ESD: failure mechanisms and models
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Chichester, West Sussex, U.K.
J. Wiley
2009
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| Schlagworte: | |
| Beschreibung: | xxiv, 384 p |
| ISBN: | 9780470511374 |
Internformat
MARC
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| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2009 |||| o||u| ||||||eng d | ||
| 020 | |a 9780470511374 |c cloth |9 978-0-470-51137-4 | ||
| 035 | |a (ZDB-38-ESG)ebr10317806 | ||
| 035 | |a (OCoLC)441888589 | ||
| 035 | |a (DE-599)BVBBV044841377 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.381 |2 22 | |
| 100 | 1 | |a Voldman, Steven H. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a ESD |b failure mechanisms and models |c Steven H. Voldman |
| 246 | 1 | 3 | |a Electrostatic discharge |
| 264 | 1 | |a Chichester, West Sussex, U.K. |b J. Wiley |c 2009 | |
| 300 | |a xxiv, 384 p | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Semiconductors |x Failures | |
| 650 | 4 | |a Integrated circuits |x Protection | |
| 650 | 4 | |a Integrated circuits |x Testing | |
| 650 | 4 | |a Integrated circuits |x Reliability | |
| 650 | 4 | |a Electric discharges | |
| 650 | 4 | |a Electrostatics | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030236239 | ||
Datensatz im Suchindex
| _version_ | 1804178350167556096 |
|---|---|
| any_adam_object | |
| author | Voldman, Steven H. |
| author_facet | Voldman, Steven H. |
| author_role | aut |
| author_sort | Voldman, Steven H. |
| author_variant | s h v sh shv |
| building | Verbundindex |
| bvnumber | BV044841377 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10317806 (OCoLC)441888589 (DE-599)BVBBV044841377 |
| dewey-full | 621.381 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381 |
| dewey-search | 621.381 |
| dewey-sort | 3621.381 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044841377 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:34Z |
| institution | BVB |
| isbn | 9780470511374 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030236239 |
| oclc_num | 441888589 |
| open_access_boolean | |
| physical | xxiv, 384 p |
| psigel | ZDB-38-ESG |
| publishDate | 2009 |
| publishDateSearch | 2009 |
| publishDateSort | 2009 |
| publisher | J. Wiley |
| record_format | marc |
| spelling | Voldman, Steven H. Verfasser aut ESD failure mechanisms and models Steven H. Voldman Electrostatic discharge Chichester, West Sussex, U.K. J. Wiley 2009 xxiv, 384 p txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references and index Semiconductors Failures Integrated circuits Protection Integrated circuits Testing Integrated circuits Reliability Electric discharges Electrostatics |
| spellingShingle | Voldman, Steven H. ESD failure mechanisms and models Includes bibliographical references and index Semiconductors Failures Integrated circuits Protection Integrated circuits Testing Integrated circuits Reliability Electric discharges Electrostatics |
| title | ESD failure mechanisms and models |
| title_alt | Electrostatic discharge |
| title_auth | ESD failure mechanisms and models |
| title_exact_search | ESD failure mechanisms and models |
| title_full | ESD failure mechanisms and models Steven H. Voldman |
| title_fullStr | ESD failure mechanisms and models Steven H. Voldman |
| title_full_unstemmed | ESD failure mechanisms and models Steven H. Voldman |
| title_short | ESD |
| title_sort | esd failure mechanisms and models |
| title_sub | failure mechanisms and models |
| topic | Semiconductors Failures Integrated circuits Protection Integrated circuits Testing Integrated circuits Reliability Electric discharges Electrostatics |
| topic_facet | Semiconductors Failures Integrated circuits Protection Integrated circuits Testing Integrated circuits Reliability Electric discharges Electrostatics |
| work_keys_str_mv | AT voldmanstevenh esdfailuremechanismsandmodels AT voldmanstevenh electrostaticdischarge |