Aberration-corrected analytical transmission electron microscopy:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Hoboken, N.J.
Wiley
2011
|
| Schlagworte: | |
| Beschreibung: | xv, 280 p., [8] leaves of plates |
| ISBN: | 9781119978848 9781119979906 9781119979913 9781119978855 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044846119 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2011 |||| o||u| ||||||eng d | ||
| 020 | |a 9781119978848 |9 978-1-119-97884-8 | ||
| 020 | |a 9781119979906 |9 978-1-119-97990-6 | ||
| 020 | |a 9781119979913 |9 978-1-119-97991-3 | ||
| 020 | |a 9781119978855 |c Online |9 978-1-119-97885-5 | ||
| 035 | |a (ZDB-38-ESG)ebr10488537 | ||
| 035 | |a (OCoLC)754714922 | ||
| 035 | |a (DE-599)BVBBV044846119 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 084 | |a UH 6305 |0 (DE-625)145754: |2 rvk | ||
| 245 | 1 | 0 | |a Aberration-corrected analytical transmission electron microscopy |c edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| 264 | 1 | |a Hoboken, N.J. |b Wiley |c 2011 | |
| 300 | |a xv, 280 p., [8] leaves of plates | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 505 | 8 | |a "The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- | |
| 505 | 8 | |a "The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- | |
| 650 | 4 | |a Transmission electron microscopy | |
| 650 | 4 | |a Aberration | |
| 650 | 4 | |a Achromatism | |
| 650 | 0 | 7 | |a Korrektur |0 (DE-588)4205358-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Abbildungsfehler |0 (DE-588)4132894-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |D s |
| 689 | 0 | 1 | |a Abbildungsfehler |0 (DE-588)4132894-2 |D s |
| 689 | 0 | 2 | |a Korrektur |0 (DE-588)4205358-4 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Brydson, Rik |e Sonstige |4 oth | |
| 700 | 1 | |a Brooks, Susan |e Sonstige |4 oth | |
| 710 | 2 | |a Royal Microscopical Society (Great Britain) |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Hardcover |z 978-0-470-51851-9 |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030240981 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804178358312894464 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044846119 |
| classification_rvk | UH 6305 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index "The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- "The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- |
| ctrlnum | (ZDB-38-ESG)ebr10488537 (OCoLC)754714922 (DE-599)BVBBV044846119 |
| discipline | Physik |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02835nmm a2200517zc 4500</leader><controlfield tag="001">BV044846119</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s2011 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119978848</subfield><subfield code="9">978-1-119-97884-8</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119979906</subfield><subfield code="9">978-1-119-97990-6</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119979913</subfield><subfield code="9">978-1-119-97991-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9781119978855</subfield><subfield code="c">Online</subfield><subfield code="9">978-1-119-97885-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10488537</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)754714922</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044846119</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6305</subfield><subfield code="0">(DE-625)145754:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Aberration-corrected analytical transmission electron microscopy</subfield><subfield code="c">edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hoboken, N.J.</subfield><subfield code="b">Wiley</subfield><subfield code="c">2011</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xv, 280 p., [8] leaves of plates</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">"The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"--</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">"The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"--</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Transmission electron microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Aberration</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Achromatism</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Korrektur</subfield><subfield code="0">(DE-588)4205358-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Abbildungsfehler</subfield><subfield code="0">(DE-588)4132894-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Abbildungsfehler</subfield><subfield code="0">(DE-588)4132894-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Korrektur</subfield><subfield code="0">(DE-588)4205358-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Brydson, Rik</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Brooks, Susan</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Royal Microscopical Society (Great Britain)</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Hardcover</subfield><subfield code="z">978-0-470-51851-9</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030240981</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV044846119 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:42Z |
| institution | BVB |
| isbn | 9781119978848 9781119979906 9781119979913 9781119978855 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030240981 |
| oclc_num | 754714922 |
| open_access_boolean | |
| physical | xv, 280 p., [8] leaves of plates |
| psigel | ZDB-38-ESG |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | Wiley |
| record_format | marc |
| spelling | Aberration-corrected analytical transmission electron microscopy edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks Hoboken, N.J. Wiley 2011 xv, 280 p., [8] leaves of plates txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index "The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- "The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- Transmission electron microscopy Aberration Achromatism Korrektur (DE-588)4205358-4 gnd rswk-swf Abbildungsfehler (DE-588)4132894-2 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Abbildungsfehler (DE-588)4132894-2 s Korrektur (DE-588)4205358-4 s 1\p DE-604 Brydson, Rik Sonstige oth Brooks, Susan Sonstige oth Royal Microscopical Society (Great Britain) Sonstige oth Erscheint auch als Druck-Ausgabe, Hardcover 978-0-470-51851-9 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Aberration-corrected analytical transmission electron microscopy Includes bibliographical references and index "The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS)"-- "The book will be concerned with the theory, background and practical use of transmission electron microscopes with lens correctors which can correct for the effects of spherical aberration"-- Transmission electron microscopy Aberration Achromatism Korrektur (DE-588)4205358-4 gnd Abbildungsfehler (DE-588)4132894-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4205358-4 (DE-588)4132894-2 (DE-588)4215608-7 |
| title | Aberration-corrected analytical transmission electron microscopy |
| title_auth | Aberration-corrected analytical transmission electron microscopy |
| title_exact_search | Aberration-corrected analytical transmission electron microscopy |
| title_full | Aberration-corrected analytical transmission electron microscopy edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| title_fullStr | Aberration-corrected analytical transmission electron microscopy edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| title_full_unstemmed | Aberration-corrected analytical transmission electron microscopy edited by Rik Brydson ; published in association with the Royal Microscopical Society ; series editor, Susan Brooks |
| title_short | Aberration-corrected analytical transmission electron microscopy |
| title_sort | aberration corrected analytical transmission electron microscopy |
| topic | Transmission electron microscopy Aberration Achromatism Korrektur (DE-588)4205358-4 gnd Abbildungsfehler (DE-588)4132894-2 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | Transmission electron microscopy Aberration Achromatism Korrektur Abbildungsfehler Durchstrahlungselektronenmikroskopie |
| work_keys_str_mv | AT brydsonrik aberrationcorrectedanalyticaltransmissionelectronmicroscopy AT brookssusan aberrationcorrectedanalyticaltransmissionelectronmicroscopy AT royalmicroscopicalsocietygreatbritain aberrationcorrectedanalyticaltransmissionelectronmicroscopy |