Electromigration in ULSI interconnections:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Hackensack, N.J.
World Scientific
c2010
|
| Schriftenreihe: | International series on advances in solid state electronics and technology
|
| Schlagworte: | |
| Beschreibung: | xix, 291 p. |
| ISBN: | 9814273325 9789814273329 9789814273336 |
Internformat
MARC
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| 020 | |a 9814273325 |9 981-4273-32-5 | ||
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| 100 | 1 | |a Tan, Cher Ming |d 1959- |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Electromigration in ULSI interconnections |c Cher Ming Tan |
| 264 | 1 | |a Hackensack, N.J. |b World Scientific |c c2010 | |
| 300 | |a xix, 291 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a International series on advances in solid state electronics and technology | |
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Integrated circuits |x Ultra large scale integration | |
| 650 | 4 | |a Electrodiffusion | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030240718 | ||
Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Tan, Cher Ming 1959- |
| author_facet | Tan, Cher Ming 1959- |
| author_role | aut |
| author_sort | Tan, Cher Ming 1959- |
| author_variant | c m t cm cmt |
| building | Verbundindex |
| bvnumber | BV044845856 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10480052 (OCoLC)714877548 (DE-599)BVBBV044845856 |
| format | Electronic eBook |
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| id | DE-604.BV044845856 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:42Z |
| institution | BVB |
| isbn | 9814273325 9789814273329 9789814273336 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030240718 |
| oclc_num | 714877548 |
| open_access_boolean | |
| physical | xix, 291 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2010 |
| publishDateSearch | 2010 |
| publishDateSort | 2010 |
| publisher | World Scientific |
| record_format | marc |
| series2 | International series on advances in solid state electronics and technology |
| spelling | Tan, Cher Ming 1959- Verfasser aut Electromigration in ULSI interconnections Cher Ming Tan Hackensack, N.J. World Scientific c2010 xix, 291 p. txt rdacontent c rdamedia cr rdacarrier International series on advances in solid state electronics and technology Includes bibliographical references and index Integrated circuits Ultra large scale integration Electrodiffusion |
| spellingShingle | Tan, Cher Ming 1959- Electromigration in ULSI interconnections Includes bibliographical references and index Integrated circuits Ultra large scale integration Electrodiffusion |
| title | Electromigration in ULSI interconnections |
| title_auth | Electromigration in ULSI interconnections |
| title_exact_search | Electromigration in ULSI interconnections |
| title_full | Electromigration in ULSI interconnections Cher Ming Tan |
| title_fullStr | Electromigration in ULSI interconnections Cher Ming Tan |
| title_full_unstemmed | Electromigration in ULSI interconnections Cher Ming Tan |
| title_short | Electromigration in ULSI interconnections |
| title_sort | electromigration in ulsi interconnections |
| topic | Integrated circuits Ultra large scale integration Electrodiffusion |
| topic_facet | Integrated circuits Ultra large scale integration Electrodiffusion |
| work_keys_str_mv | AT tancherming electromigrationinulsiinterconnections |