Terrestrial neutron-induced soft errors in advanced memory devices:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Hackensack, NJ
World Scientific
c2008
|
| Schlagworte: | |
| Beschreibung: | xxii, 343 p. |
| ISBN: | 9789812778819 9812778810 |
Internformat
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| 245 | 1 | 0 | |a Terrestrial neutron-induced soft errors in advanced memory devices |c Takashi Nakamura ... [et al.] |
| 264 | 1 | |a Hackensack, NJ |b World Scientific |c c2008 | |
| 300 | |a xxii, 343 p. | ||
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| 505 | 8 | |a Includes bibliographical references (p. 291-315) and index | |
| 650 | 4 | |a Semiconductor storage devices | |
| 650 | 4 | |a Neutron irradiation | |
| 650 | 4 | |a Radiation dosimetry | |
| 650 | 4 | |a Nuclear physics | |
| 700 | 1 | |a Nakamura, Takashi |d 1939- |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030234536 | ||
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| contents | Includes bibliographical references (p. 291-315) and index |
| ctrlnum | (ZDB-38-ESG)ebr10255560 (OCoLC)560636099 (DE-599)BVBBV044839673 |
| format | Electronic eBook |
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| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:31Z |
| institution | BVB |
| isbn | 9789812778819 9812778810 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030234536 |
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| physical | xxii, 343 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2008 |
| publishDateSearch | 2008 |
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| publisher | World Scientific |
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| spelling | Terrestrial neutron-induced soft errors in advanced memory devices Takashi Nakamura ... [et al.] Hackensack, NJ World Scientific c2008 xxii, 343 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (p. 291-315) and index Semiconductor storage devices Neutron irradiation Radiation dosimetry Nuclear physics Nakamura, Takashi 1939- Sonstige oth |
| spellingShingle | Terrestrial neutron-induced soft errors in advanced memory devices Includes bibliographical references (p. 291-315) and index Semiconductor storage devices Neutron irradiation Radiation dosimetry Nuclear physics |
| title | Terrestrial neutron-induced soft errors in advanced memory devices |
| title_auth | Terrestrial neutron-induced soft errors in advanced memory devices |
| title_exact_search | Terrestrial neutron-induced soft errors in advanced memory devices |
| title_full | Terrestrial neutron-induced soft errors in advanced memory devices Takashi Nakamura ... [et al.] |
| title_fullStr | Terrestrial neutron-induced soft errors in advanced memory devices Takashi Nakamura ... [et al.] |
| title_full_unstemmed | Terrestrial neutron-induced soft errors in advanced memory devices Takashi Nakamura ... [et al.] |
| title_short | Terrestrial neutron-induced soft errors in advanced memory devices |
| title_sort | terrestrial neutron induced soft errors in advanced memory devices |
| topic | Semiconductor storage devices Neutron irradiation Radiation dosimetry Nuclear physics |
| topic_facet | Semiconductor storage devices Neutron irradiation Radiation dosimetry Nuclear physics |
| work_keys_str_mv | AT nakamuratakashi terrestrialneutroninducedsofterrorsinadvancedmemorydevices |