ISTFA '97: proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c1997
|
| Schlagworte: | |
| Beschreibung: | "Manager of Book Production Grace M. Davidson." |
| Beschreibung: | xix, 346 p. |
| ISBN: | 9780871706195 0871706199 |
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| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 1997, Santa Clara, Calif.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA '97 |b proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |c sponsored by ASM International |
| 246 | 1 | 3 | |a 23rd international symposium for testing and failure analysis |
| 264 | 1 | |a Materials Park, OH |b ASM International |c c1997 | |
| 300 | |a xix, 346 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 500 | |a "Manager of Book Production Grace M. Davidson." | ||
| 505 | 8 | |a Includes bibliographic references and index | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
| 650 | 0 | 7 | |a Elektronik |0 (DE-588)4014346-6 |2 gnd |9 rswk-swf |
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| 700 | 1 | |a Davidson, Grace M. |e Sonstige |4 oth | |
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Datensatz im Suchindex
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| author_corporate_role | aut |
| author_facet | International Symposium for Testing and Failure Analysis < 1997, Santa Clara, Calif.> |
| author_sort | International Symposium for Testing and Failure Analysis < 1997, Santa Clara, Calif.> |
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| contents | Includes bibliographic references and index |
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| id | DE-604.BV044841636 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:35Z |
| institution | BVB |
| isbn | 9780871706195 0871706199 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030236498 |
| oclc_num | 646817812 |
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| physical | xix, 346 p. |
| psigel | ZDB-38-ESG |
| publishDate | 1997 |
| publishDateSearch | 1997 |
| publishDateSort | 1997 |
| publisher | ASM International |
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| spelling | International Symposium for Testing and Failure Analysis < 1997, Santa Clara, Calif.> Verfasser aut ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California sponsored by ASM International 23rd international symposium for testing and failure analysis Materials Park, OH ASM International c1997 xix, 346 p. txt rdacontent c rdamedia cr rdacarrier "Manager of Book Production Grace M. Davidson." Includes bibliographic references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 Davidson, Grace M. Sonstige oth ASM International Sonstige oth |
| spellingShingle | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California Includes bibliographic references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4014346-6 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |
| title_alt | 23rd international symposium for testing and failure analysis |
| title_auth | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |
| title_exact_search | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |
| title_full | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California sponsored by ASM International |
| title_fullStr | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California sponsored by ASM International |
| title_full_unstemmed | ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California sponsored by ASM International |
| title_short | ISTFA '97 |
| title_sort | istfa 97 proceedings of the 23rd international symposium for testing and failure analysis 27 31 october 1997 santa clara convention center santa clara california |
| title_sub | proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik Prüftechnik Konferenzschrift |
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