Computing systems reliability: models and analysis
Gespeichert in:
1. Verfasser: | |
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Format: | Elektronisch E-Book |
Sprache: | English |
Veröffentlicht: |
New York
Kluwer Academic/Plenum Publishers
c2004
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Schlagworte: | |
Beschreibung: | xiii, 293 p. |
ISBN: | 0306486369 030648496X |
Internformat
MARC
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005 | 20180305 | ||
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008 | 180305s2004 |||| o||u| ||||||eng d | ||
020 | |a 0306486369 |9 0-306-48636-9 | ||
020 | |a 030648496X |9 0-306-48496-X | ||
035 | |a (ZDB-38-ESG)ebr10088550 | ||
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035 | |a (DE-599)BVBBV044833816 | ||
040 | |a DE-604 |b ger |e aacr | ||
041 | 0 | |a eng | |
082 | 0 | |a 004 |2 22 | |
100 | 1 | |a Xie, M. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Computing systems reliability |b models and analysis |c Min Xie, Yuan-Shum Dai, and Kim-Leng Poh |
264 | 1 | |a New York |b Kluwer Academic/Plenum Publishers |c c2004 | |
300 | |a xiii, 293 p. | ||
336 | |b txt |2 rdacontent | ||
337 | |b c |2 rdamedia | ||
338 | |b cr |2 rdacarrier | ||
505 | 8 | |a Includes bibliographical references (p. 275-289) and index | |
650 | 4 | |a Electronic digital computers |x Reliability | |
650 | 4 | |a Computers |x Reliability | |
700 | 1 | |a Dai, Yuan-Shun |e Sonstige |4 oth | |
700 | 1 | |a Poh, Kim-Leng |e Sonstige |4 oth | |
912 | |a ZDB-38-ESG | ||
999 | |a oai:aleph.bib-bvb.de:BVB01-030228679 |
Datensatz im Suchindex
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---|---|
any_adam_object | |
author | Xie, M. |
author_facet | Xie, M. |
author_role | aut |
author_sort | Xie, M. |
author_variant | m x mx |
building | Verbundindex |
bvnumber | BV044833816 |
collection | ZDB-38-ESG |
contents | Includes bibliographical references (p. 275-289) and index |
ctrlnum | (ZDB-38-ESG)ebr10088550 (OCoLC)55499480 (DE-599)BVBBV044833816 |
dewey-full | 004 |
dewey-hundreds | 000 - Computer science, information, general works |
dewey-ones | 004 - Computer science |
dewey-raw | 004 |
dewey-search | 004 |
dewey-sort | 14 |
dewey-tens | 000 - Computer science, information, general works |
discipline | Informatik |
format | Electronic eBook |
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id | DE-604.BV044833816 |
illustrated | Not Illustrated |
indexdate | 2024-07-10T08:02:21Z |
institution | BVB |
isbn | 0306486369 030648496X |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030228679 |
oclc_num | 55499480 |
open_access_boolean | |
physical | xiii, 293 p. |
psigel | ZDB-38-ESG |
publishDate | 2004 |
publishDateSearch | 2004 |
publishDateSort | 2004 |
publisher | Kluwer Academic/Plenum Publishers |
record_format | marc |
spelling | Xie, M. Verfasser aut Computing systems reliability models and analysis Min Xie, Yuan-Shum Dai, and Kim-Leng Poh New York Kluwer Academic/Plenum Publishers c2004 xiii, 293 p. txt rdacontent c rdamedia cr rdacarrier Includes bibliographical references (p. 275-289) and index Electronic digital computers Reliability Computers Reliability Dai, Yuan-Shun Sonstige oth Poh, Kim-Leng Sonstige oth |
spellingShingle | Xie, M. Computing systems reliability models and analysis Includes bibliographical references (p. 275-289) and index Electronic digital computers Reliability Computers Reliability |
title | Computing systems reliability models and analysis |
title_auth | Computing systems reliability models and analysis |
title_exact_search | Computing systems reliability models and analysis |
title_full | Computing systems reliability models and analysis Min Xie, Yuan-Shum Dai, and Kim-Leng Poh |
title_fullStr | Computing systems reliability models and analysis Min Xie, Yuan-Shum Dai, and Kim-Leng Poh |
title_full_unstemmed | Computing systems reliability models and analysis Min Xie, Yuan-Shum Dai, and Kim-Leng Poh |
title_short | Computing systems reliability |
title_sort | computing systems reliability models and analysis |
title_sub | models and analysis |
topic | Electronic digital computers Reliability Computers Reliability |
topic_facet | Electronic digital computers Reliability Computers Reliability |
work_keys_str_mv | AT xiem computingsystemsreliabilitymodelsandanalysis AT daiyuanshun computingsystemsreliabilitymodelsandanalysis AT pohkimleng computingsystemsreliabilitymodelsandanalysis |