Verfügbarkeit: Scanning force microscopy

Scanning force microscopy: with applications to electric, magnetic, and atomic forces

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Bibliographische Detailangaben
1. Verfasser:	Sarid, Dror (VerfasserIn)
Format:	Elektronisch E-Book
Sprache:	English
Veröffentlicht:	New York Oxford University Press 1994
Ausgabe:	Rev. ed
Schriftenreihe:	Oxford series in optical and imaging sciences 5
Schlagworte:	Scanning force microscopy Surfaces (Physics) Abtastsystem Elektronenmikroskop Tunneleffekt Festkörperoberfläche Rastertunnelmikroskopie Rasterkraftmikroskopie
Beschreibung:	xiii, 263 p.

Internformat

MARC


LEADER	00000nmm a2200000zcb4500
001	BV044833746
003	DE-604
005	20180305
007	cr\|uuu---uuuuu
008	180305s1994 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d
035			\|a (ZDB-38-ESG)ebr10087124
035			\|a (OCoLC)228117554
035			\|a (DE-599)BVBBV044833746
040			\|a DE-604 \|b ger \|e aacr
041	0		\|a eng
100	1		\|a Sarid, Dror \|e Verfasser \|4 aut
245	1	0	\|a Scanning force microscopy \|b with applications to electric, magnetic, and atomic forces \|c Dror Sarid
250			\|a Rev. ed
264		1	\|a New York \|b Oxford University Press \|c 1994
300			\|a xiii, 263 p.
336			\|b txt \|2 rdacontent
337			\|b c \|2 rdamedia
338			\|b cr \|2 rdacarrier
490	0		\|a Oxford series in optical and imaging sciences \|v 5
505	8		\|a Includes bibliographical references (p. 233-259) and index
650		4	\|a Scanning force microscopy
650		4	\|a Surfaces (Physics)
650	0	7	\|a Abtastsystem \|0 (DE-588)4129844-5 \|2 gnd \|9 rswk-swf
650	0	7	\|a Elektronenmikroskop \|0 (DE-588)4014326-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Tunneleffekt \|0 (DE-588)4136216-0 \|2 gnd \|9 rswk-swf
650	0	7	\|a Festkörperoberfläche \|0 (DE-588)4127823-9 \|2 gnd \|9 rswk-swf
650	0	7	\|a Rastertunnelmikroskopie \|0 (DE-588)4252995-5 \|2 gnd \|9 rswk-swf
650	0	7	\|a Rasterkraftmikroskopie \|0 (DE-588)4274473-8 \|2 gnd \|9 rswk-swf
689	0	0	\|a Rastertunnelmikroskopie \|0 (DE-588)4252995-5 \|D s
689	0	1	\|a Festkörperoberfläche \|0 (DE-588)4127823-9 \|D s
689	0		\|8 1\p \|5 DE-604
689	1	0	\|a Rasterkraftmikroskopie \|0 (DE-588)4274473-8 \|D s
689	1		\|8 2\p \|5 DE-604
689	2	0	\|a Tunneleffekt \|0 (DE-588)4136216-0 \|D s
689	2		\|8 3\p \|5 DE-604
689	3	0	\|a Elektronenmikroskop \|0 (DE-588)4014326-0 \|D s
689	3		\|8 4\p \|5 DE-604
689	4	0	\|a Abtastsystem \|0 (DE-588)4129844-5 \|D s
689	4		\|8 5\p \|5 DE-604
912			\|a ZDB-38-ESG
999			\|a oai:aleph.bib-bvb.de:BVB01-030228609
883	1		\|8 1\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 2\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 3\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 4\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk
883	1		\|8 5\p \|a cgwrk \|d 20201028 \|q DE-101 \|u https://d-nb.info/provenance/plan#cgwrk

Datensatz im Suchindex

_version_	1804178336438550528
any_adam_object
author	Sarid, Dror
author_facet	Sarid, Dror
author_role	aut
author_sort	Sarid, Dror
author_variant	d s ds
building	Verbundindex
bvnumber	BV044833746
collection	ZDB-38-ESG
contents	Includes bibliographical references (p. 233-259) and index
ctrlnum	(ZDB-38-ESG)ebr10087124 (OCoLC)228117554 (DE-599)BVBBV044833746
edition	Rev. ed
format	Electronic eBook
fullrecord	<?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02329nmm a2200577zcb4500</leader><controlfield tag="001">BV044833746</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20180305 </controlfield><controlfield tag="007">cr\|uuu---uuuuu</controlfield><controlfield tag="008">180305s1994 \|\|\|\| o\|\|u\| \|\|\|\|\|\|eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(ZDB-38-ESG)ebr10087124</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)228117554</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV044833746</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">aacr</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sarid, Dror</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Scanning force microscopy</subfield><subfield code="b">with applications to electric, magnetic, and atomic forces</subfield><subfield code="c">Dror Sarid</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">Rev. ed</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Oxford University Press</subfield><subfield code="c">1994</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">xiii, 263 p.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">c</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">cr</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Oxford series in optical and imaging sciences</subfield><subfield code="v">5</subfield></datafield><datafield tag="505" ind1="8" ind2=" "><subfield code="a">Includes bibliographical references (p. 233-259) and index</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Scanning force microscopy</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Surfaces (Physics)</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Abtastsystem</subfield><subfield code="0">(DE-588)4129844-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskop</subfield><subfield code="0">(DE-588)4014326-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Tunneleffekt</subfield><subfield code="0">(DE-588)4136216-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rastertunnelmikroskopie</subfield><subfield code="0">(DE-588)4252995-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Rastertunnelmikroskopie</subfield><subfield code="0">(DE-588)4252995-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Festkörperoberfläche</subfield><subfield code="0">(DE-588)4127823-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Rasterkraftmikroskopie</subfield><subfield code="0">(DE-588)4274473-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Tunneleffekt</subfield><subfield code="0">(DE-588)4136216-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="3" ind2="0"><subfield code="a">Elektronenmikroskop</subfield><subfield code="0">(DE-588)4014326-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="3" ind2=" "><subfield code="8">4\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="4" ind2="0"><subfield code="a">Abtastsystem</subfield><subfield code="0">(DE-588)4129844-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="4" ind2=" "><subfield code="8">5\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="912" ind1=" " ind2=" "><subfield code="a">ZDB-38-ESG</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-030228609</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">4\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">5\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection>
id	DE-604.BV044833746
illustrated	Not Illustrated
indexdate	2024-07-10T08:02:21Z
institution	BVB
language	English
oai_aleph_id	oai:aleph.bib-bvb.de:BVB01-030228609
oclc_num	228117554
open_access_boolean
physical	xiii, 263 p.
psigel	ZDB-38-ESG
publishDate	1994
publishDateSearch	1994
publishDateSort	1994
publisher	Oxford University Press
record_format	marc
series2	Oxford series in optical and imaging sciences
spelling	Sarid, Dror Verfasser aut Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid Rev. ed New York Oxford University Press 1994 xiii, 263 p. txt rdacontent c rdamedia cr rdacarrier Oxford series in optical and imaging sciences 5 Includes bibliographical references (p. 233-259) and index Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd rswk-swf Elektronenmikroskop (DE-588)4014326-0 gnd rswk-swf Tunneleffekt (DE-588)4136216-0 gnd rswk-swf Festkörperoberfläche (DE-588)4127823-9 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 gnd rswk-swf Rasterkraftmikroskopie (DE-588)4274473-8 gnd rswk-swf Rastertunnelmikroskopie (DE-588)4252995-5 s Festkörperoberfläche (DE-588)4127823-9 s 1\p DE-604 Rasterkraftmikroskopie (DE-588)4274473-8 s 2\p DE-604 Tunneleffekt (DE-588)4136216-0 s 3\p DE-604 Elektronenmikroskop (DE-588)4014326-0 s 4\p DE-604 Abtastsystem (DE-588)4129844-5 s 5\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 4\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 5\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk
spellingShingle	Sarid, Dror Scanning force microscopy with applications to electric, magnetic, and atomic forces Includes bibliographical references (p. 233-259) and index Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Tunneleffekt (DE-588)4136216-0 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd
subject_GND	(DE-588)4129844-5 (DE-588)4014326-0 (DE-588)4136216-0 (DE-588)4127823-9 (DE-588)4252995-5 (DE-588)4274473-8
title	Scanning force microscopy with applications to electric, magnetic, and atomic forces
title_auth	Scanning force microscopy with applications to electric, magnetic, and atomic forces
title_exact_search	Scanning force microscopy with applications to electric, magnetic, and atomic forces
title_full	Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid
title_fullStr	Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid
title_full_unstemmed	Scanning force microscopy with applications to electric, magnetic, and atomic forces Dror Sarid
title_short	Scanning force microscopy
title_sort	scanning force microscopy with applications to electric magnetic and atomic forces
title_sub	with applications to electric, magnetic, and atomic forces
topic	Scanning force microscopy Surfaces (Physics) Abtastsystem (DE-588)4129844-5 gnd Elektronenmikroskop (DE-588)4014326-0 gnd Tunneleffekt (DE-588)4136216-0 gnd Festkörperoberfläche (DE-588)4127823-9 gnd Rastertunnelmikroskopie (DE-588)4252995-5 gnd Rasterkraftmikroskopie (DE-588)4274473-8 gnd
topic_facet	Scanning force microscopy Surfaces (Physics) Abtastsystem Elektronenmikroskop Tunneleffekt Festkörperoberfläche Rastertunnelmikroskopie Rasterkraftmikroskopie
work_keys_str_mv	AT sariddror scanningforcemicroscopywithapplicationstoelectricmagneticandatomicforces

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