ISTFA 2005: Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c2005
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| Schlagworte: | |
| Beschreibung: | xviii, 524 p. |
| ISBN: | 087170823X |
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| 110 | 2 | |a International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.> |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ISTFA 2005 |b Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |c sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| 264 | 1 | |a Materials Park, OH |b ASM International |c c2005 | |
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| 336 | |b txt |2 rdacontent | ||
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| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Congresses | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Congresses | |
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Datensatz im Suchindex
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| contents | Includes bibliographical references and index |
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| isbn | 087170823X |
| language | English |
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| spelling | International Symposium for Testing and Failure Analysis < 2005, San Jose, Calif.> Verfasser aut ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International Materials Park, OH ASM International c2005 xviii, 524 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronik (DE-588)4014346-6 s Prüftechnik (DE-588)4047610-8 s DE-604 ASM International Sonstige (DE-588)5013969-1 oth Electronic Device Failure Analysis Society Sonstige (DE-588)6015594-2 oth |
| spellingShingle | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California Includes bibliographical references and index Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| subject_GND | (DE-588)4014346-6 (DE-588)4047610-8 (DE-588)1071861417 |
| title | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_auth | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_exact_search | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |
| title_full | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_fullStr | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_full_unstemmed | ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California sponsored by EDFAS--Electronic Device Failure Analysis Society, ISTFA/2005, ASTM International |
| title_short | ISTFA 2005 |
| title_sort | istfa 2005 proceedings of the 31st international symposium for testing and failure analysis november 6 10 2005 mcenery convention center san jose california |
| title_sub | Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California |
| topic | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik (DE-588)4014346-6 gnd Prüftechnik (DE-588)4047610-8 gnd |
| topic_facet | Electronics Materials Testing Congresses Electronic apparatus and appliances Testing Congresses Elektronik Prüftechnik Konferenzschrift |
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