Microelectronic failure analysis: desk reference : 2001 supplement
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Materials Park, OH
ASM International
c2001
|
| Schlagworte: | |
| Beschreibung: | v, 171 p. |
| ISBN: | 9780871707451 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044841549 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2001 |||| o||u| ||||||eng d | ||
| 020 | |a 9780871707451 |9 978-0-87170-745-1 | ||
| 035 | |a (ZDB-38-ESG)ebr10320372 | ||
| 035 | |a (OCoLC)647829197 | ||
| 035 | |a (DE-599)BVBBV044841549 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 245 | 1 | 0 | |a Microelectronic failure analysis |b desk reference : 2001 supplement |c prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| 264 | 1 | |a Materials Park, OH |b ASM International |c c2001 | |
| 300 | |a v, 171 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Electronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Microelectronics |x Materials |x Defects |v Handbooks, manuals, etc | |
| 650 | 4 | |a Electronic apparatus and appliances |x Testing |v Handbooks, manuals, etc | |
| 650 | 4 | |a Semiconductors |x Defects |v Handbooks, manuals, etc | |
| 710 | 2 | |a Electronic Device Failure Analysis Society |e Sonstige |4 oth | |
| 776 | 0 | 8 | |i Erscheint auch als |n Druck-Ausgabe, Paperback |z 0-87170-745-4 |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030236411 | ||
Datensatz im Suchindex
| _version_ | 1804178350467448832 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044841549 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10320372 (OCoLC)647829197 (DE-599)BVBBV044841549 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01429nmm a2200349zc 4500</leader><controlfield tag="001">BV044841549</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s2001 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780871707451</subfield><subfield code="9">978-0-87170-745-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10320372</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)647829197</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044841549</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Microelectronic failure analysis</subfield><subfield code="b">desk reference : 2001 supplement</subfield><subfield code="c">prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Materials Park, OH</subfield><subfield code="b">ASM International</subfield><subfield code="c">c2001</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">v, 171 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Microelectronics</subfield><subfield code="x">Materials</subfield><subfield code="x">Defects</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electronic apparatus and appliances</subfield><subfield code="x">Testing</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Defects</subfield><subfield code="v">Handbooks, manuals, etc</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Electronic Device Failure Analysis Society</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="776" ind1="0" ind2="8"><subfield code="i">Erscheint auch als</subfield><subfield code="n">Druck-Ausgabe, Paperback</subfield><subfield code="z">0-87170-745-4</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030236411</subfield></datafield></record></collection> |
| id | DE-604.BV044841549 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:35Z |
| institution | BVB |
| isbn | 9780871707451 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030236411 |
| oclc_num | 647829197 |
| open_access_boolean | |
| physical | v, 171 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2001 |
| publishDateSearch | 2001 |
| publishDateSort | 2001 |
| publisher | ASM International |
| record_format | marc |
| spelling | Microelectronic failure analysis desk reference : 2001 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee Materials Park, OH ASM International c2001 v, 171 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc Electronic Device Failure Analysis Society Sonstige oth Erscheint auch als Druck-Ausgabe, Paperback 0-87170-745-4 |
| spellingShingle | Microelectronic failure analysis desk reference : 2001 supplement Includes bibliographical references and index Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| title | Microelectronic failure analysis desk reference : 2001 supplement |
| title_auth | Microelectronic failure analysis desk reference : 2001 supplement |
| title_exact_search | Microelectronic failure analysis desk reference : 2001 supplement |
| title_full | Microelectronic failure analysis desk reference : 2001 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_fullStr | Microelectronic failure analysis desk reference : 2001 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_full_unstemmed | Microelectronic failure analysis desk reference : 2001 supplement prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee |
| title_short | Microelectronic failure analysis |
| title_sort | microelectronic failure analysis desk reference 2001 supplement |
| title_sub | desk reference : 2001 supplement |
| topic | Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| topic_facet | Electronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Testing Handbooks, manuals, etc Microelectronics Materials Defects Handbooks, manuals, etc Electronic apparatus and appliances Testing Handbooks, manuals, etc Semiconductors Defects Handbooks, manuals, etc |
| work_keys_str_mv | AT electronicdevicefailureanalysissociety microelectronicfailureanalysisdeskreference2001supplement |