SiC materials and devices:
Gespeichert in:
| Format: | Elektronisch E-Book |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New Jersey
World Scientific
2007
|
| Schriftenreihe: | Selected topics in electronics and systems
v. 40 |
| Schlagworte: | |
| Beschreibung: | vii, 131 p. |
| ISBN: | 9789812703835 |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044837408 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2007 |||| o||u| ||||||eng d | ||
| 020 | |a 9789812703835 |9 978-981-270-383-5 | ||
| 035 | |a (ZDB-38-ESG)ebr10188789 | ||
| 035 | |a (OCoLC)648316985 | ||
| 035 | |a (DE-599)BVBBV044837408 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 245 | 1 | 0 | |a SiC materials and devices |c edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein |
| 264 | 1 | |a New Jersey |b World Scientific |c 2007 | |
| 300 | |a vii, 131 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Selected topics in electronics and systems |v v. 40 | |
| 505 | 8 | |a Includes bibliographical references | |
| 650 | 4 | |a Silicon carbide |x Electric properties | |
| 650 | 4 | |a Semiconductors | |
| 700 | 1 | |a Shur, Michael |e Sonstige |4 oth | |
| 700 | 1 | |a Rumyantsev, Sergey |e Sonstige |4 oth | |
| 700 | 1 | |a Levinshtein, M. E. |e Sonstige |4 oth | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030232271 | ||
Datensatz im Suchindex
| _version_ | 1804178343107493888 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV044837408 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references |
| ctrlnum | (ZDB-38-ESG)ebr10188789 (OCoLC)648316985 (DE-599)BVBBV044837408 |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01096nmm a2200337zcb4500</leader><controlfield tag="001">BV044837408</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s2007 |||| o||u| ||||||eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">9789812703835</subfield><subfield code="9">978-981-270-383-5</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10188789</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)648316985</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044837408</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">SiC materials and devices</subfield><subfield code="c">edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New Jersey</subfield><subfield code="b">World Scientific</subfield><subfield code="c">2007</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">vii, 131 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Selected topics in electronics and systems</subfield><subfield code="v">v. 40</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Silicon carbide</subfield><subfield code="x">Electric properties</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Shur, Michael</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Rumyantsev, Sergey</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Levinshtein, M. E.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030232271</subfield></datafield></record></collection> |
| id | DE-604.BV044837408 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:28Z |
| institution | BVB |
| isbn | 9789812703835 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030232271 |
| oclc_num | 648316985 |
| open_access_boolean | |
| physical | vii, 131 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2007 |
| publishDateSearch | 2007 |
| publishDateSort | 2007 |
| publisher | World Scientific |
| record_format | marc |
| series2 | Selected topics in electronics and systems |
| spelling | SiC materials and devices edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein New Jersey World Scientific 2007 vii, 131 p. txt rdacontent c rdamedia cr rdacarrier Selected topics in electronics and systems v. 40 Includes bibliographical references Silicon carbide Electric properties Semiconductors Shur, Michael Sonstige oth Rumyantsev, Sergey Sonstige oth Levinshtein, M. E. Sonstige oth |
| spellingShingle | SiC materials and devices Includes bibliographical references Silicon carbide Electric properties Semiconductors |
| title | SiC materials and devices |
| title_auth | SiC materials and devices |
| title_exact_search | SiC materials and devices |
| title_full | SiC materials and devices edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein |
| title_fullStr | SiC materials and devices edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein |
| title_full_unstemmed | SiC materials and devices edited by Michael Shur, Sergey Rumyantsev, Michael Levinshtein |
| title_short | SiC materials and devices |
| title_sort | sic materials and devices |
| topic | Silicon carbide Electric properties Semiconductors |
| topic_facet | Silicon carbide Electric properties Semiconductors |
| work_keys_str_mv | AT shurmichael sicmaterialsanddevices AT rumyantsevsergey sicmaterialsanddevices AT levinshteinme sicmaterialsanddevices |