Optical Characterization of Thin Solid Films:
Gespeichert in:
| Weitere Verfasser: | , |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Cham
Springer
[2018]
|
| Schriftenreihe: | Springer Series in Surface Sciences
volume 64 |
| Schlagworte: | |
| Online-Zugang: | TUM01 UBM01 UBT01 UER01 Volltext |
| Beschreibung: | 1 Online-Ressource (XXIV, 462 p) |
| ISBN: | 9783319753256 |
| DOI: | 10.1007/978-3-319-75325-6 |
Internformat
MARC
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| 245 | 1 | 0 | |a Optical Characterization of Thin Solid Films |c Olaf Stenzel, Miloslav Ohlídal (editors) |
| 264 | 1 | |a Cham |b Springer |c [2018] | |
| 300 | |a 1 Online-Ressource (XXIV, 462 p) | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 1 | |a Springer Series in Surface Sciences |v volume 64 | |
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 4 | |a Interfaces (Physical sciences) | |
| 650 | 4 | |a Thin films | |
| 650 | 4 | |a Spectroscopy | |
| 650 | 4 | |a Microscopy | |
| 650 | 4 | |a Optical materials | |
| 650 | 4 | |a Electronic materials | |
| 650 | 4 | |a Materials science | |
| 650 | 4 | |a Materials / Surfaces | |
| 650 | 4 | |a Physics | |
| 650 | 4 | |a Surface and Interface Science, Thin Films | |
| 650 | 4 | |a Optical and Electronic Materials | |
| 650 | 4 | |a Spectroscopy and Microscopy | |
| 650 | 4 | |a Characterization and Evaluation of Materials | |
| 650 | 4 | |a Surfaces and Interfaces, Thin Films | |
| 700 | 1 | |a Stenzel, Olaf |d 1962- |0 (DE-588)112650775 |4 edt | |
| 700 | 1 | |a Ohlídal, Miloslav |4 edt | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe |z 978-3-319-75324-9 |
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Datensatz im Suchindex
| _version_ | 1804178432824705024 |
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| any_adam_object | |
| author2 | Stenzel, Olaf 1962- Ohlídal, Miloslav |
| author2_role | edt edt |
| author2_variant | o s os m o mo |
| author_GND | (DE-588)112650775 |
| author_facet | Stenzel, Olaf 1962- Ohlídal, Miloslav |
| building | Verbundindex |
| bvnumber | BV044888306 |
| classification_rvk | UP 7800 |
| classification_tum | PHY 000 |
| collection | ZDB-2-PHA |
| ctrlnum | (ZDB-2-PHA)9783319753256 (OCoLC)1031056268 (DE-599)BVBBV044888306 |
| dewey-full | 530.417 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 530 - Physics |
| dewey-raw | 530.417 |
| dewey-search | 530.417 |
| dewey-sort | 3530.417 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| doi_str_mv | 10.1007/978-3-319-75325-6 |
| format | Electronic eBook |
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| id | DE-604.BV044888306 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:03:53Z |
| institution | BVB |
| isbn | 9783319753256 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030282363 |
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| physical | 1 Online-Ressource (XXIV, 462 p) |
| psigel | ZDB-2-PHA ZDB-2-PHA_2018 |
| publishDate | 2018 |
| publishDateSearch | 2018 |
| publishDateSort | 2018 |
| publisher | Springer |
| record_format | marc |
| series | Springer Series in Surface Sciences |
| series2 | Springer Series in Surface Sciences |
| spelling | Optical Characterization of Thin Solid Films Olaf Stenzel, Miloslav Ohlídal (editors) Cham Springer [2018] 1 Online-Ressource (XXIV, 462 p) txt rdacontent c rdamedia cr rdacarrier Springer Series in Surface Sciences volume 64 Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films Stenzel, Olaf 1962- (DE-588)112650775 edt Ohlídal, Miloslav edt Erscheint auch als Druck-Ausgabe 978-3-319-75324-9 Springer Series in Surface Sciences volume 64 (DE-604)BV041443927 64 https://doi.org/10.1007/978-3-319-75325-6 Verlag URL des Erstveröffentlichers Volltext |
| spellingShingle | Optical Characterization of Thin Solid Films Springer Series in Surface Sciences Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| title | Optical Characterization of Thin Solid Films |
| title_auth | Optical Characterization of Thin Solid Films |
| title_exact_search | Optical Characterization of Thin Solid Films |
| title_full | Optical Characterization of Thin Solid Films Olaf Stenzel, Miloslav Ohlídal (editors) |
| title_fullStr | Optical Characterization of Thin Solid Films Olaf Stenzel, Miloslav Ohlídal (editors) |
| title_full_unstemmed | Optical Characterization of Thin Solid Films Olaf Stenzel, Miloslav Ohlídal (editors) |
| title_short | Optical Characterization of Thin Solid Films |
| title_sort | optical characterization of thin solid films |
| topic | Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| topic_facet | Physics Surfaces (Physics) Interfaces (Physical sciences) Thin films Spectroscopy Microscopy Optical materials Electronic materials Materials science Materials / Surfaces Surface and Interface Science, Thin Films Optical and Electronic Materials Spectroscopy and Microscopy Characterization and Evaluation of Materials Surfaces and Interfaces, Thin Films |
| url | https://doi.org/10.1007/978-3-319-75325-6 |
| volume_link | (DE-604)BV041443927 |
| work_keys_str_mv | AT stenzelolaf opticalcharacterizationofthinsolidfilms AT ohlidalmiloslav opticalcharacterizationofthinsolidfilms |