Scanning probe microscopy:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Singapore
World Scientific Pub. Co.
2011
|
| Schlagworte: | |
| Beschreibung: | xiv, 261 p. |
| ISBN: | 9814324760 9789814324762 9789814324779 |
Internformat
MARC
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| 008 | 180305s2011 |||| o||u| ||||||eng d | ||
| 020 | |a 9814324760 |9 981-4324-76-0 | ||
| 020 | |a 9789814324762 |9 978-981-4324-76-2 | ||
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| 245 | 1 | 0 | |a Scanning probe microscopy |c editors, Nikodem Tomczak, Kuan Eng Johnson Goh |
| 264 | 1 | |a Singapore |b World Scientific Pub. Co. |c 2011 | |
| 300 | |a xiv, 261 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Scanning probe microscopy | |
| 650 | 4 | |a Nanoelectronics | |
| 700 | 1 | |a Tomczak, Nikodem |e Sonstige |4 oth | |
| 700 | 1 | |a Goh, Kuan Eng Johnson |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030240658 | ||
Datensatz im Suchindex
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| bvnumber | BV044845796 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10479780 (OCoLC)738438959 (DE-599)BVBBV044845796 |
| format | Electronic eBook |
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| id | DE-604.BV044845796 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:41Z |
| institution | BVB |
| isbn | 9814324760 9789814324762 9789814324779 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030240658 |
| oclc_num | 738438959 |
| open_access_boolean | |
| physical | xiv, 261 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2011 |
| publishDateSearch | 2011 |
| publishDateSort | 2011 |
| publisher | World Scientific Pub. Co. |
| record_format | marc |
| spelling | Scanning probe microscopy editors, Nikodem Tomczak, Kuan Eng Johnson Goh Singapore World Scientific Pub. Co. 2011 xiv, 261 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Scanning probe microscopy Nanoelectronics Tomczak, Nikodem Sonstige oth Goh, Kuan Eng Johnson Sonstige oth |
| spellingShingle | Scanning probe microscopy Includes bibliographical references and index Scanning probe microscopy Nanoelectronics |
| title | Scanning probe microscopy |
| title_auth | Scanning probe microscopy |
| title_exact_search | Scanning probe microscopy |
| title_full | Scanning probe microscopy editors, Nikodem Tomczak, Kuan Eng Johnson Goh |
| title_fullStr | Scanning probe microscopy editors, Nikodem Tomczak, Kuan Eng Johnson Goh |
| title_full_unstemmed | Scanning probe microscopy editors, Nikodem Tomczak, Kuan Eng Johnson Goh |
| title_short | Scanning probe microscopy |
| title_sort | scanning probe microscopy |
| topic | Scanning probe microscopy Nanoelectronics |
| topic_facet | Scanning probe microscopy Nanoelectronics |
| work_keys_str_mv | AT tomczaknikodem scanningprobemicroscopy AT gohkuanengjohnson scanningprobemicroscopy |