatzel (editors) |
| title_full_unstemmed | Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization Sascha Sadewasser, Thilo Glatzel (editors) |
| title_short | Kelvin Probe Force Microscopy |
| title_sort | kelvin probe force microscopy from single charge detection to device characterization |
| title_sub | From Single Charge Detection to Device Characterization |
| topic | Physics Physical measurements Measurement Spectroscopy Microscopy Nanotechnology Materials science Materials / Surfaces Thin films Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Characterization and Evaluation of Materials Measurement Science and Instrumentation |
| topic_facet | Physics Physical measurements Measurement Spectroscopy Microscopy Nanotechnology Materials science Materials / Surfaces Thin films Spectroscopy and Microscopy Surfaces and Interfaces, Thin Films Nanotechnology and Microengineering Characterization and Evaluation of Materials Measurement Science and Instrumentation |
| url | https://doi.org/10.1007/978-3-319-75687-5 |
| volume_link | (DE-604)BV041443927 |
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