Transient-induced latchup in CMOS integrated circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Singapore
Wiley
c2009
|
| Schlagworte: | |
| Beschreibung: | xiii, 249 p. |
| ISBN: | 9780470824078 |
Internformat
MARC
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| 008 | 180305s2009 |||| o||u| ||||||eng d | ||
| 020 | |a 9780470824078 |c cloth |9 978-0-470-82407-8 | ||
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| 100 | 1 | |a Ker, Ming-Dou |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Transient-induced latchup in CMOS integrated circuits |c Ming-Dou Ker and Sheng-Fu Hsu |
| 264 | 1 | |a Singapore |b Wiley |c c2009 | |
| 300 | |a xiii, 249 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Defects | |
| 650 | 4 | |a Metal oxide semiconductors, Complementary |x Reliability | |
| 700 | 1 | |a Hsu, Sheng-Fu |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030236512 | ||
Datensatz im Suchindex
| _version_ | 1804178350651998208 |
|---|---|
| any_adam_object | |
| author | Ker, Ming-Dou |
| author_facet | Ker, Ming-Dou |
| author_role | aut |
| author_sort | Ker, Ming-Dou |
| author_variant | m d k mdk |
| building | Verbundindex |
| bvnumber | BV044841650 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10325826 (OCoLC)669008259 (DE-599)BVBBV044841650 |
| format | Electronic eBook |
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| id | DE-604.BV044841650 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:35Z |
| institution | BVB |
| isbn | 9780470824078 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030236512 |
| oclc_num | 669008259 |
| open_access_boolean | |
| physical | xiii, 249 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | Wiley |
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| spelling | Ker, Ming-Dou Verfasser aut Transient-induced latchup in CMOS integrated circuits Ming-Dou Ker and Sheng-Fu Hsu Singapore Wiley c2009 xiii, 249 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability Hsu, Sheng-Fu Sonstige oth |
| spellingShingle | Ker, Ming-Dou Transient-induced latchup in CMOS integrated circuits Includes bibliographical references and index Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability |
| title | Transient-induced latchup in CMOS integrated circuits |
| title_auth | Transient-induced latchup in CMOS integrated circuits |
| title_exact_search | Transient-induced latchup in CMOS integrated circuits |
| title_full | Transient-induced latchup in CMOS integrated circuits Ming-Dou Ker and Sheng-Fu Hsu |
| title_fullStr | Transient-induced latchup in CMOS integrated circuits Ming-Dou Ker and Sheng-Fu Hsu |
| title_full_unstemmed | Transient-induced latchup in CMOS integrated circuits Ming-Dou Ker and Sheng-Fu Hsu |
| title_short | Transient-induced latchup in CMOS integrated circuits |
| title_sort | transient induced latchup in cmos integrated circuits |
| topic | Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability |
| topic_facet | Metal oxide semiconductors, Complementary Defects Metal oxide semiconductors, Complementary Reliability |
| work_keys_str_mv | AT kermingdou transientinducedlatchupincmosintegratedcircuits AT hsushengfu transientinducedlatchupincmosintegratedcircuits |