Verfügbarkeit: High-resolution electron microscopy

High-resolution electron microscopy:

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Bibliographische Detailangaben
1. Verfasser:	Spence, John C. H. (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	New York Oxford University Press 2009
Schriftenreihe:	Monographs on the physics and chemistry of materials
Schlagworte:	Transmission electron microscopes Electron microscopy Festkörper Hochauflösendes Verfahren Elektronenmikroskopie Struktur Elektronenbeugung Durchstrahlungselektronenmikroskopie
Beschreibung:	xvii, 401, [4] p.
ISBN:	9780199552757

Internformat

MARC


LEADER	00000nmm a2200000zc 4500
001	BV044840535
003	DE-604
005	20180305
007	cr\|uuu---uuuuu
008	180305s2009 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
020			\|a 9780199552757 \|9 978-0-19-955275-7
035			\|a (ZDB-38-ESG)ebr10278576
035			\|a (OCoLC)646799799
035			\|a (DE-599)BVBBV044840535
040			\|a DE-604 \|b ger \|e aacr
041	0		\|a eng
100	1		\|a Spence, John C. H. \|e Verfasser \|4 aut
245	1	0	\|a High-resolution electron microscopy \|c John C.H. Spence
264		1	\|a New York \|b Oxford University Press \|c 2009
300			\|a xvii, 401, [4] p.
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
490	0		\|a Monographs on the physics and chemistry of materials
505	8		\|a Includes bibliographies and index
650		4	\|a Transmission electron microscopes
650		4	\|a Electron microscopy
650	0	7	\|a Festkörper \|0 (DE-588)4016918-2 \|2 gnd \|9 rswk-swf
650	0	7	\|a Hochauflösendes Verfahren \|0 (DE-588)4287503-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a Elektronenmikroskopie \|0 (DE-588)4014327-2 \|2 gnd \|9 rswk-swf
650	0	7	\|a Struktur \|0 (DE-588)4058125-1 \|2 gnd \|9 rswk-swf
650	0	7	\|a Elektronenbeugung \|0 (DE-588)4151862-7 \|2 gnd \|9 rswk-swf
650	0	7	\|a Durchstrahlungselektronenmikroskopie \|0 (DE-588)4215608-7 \|2 gnd \|9 rswk-swf
689	0	0	\|a Elektronenmikroskopie \|0 (DE-588)4014327-2 \|D s
689	0	1	\|a Hochauflösendes Verfahren \|0 (DE-588)4287503-1 \|D s
689	0		\|8 1\p \|5 DE-604
689	1	0	\|a Durchstrahlungselektronenmikroskopie \|0 (DE-588)4215608-7 \|D s
689	1		\|8 2\p \|5 DE-604
689	2	0	\|a Struktur \|0 (DE-588)4058125-1 \|D s
689	2		\|8 3\p \|5 DE-604
689	3	0	\|a Festkörper \|0 (DE-588)4016918-2 \|D s
689	3		\|8 4\p \|5 DE-604
689	4	0	\|a Elektronenbeugung \|0 (DE-588)4151862-7 \|D s
689	4		\|8 5\p \|5 DE-604
912			\|a ZDB-38-ESG
999			\|a oai:aleph.bib-bvb.de:BVB01-030235398
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 2\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 3\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 4\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 5\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk

Datensatz im Suchindex

_version_	1804178348679626752
any_adam_object
author	Spence, John C. H.
author_facet	Spence, John C. H.
author_role	aut
author_sort	Spence, John C. H.
author_variant	j c h s jch jchs
building	Verbundindex
bvnumber	BV044840535
collection	ZDB-38-ESG
contents	Includes bibliographies and index
ctrlnum	(ZDB-38-ESG)ebr10278576 (OCoLC)646799799 (DE-599)BVBBV044840535
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02328nmm a2200577zc 4500</leader><controlfield tag="001">BV044840535</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">180305s2009 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9780199552757</subfield><subfield code="9">978-0-19-955275-7</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10278576</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)646799799</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044840535</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Spence, John C. H.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">High-resolution electron microscopy</subfield><subfield code="c">John C.H. Spence</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Oxford University Press</subfield><subfield code="c">2009</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xvii, 401, [4] p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Monographs on the physics and chemistry of materials</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographies and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Transmission electron microscopes</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Electron microscopy</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Festkörper</subfield><subfield code="0">(DE-588)4016918-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hochauflösendes Verfahren</subfield><subfield code="0">(DE-588)4287503-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Struktur</subfield><subfield code="0">(DE-588)4058125-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenbeugung</subfield><subfield code="0">(DE-588)4151862-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Hochauflösendes Verfahren</subfield><subfield code="0">(DE-588)4287503-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Struktur</subfield><subfield code="0">(DE-588)4058125-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Festkörper</subfield><subfield code="0">(DE-588)4016918-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Elektronenbeugung</subfield><subfield code="0">(DE-588)4151862-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030235398</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection>
id	DE-604.BV044840535
illustrated	Not Illustrated
indexdate	2024-07-10T08:02:33Z
institution	BVB
isbn	9780199552757
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-030235398
oclc_num	646799799
open_access_boolean
physical	xvii, 401, [4] p.
psigel	ZDB-38-ESG
publishDate	2009
publishDateSearch	2009
publishDateSort	2009
publisher	Oxford University Press
record_format	marc
series2	Monographs on the physics and chemistry of materials
spelling	Spence, John C. H. Verfasser aut High-resolution electron microscopy John C.H. Spence New York Oxford University Press 2009 xvii, 401, [4] p. txt rdacontent c rdamedia cr rdacarrier Monographs on the physics and chemistry of materials Includes bibliographies and index Transmission electron microscopes Electron microscopy Festkörper (DE-588)4016918-2 gnd rswk-swf Hochauflösendes Verfahren (DE-588)4287503-1 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Struktur (DE-588)4058125-1 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s Hochauflösendes Verfahren (DE-588)4287503-1 s 1\p DE-604 Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 2\p DE-604 Struktur (DE-588)4058125-1 s 3\p DE-604 Festkörper (DE-588)4016918-2 s 4\p DE-604 Elektronenbeugung (DE-588)4151862-7 s 5\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Spence, John C. H. High-resolution electron microscopy Includes bibliographies and index Transmission electron microscopes Electron microscopy Festkörper (DE-588)4016918-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Struktur (DE-588)4058125-1 gnd Elektronenbeugung (DE-588)4151862-7 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd
subject_GND	(DE-588)4016918-2 (DE-588)4287503-1 (DE-588)4014327-2 (DE-588)4058125-1 (DE-588)4151862-7 (DE-588)4215608-7
title	High-resolution electron microscopy
title_auth	High-resolution electron microscopy
title_exact_search	High-resolution electron microscopy
title_full	High-resolution electron microscopy John C.H. Spence
title_fullStr	High-resolution electron microscopy John C.H. Spence
title_full_unstemmed	High-resolution electron microscopy John C.H. Spence
title_short	High-resolution electron microscopy
title_sort	high resolution electron microscopy
topic	Transmission electron microscopes Electron microscopy Festkörper (DE-588)4016918-2 gnd Hochauflösendes Verfahren (DE-588)4287503-1 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Struktur (DE-588)4058125-1 gnd Elektronenbeugung (DE-588)4151862-7 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd
topic_facet	Transmission electron microscopes Electron microscopy Festkörper Hochauflösendes Verfahren Elektronenmikroskopie Struktur Elektronenbeugung Durchstrahlungselektronenmikroskopie
work_keys_str_mv	AT spencejohnch highresolutionelectronmicroscopy

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