Terrestrial neutron-induced soft errors in advanced memory devices:
Saved in:
| Format: | Electronic eBook |
|---|---|
| Language: | English |
| Published: |
Hackensack, NJ
World Scientific
c2008
|
| Subjects: | |
| Physical Description: | xxii, 343 p. |
| ISBN: | 9789812778819 9812778810 |
Staff View
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044839673 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2008 |||| o||u| ||||||eng d | ||
| 020 | |a 9789812778819 |9 978-981-277-881-9 | ||
| 020 | |a 9812778810 |9 981-277-881-0 | ||
| 035 | |a (ZDB-38-ESG)ebr10255560 | ||
| 035 | |a (OCoLC)560636099 | ||
| 035 | |a (DE-599)BVBBV044839673 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 245 | 1 | 0 | |a Terrestrial neutron-induced soft errors in advanced memory devices |c Takashi Nakamura ... [et al.] |
| 264 | 1 | |a Hackensack, NJ |b World Scientific |c c2008 | |
| 300 | |a xxii, 343 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 505 | 8 | |a Includes bibliographical references (p. 291-315) and index | |
| 650 | 4 | |a Semiconductor storage devices | |
| 650 | 4 | |a Neutron irradiation | |
| 650 | 4 | |a Radiation dosimetry | |
| 650 | 4 | |a Nuclear physics | |
| 700 | 1 | |a Nakamura, Takashi |d 1939- |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030234536 | ||
Record in the Search Index
| _version_ | 1804178347058528256 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044839673 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references (p. 291-315) and index |
| ctrlnum | (ZDB-38-ESG)ebr10255560 (OCoLC)560636099 (DE-599)BVBBV044839673 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01086nmm a2200337zc 4500</leader><controlfield tag="001">BV044839673</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s2008 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812778819</subfield><subfield code="9">978-981-277-881-9</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9812778810</subfield><subfield code="9">981-277-881-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10255560</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)560636099</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044839673</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Terrestrial neutron-induced soft errors in advanced memory devices</subfield><subfield code="c">Takashi Nakamura ... [et al.]</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Hackensack, NJ</subfield><subfield code="b">World Scientific</subfield><subfield code="c">c2008</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xxii, 343 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references (p. 291-315) and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductor storage devices</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Neutron irradiation</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Radiation dosimetry</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Nuclear physics</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Nakamura, Takashi</subfield><subfield code="d">1939-</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030234536</subfield></datafield></record></collection> |
| id | DE-604.BV044839673 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:31Z |
| institution | BVB |
| isbn | 9789812778819 9812778810 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030234536 |
| oclc_num | 560636099 |
| open_access_boolean | |
| physical | xxii, 343 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2008 |
| publishDateSearch | 2008 |
| publishDateSort | 2008 |
| publisher | World Scientific |
| record_format | marc |
| spelling | Terrestrial neutron-induced soft errors in advanced memory devices Takashi Nakamura ... [et al.] Hackensack, NJ World Scientific c2008 xxii, 343 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (p. 291-315) and index Semiconductor storage devices Neutron irradiation Radiation dosimetry Nuclear physics Nakamura, Takashi 1939- Sonstige oth |
| spellingShingle | Terrestrial neutron-induced soft errors in advanced memory devices Includes bibliographical references (p. 291-315) and index Semiconductor storage devices Neutron irradiation Radiation dosimetry Nuclear physics |
| title | Terrestrial neutron-induced soft errors in advanced memory devices |
| title_auth | Terrestrial neutron-induced soft errors in advanced memory devices |
| title_exact_search | Terrestrial neutron-induced soft errors in advanced memory devices |
| title_full | Terrestrial neutron-induced soft errors in advanced memory devices Takashi Nakamura ... [et al.] |
| title_fullStr | Terrestrial neutron-induced soft errors in advanced memory devices Takashi Nakamura ... [et al.] |
| title_full_unstemmed | Terrestrial neutron-induced soft errors in advanced memory devices Takashi Nakamura ... [et al.] |
| title_short | Terrestrial neutron-induced soft errors in advanced memory devices |
| title_sort | terrestrial neutron induced soft errors in advanced memory devices |
| topic | Semiconductor storage devices Neutron irradiation Radiation dosimetry Nuclear physics |
| topic_facet | Semiconductor storage devices Neutron irradiation Radiation dosimetry Nuclear physics |
| work_keys_str_mv | AT nakamuratakashi terrestrialneutroninducedsofterrorsinadvancedmemorydevices |