APA (7th ed.) Citation

Sadewasser, S., & Glatzel, T. (2018). Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization. Springer. https://doi.org/10.1007/978-3-319-75687-5

Chicago Style (17th ed.) Citation

Sadewasser, Sascha, and Thilo Glatzel. Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization. Cham: Springer, 2018. https://doi.org/10.1007/978-3-319-75687-5.

MLA (9th ed.) Citation

Sadewasser, Sascha, and Thilo Glatzel. Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization. Springer, 2018. https://doi.org/10.1007/978-3-319-75687-5.