CTL for test information of digital ICs:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
Boston
Kluwer Academic Publishers
2003
|
| Schlagworte: | |
| Beschreibung: | ix, 173 p. |
| ISBN: | 1402072937 |
Internformat
MARC
| LEADER | 00000nmm a2200000zc 4500 | ||
|---|---|---|---|
| 001 | BV044832388 | ||
| 003 | DE-604 | ||
| 005 | 20180305 | ||
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| 008 | 180305s2003 |||| o||u| ||||||eng d | ||
| 020 | |a 1402072937 |9 1-4020-7293-7 | ||
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| 035 | |a (OCoLC)614685999 | ||
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| 040 | |a DE-604 |b ger |e aacr | ||
| 041 | 0 | |a eng | |
| 082 | 0 | |a 621.3815/48 |2 21 | |
| 100 | 1 | |a Kapur, Rohit |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a CTL for test information of digital ICs |c by Rohit Kapur |
| 264 | 1 | |a Boston |b Kluwer Academic Publishers |c 2003 | |
| 300 | |a ix, 173 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 650 | 4 | |a Digital integrated circuits |x Testing |x Standards | |
| 650 | 4 | |a Computer hardware description languages | |
| 912 | |a ZDB-38-ESG | ||
| 999 | |a oai:aleph.bib-bvb.de:BVB01-030227251 | ||
Datensatz im Suchindex
| _version_ | 1804178334187257856 |
|---|---|
| any_adam_object | |
| author | Kapur, Rohit |
| author_facet | Kapur, Rohit |
| author_role | aut |
| author_sort | Kapur, Rohit |
| author_variant | r k rk |
| building | Verbundindex |
| bvnumber | BV044832388 |
| collection | ZDB-38-ESG |
| ctrlnum | (ZDB-38-ESG)ebr10067206 (OCoLC)614685999 (DE-599)BVBBV044832388 |
| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/48 |
| dewey-search | 621.3815/48 |
| dewey-sort | 3621.3815 248 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Electronic eBook |
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| id | DE-604.BV044832388 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:19Z |
| institution | BVB |
| isbn | 1402072937 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030227251 |
| oclc_num | 614685999 |
| open_access_boolean | |
| physical | ix, 173 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2003 |
| publishDateSearch | 2003 |
| publishDateSort | 2003 |
| publisher | Kluwer Academic Publishers |
| record_format | marc |
| spelling | Kapur, Rohit Verfasser aut CTL for test information of digital ICs by Rohit Kapur Boston Kluwer Academic Publishers 2003 ix, 173 p. txt rdacontent c rdamedia cr rdacarrier Digital integrated circuits Testing Standards Computer hardware description languages |
| spellingShingle | Kapur, Rohit CTL for test information of digital ICs Digital integrated circuits Testing Standards Computer hardware description languages |
| title | CTL for test information of digital ICs |
| title_auth | CTL for test information of digital ICs |
| title_exact_search | CTL for test information of digital ICs |
| title_full | CTL for test information of digital ICs by Rohit Kapur |
| title_fullStr | CTL for test information of digital ICs by Rohit Kapur |
| title_full_unstemmed | CTL for test information of digital ICs by Rohit Kapur |
| title_short | CTL for test information of digital ICs |
| title_sort | ctl for test information of digital ics |
| topic | Digital integrated circuits Testing Standards Computer hardware description languages |
| topic_facet | Digital integrated circuits Testing Standards Computer hardware description languages |
| work_keys_str_mv | AT kapurrohit ctlfortestinformationofdigitalics |