Electromigration in ULSI interconnections:
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Bibliographic Details
Main Author: Tan, Cher Ming 1959- (Author)
Format: Electronic eBook
Language:English
Published: Hackensack, N.J. World Scientific c2010
Series:International series on advances in solid state electronics and technology
Subjects:
Physical Description:xix, 291 p.
ISBN:9814273325
9789814273329
9789814273336

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!