Optical Characterization of Thin Solid Films:
Saved in:
| Other Authors: | , |
|---|---|
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham
Springer
[2018]
|
| Series: | Springer Series in Surface Sciences
volume 64 |
| Subjects: | |
| Online Access: | TUM01 UBM01 UBT01 UER01 Volltext |
| Physical Description: | 1 Online-Ressource (XXIV, 462 p) |
| ISBN: | 9783319753256 |
| DOI: | 10.1007/978-3-319-75325-6 |
Staff View
MARC
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| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Interfaces (Physical sciences) | |
| 650 | 4 | |a Thin films | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Optical materials | |
| 650 | 4 | |a Electronic materials | |
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| 650 | 4 | |a Surface and Interface Science, Thin Films | |
| 650 | 4 | |a Optical and Electronic Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
| 700 | 1 | |a Stenzel, Olaf |d 1962- |0 (DE-588)112650775 |4 edt | |
| 700 | 1 | |a Ohlídal, Miloslav |4 edt | |
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Record in the Search Index
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| discipline | Physik |
| doi_str_mv | 10.1007/978-3-319-75325-6 |
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| id | DE-604.BV044888306 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:03:53Z |
| institution | BVB |
| isbn | 9783319753256 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030282363 |
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| owner_facet | DE-91 DE-BY-TUM DE-29 DE-19 DE-BY-UBM DE-188 DE-703 |
| physical | 1 Online-Ressource (XXIV, 462 p) |
| psigel | ZDB-2-PHA ZDB-2-PHA_2018 |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer |
| record_format | marc |
| series | Springer Series in Surface Sciences |
| series2 | Springer Series in Surface Sciences |
| spelling | Optical Characterization of Thin Solid Films Olaf Stenzel, Miloslav Ohlídal (editors) Cham Springer [2018] 1 Online-Ressource (XXIV, 462 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Surface Sciences volume 64 Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Stenzel, Olaf 1962- (DE-588)112650775 edt Ohlídal, Miloslav edt Erscheint auch als Druck-Ausgabe 978-3-319-75324-9 Springer Series in Surface Sciences volume 64 (DE-604)BV041443927 64 https://doi.org/10.1007/978-3-319-75325-6 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Optical Characterization of Thin Solid Films Springer Series in Surface Sciences Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| title | Optical Characterization of Thin Solid Films |
| title_auth | Optical Characterization of Thin Solid Films |
| title_exact_search | Optical Characterization of Thin Solid Films |
| title_full | Optical Characterization of Thin Solid Films Olaf Stenzel, Miloslav Ohlídal (editors) |
| title_fullStr | Optical Characterization of Thin Solid Films Olaf Stenzel, Miloslav Ohlídal (editors) |
| title_full_unstemmed | Optical Characterization of Thin Solid Films Olaf Stenzel, Miloslav Ohlídal (editors) |
| title_short | Optical Characterization of Thin Solid Films |
| title_sort | optical characterization of thin solid films |
| topic | Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| topic_facet | Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| url | https://doi.org/10.1007/978-3-319-75325-6 |
| volume_link | (DE-604)BV041443927 |
| work_keys_str_mv | AT stenzelolaf opticalcharacterizationofthinsolidfilms AT ohlidalmiloslav opticalcharacterizationofthinsolidfilms |