High performance memory testing: design principles, fault modeling, and self-test
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Kluwer Academic
c2003
|
| Schriftenreihe: | Frontiers in electronic testing
|
| Schlagworte: | |
| Beschreibung: | xiii, 246 p. |
| ISBN: | 1402072554 |
Internformat
MARC
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|---|---|---|---|
| 001 | BV044832419 | ||
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| 005 | 20180305 | ||
| 007 | cr|uuu---uuuuu | ||
| 008 | 180305s2003 |||| o||u| ||||||eng d | ||
| 020 | |a 1402072554 |c alk. paper |9 1-4020-7255-4 | ||
| 035 | |a (ZDB-38-ESG)ebr10067254 | ||
| 035 | |a (OCoLC)229172199 | ||
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| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
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| 100 | 1 | |a Adams, R. Dean |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a High performance memory testing |b design principles, fault modeling, and self-test |c R. Dean Adams |
| 264 | 1 | |a Boston |b Kluwer Academic |c c2003 | |
| 300 | |a xiii, 246 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing | |
| 505 | 8 | |a Includes bibliographical references (p. [229]-239) and index | |
| 650 | 4 | |a Semiconductor storage devices |x Testing | |
| 650 | 4 | |a Computer storage devices |x Testing | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030227282 | ||
Datensatz im Suchindex
| _version_ | 1804178334242832384 |
|---|---|
| any_adam_object | |
| author | Adams, R. Dean |
| author_facet | Adams, R. Dean |
| author_role | aut |
| author_sort | Adams, R. Dean |
| author_variant | r d a rd rda |
| building | Verbundindex |
| bvnumber | BV044832419 |
| collection | ZDB-38-ESG |
| contents | Includes bibliographical references (p. [229]-239) and index |
| ctrlnum | (ZDB-38-ESG)ebr10067254 (OCoLC)229172199 (DE-599)BVBBV044832419 |
| dewey-full | 621.39/732 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/732 |
| dewey-search | 621.39/732 |
| dewey-sort | 3621.39 3732 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044832419 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:19Z |
| institution | BVB |
| isbn | 1402072554 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030227282 |
| oclc_num | 229172199 |
| open_access_boolean | |
| physical | xiii, 246 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Kluwer Academic |
| record_format | marc |
| series2 | Frontiers in electronic testing |
| spelling | Adams, R. Dean Verfasser aut High performance memory testing design principles, fault modeling, and self-test R. Dean Adams Boston Kluwer Academic c2003 xiii, 246 p. txt rdacontent c rdamedia cr rdacarrier Frontiers in electronic testing Includes bibliographical references (p. [229]-239) and index Semiconductor storage devices Testing Computer storage devices Testing |
| spellingShingle | Adams, R. Dean High performance memory testing design principles, fault modeling, and self-test Includes bibliographical references (p. [229]-239) and index Semiconductor storage devices Testing Computer storage devices Testing |
| title | High performance memory testing design principles, fault modeling, and self-test |
| title_auth | High performance memory testing design principles, fault modeling, and self-test |
| title_exact_search | High performance memory testing design principles, fault modeling, and self-test |
| title_full | High performance memory testing design principles, fault modeling, and self-test R. Dean Adams |
| title_fullStr | High performance memory testing design principles, fault modeling, and self-test R. Dean Adams |
| title_full_unstemmed | High performance memory testing design principles, fault modeling, and self-test R. Dean Adams |
| title_short | High performance memory testing |
| title_sort | high performance memory testing design principles fault modeling and self test |
| title_sub | design principles, fault modeling, and self-test |
| topic | Semiconductor storage devices Testing Computer storage devices Testing |
| topic_facet | Semiconductor storage devices Testing Computer storage devices Testing |
| work_keys_str_mv | AT adamsrdean highperformancememorytestingdesignprinciplesfaultmodelingandselftest |