Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Elektronisch E-Book |
| Sprache: | English |
| Veröffentlicht: |
New York
Kluwer Academic
c2002
|
| Schriftenreihe: | Frontiers in electronic testing
17 |
| Schlagworte: | |
| Beschreibung: | xviii, 690 p. |
| ISBN: | 0306470403 |
Internformat
MARC
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| 100 | 1 | |a Bushnell, Michael L. |d 1950- |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |c Michael L. Bushnell, Vishwani D. Agrawal |
| 264 | 1 | |a New York |b Kluwer Academic |c c2002 | |
| 300 | |a xviii, 690 p. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b c |2 rdamedia | ||
| 338 | |b cr |2 rdacarrier | ||
| 490 | 0 | |a Frontiers in electronic testing |v 17 | |
| 505 | 8 | |a Includes bibliographical references and index | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 650 | 4 | |a Digital integrated circuits |x Testing | |
| 650 | 4 | |a Mixed signal circuits |x Testing | |
| 650 | 4 | |a Semiconductor storage devices |x Testing | |
| 650 | 0 | 7 | |a Elektronische Schaltung |0 (DE-588)4113419-9 |2 gnd |9 rswk-swf |
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| 700 | 1 | |a Agrawal, Vishwani D. |d 1943- |e Sonstige |4 oth | |
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Datensatz im Suchindex
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| author | Bushnell, Michael L. 1950- |
| author_facet | Bushnell, Michael L. 1950- |
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| author_sort | Bushnell, Michael L. 1950- |
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| collection | ZDB-38-ESG |
| contents | Includes bibliographical references and index |
| ctrlnum | (ZDB-38-ESG)ebr10053265 (OCoLC)70916145 (DE-599)BVBBV044831018 |
| format | Electronic eBook |
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| id | DE-604.BV044831018 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-10T08:02:17Z |
| institution | BVB |
| isbn | 0306470403 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-030225883 |
| oclc_num | 70916145 |
| open_access_boolean | |
| physical | xviii, 690 p. |
| psigel | ZDB-38-ESG |
| publishDate | 2002 |
| publishDateSearch | 2002 |
| publishDateSort | 2002 |
| publisher | Kluwer Academic |
| record_format | marc |
| series2 | Frontiers in electronic testing |
| spelling | Bushnell, Michael L. 1950- Verfasser aut Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Michael L. Bushnell, Vishwani D. Agrawal New York Kluwer Academic c2002 xviii, 690 p. txt rdacontent c rdamedia cr rdacarrier Frontiers in electronic testing 17 Includes bibliographical references and index Integrated circuits Very large scale integration Testing Digital integrated circuits Testing Mixed signal circuits Testing Semiconductor storage devices Testing Elektronische Schaltung (DE-588)4113419-9 gnd rswk-swf Prüftechnik (DE-588)4047610-8 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Elektronische Schaltung (DE-588)4113419-9 s VLSI (DE-588)4117388-0 s Prüftechnik (DE-588)4047610-8 s 1\p DE-604 Agrawal, Vishwani D. 1943- Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Bushnell, Michael L. 1950- Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Includes bibliographical references and index Integrated circuits Very large scale integration Testing Digital integrated circuits Testing Mixed signal circuits Testing Semiconductor storage devices Testing Elektronische Schaltung (DE-588)4113419-9 gnd Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4113419-9 (DE-588)4047610-8 (DE-588)4117388-0 |
| title | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |
| title_auth | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |
| title_exact_search | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |
| title_full | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Michael L. Bushnell, Vishwani D. Agrawal |
| title_fullStr | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Michael L. Bushnell, Vishwani D. Agrawal |
| title_full_unstemmed | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits Michael L. Bushnell, Vishwani D. Agrawal |
| title_short | Essentials of electronic testing for digital, memory, and mixed signal VLSI circuits |
| title_sort | essentials of electronic testing for digital memory and mixed signal vlsi circuits |
| topic | Integrated circuits Very large scale integration Testing Digital integrated circuits Testing Mixed signal circuits Testing Semiconductor storage devices Testing Elektronische Schaltung (DE-588)4113419-9 gnd Prüftechnik (DE-588)4047610-8 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Integrated circuits Very large scale integration Testing Digital integrated circuits Testing Mixed signal circuits Testing Semiconductor storage devices Testing Elektronische Schaltung Prüftechnik VLSI |
| work_keys_str_mv | AT bushnellmichaell essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits AT agrawalvishwanid essentialsofelectronictestingfordigitalmemoryandmixedsignalvlsicircuits |