Monte Carlo modeling for electron microscopy and microanalysis:
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York
Oxford University Press
1995
|
Schriftenreihe: | Oxford series in optical and imaging sciences
9 |
Schlagworte: | |
Beschreibung: | viii, 216 p. |
ISBN: | 0195088743 9780195088748 |
Internformat
MARC
LEADER | 00000nmm a2200000zcb4500 | ||
---|---|---|---|
001 | BV044842176 | ||
003 | DE-604 | ||
005 | 20180305 | ||
007 | cr|uuu---uuuuu | ||
008 | 180305s1995 |||| o||u| ||||||eng d | ||
020 | |a 0195088743 |c acidfree paper |9 0-19-508874-3 | ||
020 | |a 9780195088748 |9 978-0-19-508874-8 | ||
035 | |a (ZDB-38-ESG)ebr10358552 | ||
035 | |a (OCoLC)435816746 | ||
035 | |a (DE-599)BVBBV044842176 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
082 | 0 | |a 502/.8/25 |2 20 | |
100 | 1 | |a Joy, David C. |d 1943- |e Verfasser |4 aut | |
245 | 1 | 0 | |a Monte Carlo modeling for electron microscopy and microanalysis |c David C. Joy |
264 | 1 | |a New York |b Oxford University Press |c 1995 | |
300 | |a viii, 216 p. | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
490 | 0 | |a Oxford series in optical and imaging sciences |v 9 | |
505 | 8 | |a Includes bibliographical references | |
650 | 4 | |a Electron microscopy |x Computer simulation | |
650 | 4 | |a Electron probe microanalysis |x Computer simulation | |
650 | 4 | |a Monte Carlo method | |
650 | 0 | 7 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Elektronenstrahlmikroanalyse |0 (DE-588)4151898-6 |D s |
689 | 0 | 1 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
689 | 1 | 0 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
689 | 1 | 1 | |a Monte-Carlo-Simulation |0 (DE-588)4240945-7 |D s |
689 | 1 | |8 2\p |5 DE-604 | |
912 | |a ZDB-38-ESG | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-030237038 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804178351554822144 |
---|---|
any_adam_object | |
author | Joy, David C. 1943- |
author_facet | Joy, David C. 1943- |
author_role | aut |
author_sort | Joy, David C. 1943- |
author_variant | d c j dc dcj |
building | Verbundindex |
bvnumber | BV044842176 |
collection | ZDB-38-ESG |
contents | Includes bibliographical references |
ctrlnum | (ZDB-38-ESG)ebr10358552 (OCoLC)435816746 (DE-599)BVBBV044842176 |
dewey-full | 502/.8/25 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 502 - Miscellany |
dewey-raw | 502/.8/25 |
dewey-search | 502/.8/25 |
dewey-sort | 3502 18 225 |
dewey-tens | 500 - Natural sciences and mathematics |
discipline | Allgemeine Naturwissenschaft |
format | Electronic eBook |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01859nmm a2200481zcb4500</leader><controlfield tag="001">BV044842176</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s1995 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0195088743</subfield><subfield code="c">acidfree paper</subfield><subfield code="9">0-19-508874-3</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780195088748</subfield><subfield code="9">978-0-19-508874-8</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10358552</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)435816746</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044842176</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">502/.8/25</subfield><subfield code="2">20</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Joy, David C.</subfield><subfield code="d">1943-</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Monte Carlo modeling for electron microscopy and microanalysis</subfield><subfield code="c">David C. Joy</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Oxford University Press</subfield><subfield code="c">1995</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">viii, 216 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Oxford series in optical and imaging sciences</subfield><subfield code="v">9</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield><subfield code="x">Computer simulation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron probe microanalysis</subfield><subfield code="x">Computer simulation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Monte Carlo method</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenstrahlmikroanalyse</subfield><subfield code="0">(DE-588)4151898-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Monte-Carlo-Simulation</subfield><subfield code="0">(DE-588)4240945-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030237038</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
id | DE-604.BV044842176 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:02:36Z |
institution | BVB |
isbn | 0195088743 9780195088748 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030237038 |
oclc_num | 435816746 |
open_access_boolean | |
physical | viii, 216 p. |
psigel | ZDB-38-ESG |
publishDate | 1995 |
publishDateSearch | 1995 |
publishDateSort | 1995 |
publisher | Oxford University Press |
record_format | marc |
series2 | Oxford series in optical and imaging sciences |
spelling | Joy, David C. 1943- Verfasser aut Monte Carlo modeling for electron microscopy and microanalysis David C. Joy New York Oxford University Press 1995 viii, 216 p. txt rdacontent c rdamedia cr rdacarrier Oxford series in optical and imaging sciences 9 Includes bibliographical references Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Monte-Carlo-Simulation (DE-588)4240945-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Monte-Carlo-Simulation (DE-588)4240945-7 s 1\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 2\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Joy, David C. 1943- Monte Carlo modeling for electron microscopy and microanalysis Includes bibliographical references Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
subject_GND | (DE-588)4240945-7 (DE-588)4014327-2 (DE-588)4151898-6 |
title | Monte Carlo modeling for electron microscopy and microanalysis |
title_auth | Monte Carlo modeling for electron microscopy and microanalysis |
title_exact_search | Monte Carlo modeling for electron microscopy and microanalysis |
title_full | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
title_fullStr | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
title_full_unstemmed | Monte Carlo modeling for electron microscopy and microanalysis David C. Joy |
title_short | Monte Carlo modeling for electron microscopy and microanalysis |
title_sort | monte carlo modeling for electron microscopy and microanalysis |
topic | Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Monte-Carlo-Simulation (DE-588)4240945-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd |
topic_facet | Electron microscopy Computer simulation Electron probe microanalysis Computer simulation Monte Carlo method Monte-Carlo-Simulation Elektronenmikroskopie Elektronenstrahlmikroanalyse |
work_keys_str_mv | AT joydavidc montecarlomodelingforelectronmicroscopyandmicroanalysis |