Scanning force microscopy: with applications to electric, magnetic, and atomic forces
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Oxford University Press
1994
|
| Ausgabe: | Rev. ed |
| Schriftenreihe: | Oxford series in optical and imaging sciences
5 |
| Schlagworte: | |
| Beschreibung: | xiii, 263 p. |
Internformat
MARC
| LEADER | 00000nmm a2200000zcb4500 | ||
|---|---|---|---|
| 001 | BV044833746 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s1994 |||| o||u| ||||||eng d | ||
| 035 | |a (ZDB-38-ESG)ebr10087124 | ||
| 035 | |a (OCoLC)228117554 | ||
| 035 | |a (DE-599)BVBBV044833746 | ||
| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 100 | 1 | |a Sarid, Dror |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Scanning force microscopy |b with applications to electric, magnetic, and atomic forces |c Dror Sarid |
| 250 | |a Rev. ed | ||
| 264 | 1 | |a New York |b Oxford University Press |c 1994 | |
| 300 | |a xiii, 263 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Oxford series in optical and imaging sciences |v 5 | |
| 505 | 8 | |a Includes bibliographical references (p. 233-259) and index | |
| 650 | 4 | |a Scanning force microscopy | |
| 650 | 4 | |a Surfaces (Physics) | |
| 650 | 0 | 7 | |a Abtastsystem |0 (DE-588)4129844-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskop |0 (DE-588)4014326-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Tunneleffekt |0 (DE-588)4136216-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Rastertunnelmikroskopie |0 (DE-588)4252995-5 |D s |
| 689 | 0 | 1 | |a Festkörperoberfläche |0 (DE-588)4127823-9 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Rasterkraftmikroskopie |0 (DE-588)4274473-8 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 689 | 2 | 0 | |a Tunneleffekt |0 (DE-588)4136216-0 |D s |
| 689 | 2 | |8 3\p |5 DE-604 | |
| 689 | 3 | 0 | |a Elektronenmikroskop |0 (DE-588)4014326-0 |D s |
| 689 | 3 | |8 4\p |5 DE-604 | |
| 689 | 4 | 0 | |a Abtastsystem |0 (DE-588)4129844-5 |D s |
| 689 | 4 | |8 5\p |5 DE-604 | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030228609 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 4\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 5\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804178336438550528 |
|---|---|
| any_adam_object | |
| author | Sarid, Dror |
| author_facet | Sarid, Dror |
| author_role | aut |
| author_sort | Sarid, Dror |
| author_variant | d s ds |
| building | Verbundindex |
| bvnumber | BV044833746 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references (p. 233-259) and index |
| ctrlnum | (ZDB-38-ESG)ebr10087124 (OCoLC)228117554 (DE-599)BVBBV044833746 |
| edition | Rev. ed |
| format | Electronic eBook |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02329nmm a2200577zcb4500</leader><controlfield tag="001">BV044833746</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr|uuu---uuuuu</controlfield><controlfield tag="008">180305s1994 |||| o||u| ||||||eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10087124</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)228117554</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044833746</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sarid, Dror</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning force microscopy</subfield><subfield code="b">with applications to electric, magnetic, and atomic forces</subfield><subfield code="c">Dror Sarid</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Rev. ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Oxford University Press</subfield><subfield code="c">1994</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiii, 263 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Oxford series in optical and imaging sciences</subfield><subfield code="v">5</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references (p. 233-259) and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning force microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Abtastsystem</subfield><subfield code="0">(DE-588)4129844-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskop</subfield><subfield code="0">(DE-588)4014326-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Tunneleffekt</subfield><subfield code="0">(DE-588)4136216-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rastertunnelmikroskopie</subfield><subfield code="0">(DE-588)4252995-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rastertunnelmikroskopie</subfield><subfield code="0">(DE-588)4252995-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Tunneleffekt</subfield><subfield code="0">(DE-588)4136216-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Elektronenmikroskop</subfield><subfield code="0">(DE-588)4014326-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Abtastsystem</subfield><subfield code="0">(DE-588)4129844-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030228609</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV044833746 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:21Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030228609 |
| oclc_num | 228117554 |
| open_access_boolean | |
| physical | xiii, 263 p. |
| psigel | ZDB-38-ESG |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Oxford University Press |
| record_format | marc |
| series2 | Oxford series in optical and imaging sciences |
| spelling | Sarid, Dror Verfasser aut Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid Rev. ed New York Oxford University Press 1994 xiii, 263 p. txt rdacontent c rdamedia cr rdacarrier Oxford series in optical and imaging sciences 5 Includes bibliographical references (p. 233-259) and index Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 s Festkörperoberfläche (DE-588)4127823-9 s 1\p DE-604 Rasterkraftmikroskopie (DE-588)4274473-8 s 2\p DE-604 Tunneleffekt (DE-588)4136216-0 s 3\p DE-604 Elektronenmikroskop (DE-588)4014326-0 s 4\p DE-604 Abtastsystem (DE-588)4129844-5 s 5\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Sarid, Dror Scanning force microscopy with applications to electric, magnetic, and atomic forces Includes bibliographical references (p. 233-259) and index Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Tunneleffekt (DE-588)4136216-0 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| subject_GND | (DE-588)4129844-5 (DE-588)4014326-0 (DE-588)4136216-0 (DE-588)4127823-9 (DE-588)4252995-5 (DE-588)4274473-8 |
| title | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_auth | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_exact_search | Scanning force microscopy with applications to electric, magnetic, and atomic forces |
| title_full | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_fullStr | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_full_unstemmed | Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid |
| title_short | Scanning force microscopy |
| title_sort | scanning force microscopy with applications to electric magnetic and atomic forces |
| title_sub | with applications to electric, magnetic, and atomic forces |
| topic | Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Tunneleffekt (DE-588)4136216-0 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd |
| topic_facet | Scanning force microscopy Surfaces (Physics) Abtastsystem Elektronenmikroskop Tunneleffekt Festkörperoberfläche Rastertunnelmikroskopie Rasterkraftmikroskopie |
| work_keys_str_mv | AT sariddror scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces |