Scanning probe microscopy:
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Singapore
World Scientific Pub. Co.
2011
|
| Subjects: | |
| Physical Description: | xiv, 261 p. |
| ISBN: | 9814324760 9789814324762 9789814324779 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044845796 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2011 |||| o||u| ||||||eng d | ||
| 020 | |a 9814324760 |9 981-4324-76-0 | ||
| 020 | |a 9789814324762 |9 978-981-4324-76-2 | ||
| 020 | |a 9789814324779 |c Online |9 978-981-4324-77-9 | ||
| 035 | |a (ZDB-38-ESG)ebr10479780 | ||
| 035 | |a (OCoLC)738438959 | ||
| 035 | |a (DE-599)BVBBV044845796 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 245 | 1 | 0 | |a Scanning probe microscopy |c editors, Nikodem Tomczak, Kuan Eng Johnson Goh |
| 264 | 1 | |a Singapore |b World Scientific Pub. Co. |c 2011 | |
| 300 | |a xiv, 261 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Scanning probe microscopy | |
| 650 | 4 | |a Nanoelectronics | |
| 700 | 1 | |a Tomczak, Nikodem |e Sonstige |4 oth | |
| 700 | 1 | |a Goh, Kuan Eng Johnson |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030240658 | ||
Record in the Search Index
| _version_ | 1804178357682700288 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044845796 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10479780 (OCoLC)738438959 (DE-599)BVBBV044845796 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01077nmm a2200337zc 4500</leader><controlfield tag="001">BV044845796</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s2011 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9814324760</subfield><subfield code="9">981-4324-76-0</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814324762</subfield><subfield code="9">978-981-4324-76-2</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789814324779</subfield><subfield code="c">Online</subfield><subfield code="9">978-981-4324-77-9</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10479780</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)738438959</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044845796</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning probe microscopy</subfield><subfield code="c">editors, Nikodem Tomczak, Kuan Eng Johnson Goh</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Singapore</subfield><subfield code="b">World Scientific Pub. Co.</subfield><subfield code="c">2011</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiv, 261 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning probe microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nanoelectronics</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Tomczak, Nikodem</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Goh, Kuan Eng Johnson</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030240658</subfield></datafield></record></collection> |
| id | DE-604.BV044845796 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:41Z |
| institution | BVB |
| isbn | 9814324760 9789814324762 9789814324779 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030240658 |
| oclc_num | 738438959 |
| open_access_boolean | |
| physical | xiv, 261 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | World Scientific Pub. Co. |
| record_format | marc |
| spelling | Scanning probe microscopy editors, Nikodem Tomczak, Kuan Eng Johnson Goh Singapore World Scientific Pub. Co. 2011 xiv, 261 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Scanning probe microscopy Nanoelectronics Tomczak, Nikodem Sonstige oth Goh, Kuan Eng Johnson Sonstige oth |
| spellingShingle | Scanning probe microscopy Includes bibliographical references and index Scanning probe microscopy Nanoelectronics |
| title | Scanning probe microscopy |
| title_auth | Scanning probe microscopy |
| title_exact_search | Scanning probe microscopy |
| title_full | Scanning probe microscopy editors, Nikodem Tomczak, Kuan Eng Johnson Goh |
| title_fullStr | Scanning probe microscopy editors, Nikodem Tomczak, Kuan Eng Johnson Goh |
| title_full_unstemmed | Scanning probe microscopy editors, Nikodem Tomczak, Kuan Eng Johnson Goh |
| title_short | Scanning probe microscopy |
| title_sort | scanning probe microscopy |
| topic | Scanning probe microscopy Nanoelectronics |
| topic_facet | Scanning probe microscopy Nanoelectronics |
| work_keys_str_mv | AT tomczaknikodem scanningprobemicroscopy AT gohkuanengjohnson scanningprobemicroscopy |